Accuracy analysis for the determination of electronic transport properties of Si wafers using modulated free carrier absorption
2010 ◽
Vol 214
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pp. 012116
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Analysis of free carrier absorption measurement of electronic transport properties of silicon wafers
2008 ◽
Vol 153
(1)
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pp. 279-281
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Keyword(s):
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2000 ◽
Vol 338-342
◽
pp. 555-558
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1992 ◽
Vol 10
(2)
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pp. 119-126