Characterizing Dielectric Tensors with Biaxial Ellipsometry

2008 ◽  
Author(s):  
Paula K. Smith ◽  
Stephen C. McClain ◽  
Russell A. Chipman
Keyword(s):  
Dielectric Tensors

P-93: Characterizing Dielectric Tensors with Biaxial Ellipsometry

2008 ◽  
Vol 39 (1) ◽  
pp. 1533
Author(s):  
Paula K. Smith ◽  
Stephen C. McClain ◽  
Russell A. Chipman
Keyword(s):  
Dielectric Tensors

scholarly journals From anisotropy of dielectric tensors to birefringence: a quantum mechanics approach

2020 ◽  
Vol 31 (3) ◽  
pp. 835-851
Author(s):  
Michel Rérat ◽  
Philippe D’Arco ◽  
Valentina Lacivita ◽  
Fabien Pascale ◽  
Roberto Dovesi
Keyword(s):  
Quantum Mechanics ◽  
Dielectric Tensors

Excitation of whistler mode instability due to slow cyclotron interaction in an inhomogenous beam–plasma System

1984 ◽  
Vol 31 (2) ◽  
pp. 225-229 ◽  
Author(s):  
H. A. Shah ◽  
V. K. Jain
Keyword(s):  
Growth Rate ◽  
Inhomogeneous Plasma ◽  
Whistler Wave ◽  
Wave Instability ◽  
Mode Instability ◽  
Plasma System ◽  
Whistler Mode ◽  
Beam Plasma ◽  
Slow Cyclotron ◽  
Dielectric Tensors

The excitation of whistler wave instability due to slow cyclotron (m = – 1) interaction in an inhomogeneous plasma penetrated by an inhomogeneous beam of electrons is studied. Expressions are obtained for the elements of the plasma and beam dielectric tensors. It is shown that the inhomogeneity in both beam and plasma number densities affects the growth rate of the instability.

Generalized Ellipsometry Using a Rotating Sample

2001 ◽  
Vol 635 ◽  
Author(s):  
Weiliang Xu ◽  
Lowell T. Wood ◽  
Terry D. Golding
Keyword(s):  
Fourier Coefficients ◽  
Anisotropic Materials ◽  
Azimuth Angle ◽  
Sample Holder ◽  
Potential Applications ◽  
Dielectric Tensors ◽  
Anisotropic Nanostructures

AbstractWe propose a generalized ellipsometric technique using a rotating sample. The ellipsometer consists of a polarizer, a rotatable sample holder, an analyzer, and a detector. Fourier coefficients are measured and used to extract the system’s dielectric tensors and film thicknesses. The main advantage of the technique is that all parts of the ellipsometer are fixed except the sample, whose azimuth angle can be modulated. We show calculated responses to isotropic and anisotropic materials as well as superlattices. Potential applications for characterizations of anisotropic nanostructures are discussed.

Theoretical investigation of dielectric properties of rare earth stillwellite compounds

2015 ◽  
Vol 29 (21) ◽  
pp. 1550154
Author(s):  
R. Shaltaf ◽  
J. Khalifeh
Keyword(s):  
Electronic Structure ◽  
Rare Earth ◽  
Dielectric Properties ◽  
Dielectric Permittivity ◽  
High Frequency ◽  
Density Functional ◽  
Structural Parameters ◽  
The Other ◽  
Static Dielectric Permittivity ◽  
Dielectric Tensors

Ab initio density functional calculations are performed to investigate the dielectric properties of LnBSiO 5 (Ln = Ce, Pr, Nd) with the stillwellite structure. The calculated structural parameters are found to agree well with existing experimental results. The three compounds possess insulating electronic structure with nearly isotropic high frequency dielectric permittivity tensors. On the other hand, the static dielectric permittivity tensors are found to be less isotropic. The anisotropy of static dielectric tensors are found to increase as the atomic number of the lanthanide increases.

Electronic and Optical Properties of MoS2

2013 ◽  
Vol 209 ◽  
pp. 90-93 ◽  
Author(s):  
Ushma Ahuja ◽  
Alpa Dashora
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Density Functional ◽  
Full Potential ◽  
Absorption Coefficients ◽  
Plane Wave Method ◽  
Quantum Size ◽  
Dielectric Tensors ◽  
The Stability ◽  
Linearized Augmented Plane Wave

Electronic properties along with the absorption coefficients and dielectric tensors of MoS2 thin films in (0001) direction and the bulk state have been computed using density functional theory within full potential linearized augmented plane wave method. Surface energies and work functions are also deduced for different number of layers to check the quantum size effects and thereby the stability of thin films. The dielectric tensors and absorption coefficients (optical properties) of these materials are discussed to explore the utility of MoS2 in photovoltaic applications.

Sign in / Sign up

Export Citation Format

Share Document