Accuracy analysis for the determination of electronic transport properties of Si wafers using modulated free carrier absorption

2008 ◽  
Vol 104 (10) ◽  
pp. 103705 ◽  
Author(s):  
Xiren Zhang ◽  
Bincheng Li ◽  
Xianming Liu
1980 ◽  
Vol 51 (5) ◽  
pp. 2659 ◽  
Author(s):  
W. Walukiewicz ◽  
J. Lagowski ◽  
L. Jastrzebski ◽  
P. Rava ◽  
M. Lichtensteiger ◽  
...  

1979 ◽  
Vol 50 (2) ◽  
pp. 899-908 ◽  
Author(s):  
W. Walukiewicz ◽  
L. Lagowski ◽  
L. Jastrzebski ◽  
M. Lichtensteiger ◽  
H. C. Gatos

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