Measuring the Electronic Transport Properties of Si Wafers with Laser-induced Free-Carrier Dynamics
2010 ◽
Vol 214
◽
pp. 012116
◽
Analysis of free carrier absorption measurement of electronic transport properties of silicon wafers
2008 ◽
Vol 153
(1)
◽
pp. 279-281
◽
2021 ◽
pp. 114701