Nanoscale organic data storage using atomic force microscopy

2003 ◽  
Author(s):  
B. McCarthy ◽  
K. Yamnitskiy ◽  
Y. Zhao ◽  
G.E. Jabbour ◽  
D. Sarid
Keyword(s):  
Atomic Force Microscopy ◽  
Data Storage ◽  
Force Microscopy ◽  
Atomic Force

Kinetics of Crystal Nucleation and Growth in Thin Films of Amorphous Te Alloys measured by Atomic Force Microscopy

2003 ◽  
Vol 803 ◽  
Author(s):  
J. Kalb ◽  
F. Spaepen ◽  
M. Wuttig
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Data Storage ◽  
Optical Data Storage ◽  
Crystal Nucleation ◽  
Ex Situ ◽  
Optical Data ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTBoth the crystal nucleation rate and the crystal growth velocity of sputtered amorphous Ag0.055In0.065Sb0.59Te0.29 and Ge4Sb1Te5 thin films used for optical data storage were determined as a function of temperature. Crystals were directly observed using ex-situ atomic force microscopy, and their change in size after each anneal was measured. Between 140°C and 185°C, these materials exhibited similar crystal growth characteristics, but differed in their crystal nucleation characteristics. These observations provide an explanation for the different re-crystallization mechanisms observed upon laser-induced crystallization of amorphous marks.

Ultrahigh-density atomic force microscopy data storage with erase capability

1999 ◽  
Vol 74 (9) ◽  
pp. 1329-1331 ◽  
Author(s):  
G. Binnig ◽  
M. Despont ◽  
U. Drechsler ◽  
W. Häberle ◽  
M. Lutwyche ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Data Storage ◽  
Atomic Force Microscopy Data ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ultrahigh Density ◽  
Microscopy Data

Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology

2002 ◽  
Vol 91 (1-4) ◽  
pp. 103-110 ◽  
Author(s):  
Hyunjung Shin ◽  
Seungbum Hong ◽  
Jooho Moon ◽  
Jong Up Jeon
Keyword(s):  
Atomic Force Microscopy ◽  
Data Storage ◽  
Storage System ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mems Technology ◽  
Data Storage System
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