scholarly journals Narrow band resonant grating of 100% reflection under normal incidence

2006 ◽  
Vol 14 (26) ◽  
pp. 12613 ◽  
Author(s):  
Nathalie Destouches ◽  
Jean-Claude Pommier ◽  
Olivier Parriaux ◽  
Tina Clausnitzer ◽  
Nikolai Lyndin ◽  
...  
Keyword(s):  
Narrow Band ◽  
Normal Incidence ◽  
Resonant Grating

Narrow-band resonant grating waveguide filters constructed with azobenzene polymers

1999 ◽  
Vol 38 (17) ◽  
pp. 3714 ◽  
Author(s):  
Raymond J. Stockermans ◽  
Paul L. Rochon
Keyword(s):  
Narrow Band ◽  
Waveguide Filters ◽  
Resonant Grating

Flat-top narrow-band spectral response obtained from cascaded resonant grating reflection filters

2002 ◽  
Vol 41 (7) ◽  
pp. 1241 ◽  
Author(s):  
Donald K. Jacob ◽  
Steven C. Dunn ◽  
M. G. Moharam
Keyword(s):  
Narrow Band ◽  
Spectral Response ◽  
Resonant Grating

Subwavelength Structured Optical Elements and Resonant Grating Filters

2003 ◽  
Vol 797 ◽  
Author(s):  
Hisao Kikuta ◽  
Koichi Iwata
Keyword(s):  
Narrow Band ◽  
Optical Switch ◽  
Camera System ◽  
Radiation Mode ◽  
Optical Elements ◽  
Structured Surfaces ◽  
Guided Mode ◽  
Resonant Grating ◽  
Wavelength Filters ◽  
Polarization Camera

ABSTRACTWe developed several optical elements with subwavelength-structured surfaces. Antireflection surfaces were fabricated on a diffraction grating. A micro-retarder array realized by the form-birefringent effect has been made for an application to a polarization camera system. And we developed narrow-band reflection wavelength filters called “guided-mode resonant grating filters”. This filter bases on a coupling of guided mode and radiation mode. After describing some examples of the filters, we mention a grating structure for an optical switch with nonlinear optical material.

Normal-incidence guided-mode resonant grating filters:?design and experimental demonstration

1998 ◽  
Vol 23 (9) ◽  
pp. 700 ◽  
Author(s):  
David L. Brundrett ◽  
Elias N. Glytsis ◽  
Thomas K. Gaylord
Keyword(s):  
Normal Incidence ◽  
Experimental Demonstration ◽  
Guided Mode ◽  
Resonant Grating

scholarly journals EXTENSION OF HIGH REFLECTANCE BAND WIDTH FOR FAR INFRARED SPECTRAL REGION : (1)

2004 ◽  
Vol 1 (2) ◽  
pp. 247-252
Author(s):  
Baghdad Science Journal
Keyword(s):  
Spectral Region ◽  
Matrix Theory ◽  
Narrow Band ◽  
Far Infrared ◽  
Normal Incidence ◽  
Characteristic Matrix ◽  
Infrared Spectral ◽  
Band Pass ◽  
Reflectance Band ◽  
High Reflectance

Extension of bandwidth for high reflectance zone for the spectral region (8-14pm) was studied adapting the concept of contiguous and overlapping high reflectance stacks. Computations was carried out using the modified characteristic matrix theory restricted to near-normal incidence of light on dielectric , homogenous and isotropic symmetrical stack. Certain precautions must be taken in the choice of stacks to avoid deep —reflectance minima from developing within the extended high reflectance region. Results illustrate that the techniques of extending the high reflectance regions are applicable not only to mirrors , but also to short-and long-edge filter and to narrow band pass filters.

Fabrication and investigation of imaging normal-incidence multilayer mirrors with a narrow-band reflection in the range λ simeq 4.5 nm

1993 ◽  
Vol 48 (5) ◽  
pp. 516-520 ◽  
Author(s):  
A D Akhsakhalyan ◽  
N N Kolachevsky ◽  
M M Mitropolsky ◽  
E N Ragozin ◽  
N N Salashchenko ◽  
...  
Keyword(s):  
Narrow Band ◽  
Normal Incidence ◽  
Multilayer Mirrors

Statistical analysis of classification

1966 ◽  
Vol 24 ◽  
pp. 188-189
Author(s):  
T. J. Deeming
Keyword(s):  
Multivariate Analysis ◽  
Statistical Analysis ◽  
Classification Scheme ◽  
Analytical Procedure ◽  
Narrow Band ◽  
Scientific Research ◽  
Maximum Amount ◽  
Amount Of Information

If we make a set of measurements, such as narrow-band or multicolour photo-electric measurements, which are designed to improve a scheme of classification, and in particular if they are designed to extend the number of dimensions of classification, i.e. the number of classification parameters, then some important problems of analytical procedure arise. First, it is important not to reproduce the errors of the classification scheme which we are trying to improve. Second, when trying to extend the number of dimensions of classification we have little or nothing with which to test the validity of the new parameters.Problems similar to these have occurred in other areas of scientific research (notably psychology and education) and the branch of Statistics called Multivariate Analysis has been developed to deal with them. The techniques of this subject are largely unknown to astronomers, but, if carefully applied, they should at the very least ensure that the astronomer gets the maximum amount of information out of his data and does not waste his time looking for information which is not there. More optimistically, these techniques are potentially capable of indicating the number of classification parameters necessary and giving specific formulas for computing them, as well as pinpointing those particular measurements which are most crucial for determining the classification parameters.

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