Single-shot super-resolution total internal reflection fluorescence microscopy
Keyword(s):
AbstractWe demonstrate a simple method for combining instant structured illumination microscopy (SIM) with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF (down to 115 +/-13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-resolution imaging in close proximity to the coverslip surface.
2020 ◽
Vol 52
(1)
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pp. 369-393
2006 ◽
2007 ◽
Vol 26
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pp. 83-88
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2007 ◽
Vol 192
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pp. 303-307
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