scholarly journals Systematic design and fabrication of high-Q single-mode pulley-coupled planar silicon nitride microdisk resonators at visible wavelengths

2010 ◽  
Vol 18 (3) ◽  
pp. 2127 ◽  
Author(s):  
Ehsan Shah Hosseini ◽  
Siva Yegnanarayanan ◽  
Amir Hossein Atabaki ◽  
Mohammad Soltani ◽  
Ali Adibi
2011 ◽  
Author(s):  
Kang Xiong ◽  
Xi Xiao ◽  
Yingtao Hu ◽  
Zhiyong Li ◽  
Tao Chu ◽  
...  

2009 ◽  
Vol 17 (17) ◽  
pp. 14543 ◽  
Author(s):  
Ehsan Shah Hosseini ◽  
Siva Yegnanarayanan ◽  
Amir H. Atabaki ◽  
Mohammad Soltani ◽  
Ali Adibi

2007 ◽  
Vol 15 (8) ◽  
pp. 4694 ◽  
Author(s):  
Mohammad Soltani ◽  
Siva Yegnanarayanan ◽  
Ali Adibi

2016 ◽  
Vol 41 (22) ◽  
pp. 5377 ◽  
Author(s):  
Mario Chemnitz ◽  
Gabriele Schmidl ◽  
Anka Schwuchow ◽  
Matthias Zeisberger ◽  
Uwe Hübner ◽  
...  

Author(s):  
Hesam Moradinejad ◽  
Murtaza Askari ◽  
Amir H. Atabaki ◽  
Zhixuan Xia ◽  
Ali A. Eftekhar ◽  
...  

2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.


Author(s):  
Payam Alipour ◽  
Ali Asghar Eftekhar ◽  
Amir Hossein Atabaki ◽  
Qing Li ◽  
Siva Yegnanarayanan ◽  
...  
Keyword(s):  
High Q ◽  

2013 ◽  
Vol 21 (15) ◽  
pp. 18236 ◽  
Author(s):  
Qing Li ◽  
Ali A. Eftekhar ◽  
Majid Sodagar ◽  
Zhixuan Xia ◽  
Amir H. Atabaki ◽  
...  

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