scholarly journals Large aperture asymmetric Fabry Perot modulator based on asymmetric tandem quantum well for low voltage operation

2012 ◽  
Vol 20 (6) ◽  
pp. 6003 ◽  
Author(s):  
Byung Hoon Na ◽  
Gun Wu Ju ◽  
Hee Ju Choi ◽  
Yong Chul Cho ◽  
Yong Hwa Park ◽  
...  
Keyword(s):  
Quantum Well ◽  
Low Voltage ◽  
Large Aperture ◽  
Low Voltage Operation ◽  
Fabry Perot

Low Voltage Operation of High-κ HfO2/TiO2/Al2O3Single Quantum Well for Nanoscale Flash Memory Device Applications

2008 ◽  
Vol 47 (3) ◽  
pp. 1818-1821 ◽  
Author(s):  
Siddheswar Maikap ◽  
Ting-Yu Wang ◽  
Pei-Jer Tzeng ◽  
Heng-Yuan Lee ◽  
Cha-Hsin Lin ◽  
...  
Keyword(s):  
Quantum Well ◽  
Flash Memory ◽  
Low Voltage ◽  
Memory Device ◽  
Low Voltage Operation ◽  
Device Applications

Electro-absorption modulator with an asymmetric coupled triple quantum well for low-voltage operation

2015 ◽  
Vol 40 (14) ◽  
pp. 3376 ◽  
Author(s):  
Byung Hoon Na ◽  
Gun Wu Ju ◽  
Chang Young Park ◽  
Soo Kyung Lee ◽  
Hee Ju Choi ◽  
...  
Keyword(s):  
Quantum Well ◽  
Low Voltage ◽  
Low Voltage Operation

Low voltage InGaAs/InP multiple quantum well reflective Fabry-Perot modulator

1990 ◽  
Vol 26 (13) ◽  
pp. 913 ◽  
Author(s):  
A.J. Moseley ◽  
J. Thompson ◽  
M.Q. Kearley ◽  
D.J. Robbins ◽  
M.J. Goodwin
Keyword(s):  
Quantum Well ◽  
Low Voltage ◽  
Multiple Quantum Well ◽  
Multiple Quantum ◽  
Fabry Perot

Current State of Biological High-Resolution Scanning Electron Microscopy

1988 ◽  
Vol 46 ◽  
pp. 180-181 ◽  
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Performance ◽  
Low Voltage ◽  
Backscattered Electrons ◽  
Lens Position ◽  
Low Voltage Operation ◽  
Signal Collection ◽  
Probe Size ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).

High resolution at low voltage: A new approach

1989 ◽  
Vol 47 ◽  
pp. 76-77
Author(s):  
Arthur V. Jones
Keyword(s):  
Low Voltage ◽  
Emission Sources ◽  
New Approach ◽  
Design Concepts ◽  
Probe Diameter ◽  
Low Voltage Operation ◽  
Sufficient Intensity ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Immersion Type

With the introduction of field-emission sources and “immersion-type” objective lenses, the resolution obtainable with modern scanning electron microscopes is approaching that obtainable in STEM and TEM-but only with specific types of specimens. Bulk specimens still suffer from the restrictions imposed by internal scattering and the need to be conducting. Advances in coating techniques have largely overcome these problems but for a sizeable body of specimens, the restrictions imposed by coating are unacceptable.For such specimens, low voltage operation, with its low beam penetration and freedom from charging artifacts, is the method of choice.Unfortunately the technical dificulties in producing an electron beam sufficiently small and of sufficient intensity are considerably greater at low beam energies — so much so that a radical reevaluation of convential design concepts is needed.The probe diameter is usually given by

Large Aperture Quantum Well Shutters for Fast Retroreflected Optical Data Links in Free Space

1999 ◽  
Author(s):  
G. C. Gilbreath ◽  
W. S. Rabinovich ◽  
Rita Mahon ◽  
Michael R. Corson ◽  
Mena Ferraro ◽  
...  
Keyword(s):  
Quantum Well ◽  
Free Space ◽  
Optical Data ◽  
Large Aperture ◽  
Data Links
Sign in / Sign up

Export Citation Format

Share Document