scholarly journals Shot noise limited characterization of ultraweak femtosecond pulse trains

2011 ◽  
Vol 19 (2) ◽  
pp. 679 ◽  
Author(s):  
Osip Schwartz ◽  
Oren Raz ◽  
Ori Katz ◽  
Nirit Dudovich ◽  
Dan Oron
2021 ◽  
Author(s):  
Kenji Ohmori ◽  
Shuhei Amakawa

Characterization of broadband noise of MOSFETs from room temperature down to 120 K in fine temperature steps is presented. A MOSFET is mounted on a reusable printed circuit board vehicle with a built-in low-noise amplifier, and the vehicle is loaded into a cryogenic chamber. The vehicle allows noise measurement in the frequency range from 50 kHz to 100 MHz. At low frequencies, it enables extraction of activation energies associated with electron trapping sites. At high frequencies, as has been suggested by noise figure measurements, the white noise of MOSFETs is shown to be dominated by the shot noise, which has much weaker temperature dependence than the thermal noise. The shot noise will be a problematic noise source in broadband RF CMOS circuits operating at cryogenic temperatures.<div><br></div>


1999 ◽  
Vol 74 (11) ◽  
pp. 1531-1533 ◽  
Author(s):  
L. Misoguti ◽  
C. R. Mendonça ◽  
S. C. Zilio

2019 ◽  
Vol 123 (26) ◽  
Author(s):  
Norbert Schönenberger ◽  
Anna Mittelbach ◽  
Peyman Yousefi ◽  
Joshua McNeur ◽  
Uwe Niedermayer ◽  
...  

2013 ◽  
Vol 30 (6) ◽  
pp. 1775 ◽  
Author(s):  
Franklyn Quinlan ◽  
Tara M. Fortier ◽  
Haifeng Jiang ◽  
Scott A. Diddams

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