Phase Transition of Optical Nonlinear AgOx Films for Super-resolution Near-field Recording

2003 ◽  
Author(s):  
Yung-Chiun Her ◽  
Yuh-Chang Lan ◽  
Wei-Chih Hsu ◽  
Song-Yeu Tsai
Keyword(s):  
Phase Transition ◽  
Near Field ◽  
Super Resolution ◽  
Field Recording

Optothermal Property and Decomposition Characteristics of PtOx Ultrathin Film Sandwiched Between ZnS–SiO2 for Super-Resolution Near-Field Recording

2007 ◽  
Vol 7 (1) ◽  
pp. 374-380
Author(s):  
Yung-Chiun Her ◽  
Bou-Yin Liao ◽  
Wei-Chih Hsu ◽  
Song-Yeu Tsai
Keyword(s):  
Activation Energy ◽  
Thermal Decomposition ◽  
Near Field ◽  
Super Resolution ◽  
Decomposition Temperature ◽  
Ultrathin Film ◽  
Field Structure ◽  
Field Recording ◽  
Mask Layer ◽  
Resolution Capability

We have investigated the optothermal property and decomposition characteristics of PtOx ultrathin film protected by ZnS–SiO2 layers and effects of the constituent phases of PtOx on super-resolution capability and read stability of the super-RENS disk. All the ZnS–SiO2/PtOx/ZnS–SiO2 multilayers exhibited a steep reflectivity drop at the temperature range between 265 and 350 °C, corresponding to the decomposition of PtOx. The decomposition temperature of the 4-nm-thick PtOx ultrathin film protected by ZnS–SiO2 layers was much lower than those obtained in thick PtOx films without protection. The activation energy for thermal decomposition was ∼1.3 eV. Both the decomposition temperature and activation energy for thermal decomposition were unaffected by the constituent phases of PtOx. Carrier to noise ratios (CNR) of over 40 dB for mark size of 150 nm were achieved in all super-resolution near-field structure (super-RENS) disks, while the super-resolution readout was limited to 2.5 × 103 ∼ 4.5 × 104 cycles. The effect of constituent phases of PtOx on the super-resolution capability of super-RENS disk with a PtOx mask layer was minimal. However, as the constituent phases of PtOx mask layer transformed from a mixture of Pt and PtO, to pure PtO, and then to a mixture of PtO and PtO2, the readout stability of super-RENS disk increased dramatically since less heat was absorbed by the PtOx mask layer composed of PtO and PtO2 during the readout process, prohibiting the diffusion of materials inside the bubble to the GeSbTe phase change layer.

scholarly journals Double moiré localized plasmon structured illumination microscopy

Nanophotonics ◽  
2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Ruslan Röhrich ◽  
A. Femius Koenderink
Keyword(s):  
Near Field ◽  
Super Resolution ◽  
Reconstruction Algorithm ◽  
Structured Illumination ◽  
Structured Illumination Microscopy ◽  
Experimental Realization ◽  
Spatial Frequencies ◽  
Wide Range ◽  
Localized Plasmon ◽  
Plasmonic Grating

AbstractStructured illumination microscopy (SIM) is a well-established fluorescence imaging technique, which can increase spatial resolution by up to a factor of two. This article reports on a new way to extend the capabilities of structured illumination microscopy, by combining ideas from the fields of illumination engineering and nanophotonics. In this technique, plasmonic arrays of hexagonal symmetry are illuminated by two obliquely incident beams originating from a single laser. The resulting interference between the light grating and plasmonic grating creates a wide range of spatial frequencies above the microscope passband, while still preserving the spatial frequencies of regular SIM. To systematically investigate this technique and to contrast it with regular SIM and localized plasmon SIM, we implement a rigorous simulation procedure, which simulates the near-field illumination of the plasmonic grating and uses it in the subsequent forward imaging model. The inverse problem, of obtaining a super-resolution (SR) image from multiple low-resolution images, is solved using a numerical reconstruction algorithm while the obtained resolution is quantitatively assessed. The results point at the possibility of resolution enhancements beyond regular SIM, which rapidly vanishes with the height above the grating. In an initial experimental realization, the existence of the expected spatial frequencies is shown and the performance of compatible reconstruction approaches is compared. Finally, we discuss the obstacles of experimental implementations that would need to be overcome for artifact-free SR imaging.

Real-Time Focal Spot Profiling for the Adjustment of the Focus in Near Field Recording System

2002 ◽  
Vol 41 (Part 1, No. 11A) ◽  
pp. 6380-6385
Author(s):  
Hyeong Ryeol Oh ◽  
Dae-Gap Gweon ◽  
Jun-Hee Lee ◽  
Sang-Cheon Kim ◽  
See-Hyung Lee ◽  
...  
Keyword(s):  
Real Time ◽  
Focal Spot ◽  
Near Field ◽  
Recording System ◽  
Field Recording

Nonlinear Optical Absorption in the AgOx-Type Super-Resolution Near-Field Structure

2001 ◽  
Vol 40 (Part 1, No. 6A) ◽  
pp. 4101-4102 ◽  
Author(s):  
Fu Han Ho ◽  
Wei Yi Lin ◽  
Hsun Hao Chang ◽  
Yu Hsaun Lin ◽  
Wei-Chih Liu ◽  
...  
Keyword(s):  
Optical Absorption ◽  
Nonlinear Optical ◽  
Near Field ◽  
Super Resolution ◽  
Field Structure ◽  
Nonlinear Optical Absorption

The FDTD Analysis of Near-Field Response for Microgroove Structure With Standing Wave Illumination for the Realization of Coherent Structured Illumination Microscopy

2021 ◽  
Author(s):  
Yizhao Guan ◽  
Hiromasa Kume ◽  
Shotaro Kadoya ◽  
Masaki Michihata ◽  
Satoru Takahashi
Keyword(s):  
Standing Wave ◽  
Incident Angle ◽  
Near Field ◽  
Super Resolution ◽  
Structured Illumination ◽  
Field Phase ◽  
Structured Illumination Microscopy ◽  
Depth Measurement ◽  
Field Response ◽  
Depth Dependency

Abstract Microstructures are widely used in the manufacture of functional surfaces. An optical-based super-resolution, non-invasive method is preferred for the inspection of surfaces with massive microstructures. The Structured Illumination Microscopy (SIM) uses standing-wave illumination to reach optical super-resolution. Recently, coherent SIM is being studied. It can obtain not only the super-resolved intensity distribution but also the phase and amplitude distribution of the sample surface beyond the diffraction limit. By analysis of the phase-depth dependency, the depth measurement for microgroove structures with coherent SIM is expected. FDTD analysis is applied for observing the near-field response of microgroove under the standing-wave illumination. The near-field phase shows depth dependency in this analysis. Moreover, the effects from microgroove width, the incident angle, and the relative position between the standing-wave peak and center of the microgroove are investigated. It is found the near-field phase change can measure depth until 200 nm (aspect ratio 1) with an error of up to 20.4 nm in the case that the microgroove width is smaller than half of the wavelength.

Capacity Increase in Radial Direction of Super-Resolution Near-Field Structure Read-Only-Memory Disc

2007 ◽  
Vol 46 (6B) ◽  
pp. 3898-3901 ◽  
Author(s):  
Kazuma Kurihara ◽  
Yuzo Yamakawa ◽  
Takayuki Shima ◽  
Junji Tominaga
Keyword(s):  
Radial Direction ◽  
Near Field ◽  
Super Resolution ◽  
Field Structure ◽  
Capacity Increase ◽  
Read Only Memory
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