Super-resolution Wide-field Imaging: Objective-launched Standing Wave Total Internal Reflection Fluorescence Microscopy

2006 ◽  
Author(s):  
Euiheon Chung ◽  
Daekeun Kim ◽  
Peter T. C. So
Keyword(s):  
Fluorescence Microscopy ◽  
Standing Wave ◽  
Total Internal Reflection ◽  
Super Resolution ◽  
Internal Reflection ◽  
Total Internal Reflection Fluorescence ◽  
Wide Field ◽  
Field Imaging ◽  
Wide Field Imaging

scholarly journals Single-shot super-resolution total internal reflection fluorescence microscopy

2018 ◽  
Vol 15 (6) ◽  
pp. 425-428 ◽  
Author(s):  
Min Guo ◽  
Panagiotis Chandris ◽  
John Paul Giannini ◽  
Adam J. Trexler ◽  
Robert Fischer ◽  
...  
Keyword(s):  
Fluorescence Microscopy ◽  
Total Internal Reflection ◽  
Super Resolution ◽  
Internal Reflection ◽  
Total Internal Reflection Fluorescence ◽  
Single Shot

scholarly journals Single-shot super-resolution total internal reflection fluorescence microscopy

2017 ◽  
Author(s):  
Min Guo ◽  
Panagiotis Chandris ◽  
John Paul Giannini ◽  
Adam J. Trexler ◽  
Robert Fischer ◽  
...  
Keyword(s):  
Fluorescence Microscopy ◽  
Total Internal Reflection ◽  
Super Resolution ◽  
Internal Reflection ◽  
Total Internal Reflection Fluorescence ◽  
Single Shot ◽  
Structured Illumination ◽  
Structured Illumination Microscopy ◽  
Simple Method ◽  
Close Proximity

AbstractWe demonstrate a simple method for combining instant structured illumination microscopy (SIM) with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF (down to 115 +/-13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-resolution imaging in close proximity to the coverslip surface.

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