scholarly journals Modular platform for low-light microscopy

2015 ◽  
Vol 6 (11) ◽  
pp. 4585 ◽  
Author(s):  
Tae Jin Kim ◽  
Silvan Tuerkcan ◽  
Andrew Ceballos ◽  
Guillem Pratx
Keyword(s):  
Light Microscopy ◽  
Low Light ◽  
Modular Platform

Ultrasensitivity, speed, and resolution: optimizing low-light microscopy with the back-illuminated electron-multiplying CCD

2003 ◽  
Author(s):  
Colin G. Coates ◽  
Donal J. Denvir ◽  
Noel G. McHale ◽  
Keith D. Thornbury ◽  
Mark A. Hollywood
Keyword(s):  
Light Microscopy ◽  
Low Light ◽  
Back Illuminated

Electronic Cameras for Low‐Light Microscopy

2007 ◽  
pp. 219-249 ◽  
Author(s):  
Ivan Rasnik ◽  
Todd French ◽  
Ken Jacobson ◽  
Keith Berland
Keyword(s):  
Light Microscopy ◽  
Low Light

Electronic Cameras for Low-Light Microscopy

2003 ◽  
pp. 103-132 ◽  
Author(s):  
Keith Berland ◽  
Ken Jacobson ◽  
Todd French ◽  
Zenon Rajfur
Keyword(s):  
Light Microscopy ◽  
Low Light

Chapter 2 Electronic Cameras for Low-Light Microscopy

1998 ◽  
pp. 19-44 ◽  
Author(s):  
Keith Berland ◽  
Ken Jacobson ◽  
Todd French
Keyword(s):  
Light Microscopy ◽  
Low Light

Optimizing low-light microscopy with back-illuminated electron multiplying charge-coupled device: enhanced sensitivity, speed, and resolution

2004 ◽  
Vol 9 (6) ◽  
pp. 1244 ◽  
Author(s):  
Colin G. Coates ◽  
Donal J. Denvir ◽  
Noel G. McHale ◽  
Keith D. Thornbury ◽  
Mark A. Hollywood
Keyword(s):  
Light Microscopy ◽  
Low Light ◽  
Charge Coupled Device ◽  
Enhanced Sensitivity ◽  
Back Illuminated

Electronic Cameras for Low‐Light Microscopy

2013 ◽  
pp. 211-241 ◽  
Author(s):  
Ivan Rasnik ◽  
Todd French ◽  
Ken Jacobson ◽  
Keith Berland
Keyword(s):  
Light Microscopy ◽  
Low Light

Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

1978 ◽  
Vol 36 (2) ◽  
pp. 82-83 ◽  
Author(s):  
Nakazo Watari ◽  
Yasuaki Hotta ◽  
Yoshio Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Fine Structure ◽  
Light Microscopy ◽  
Thin Sections ◽  
Transmission Electron ◽  
Identical Cell ◽  
Electron Microscopes ◽  
Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Tumor Diagnosis

1982 ◽  
Vol 40 ◽  
pp. 262-265
Author(s):  
Bruce Mackay
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Differential Diagnosis ◽  
Light Microscopy ◽  
Clinical Examination ◽  
Ultrastructural Study ◽  
Diagnostic Procedures ◽  
Specific Diagnosis ◽  
Transmission Electron ◽  
Microscopic Diagnosis

The broadest application of transmission electron microscopy (EM) in diagnostic medicine is the identification of tumors that cannot be classified by routine light microscopy. EM is useful in the evaluation of approximately 10% of human neoplasms, but the extent of its contribution varies considerably. It may provide a specific diagnosis that can not be reached by other means, but in contrast, the information obtained from ultrastructural study of some 10% of tumors does not significantly add to that available from light microscopy. Most cases fall somewhere between these two extremes: EM may correct a light microscopic diagnosis, or serve to narrow a differential diagnosis by excluding some of the possibilities considered by light microscopy. It is particularly important to correlate the EM findings with data from light microscopy, clinical examination, and other diagnostic procedures.

Sign in / Sign up

Export Citation Format

Share Document