Theoretical and experimental investigation of heating of biased Si avalanche photodiodes in an external circuit due to irradiation by a millisecond-pulse laser

2020 ◽  
Vol 59 (24) ◽  
pp. 7442
Author(s):  
Liang Chen ◽  
Hong-Xu Liu ◽  
Guang-Yong Jin ◽  
Di Wang ◽  
Zhi Wei
Crystals ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 884
Author(s):  
Liang Chen ◽  
Di Wang ◽  
Guang-Yong Jin ◽  
Zhi Wei

In this paper, the sampling current characteristics of the external circuit and the internal mechanism of the current generation in APD irradiated by a millisecond pulse laser were studied. The photocurrent of APD irradiated by a millisecond pulse laser with different energy densities was obtained by the sampling resistance of the external circuit. The photocurrent can be divided into a photocurrent stage, conduction stage and recovery stage in the time domain. This is mainly due to the carrier flow in APD, which leads to the lowering of the barrier between the PN junction. The research results of this paper can be extended to the response of the detector to the high-power infrared pulse laser and provide a certain experimental basis for the design of a millisecond pulse infrared laser detection circuit.


Crystals ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 866
Author(s):  
Liang Chen ◽  
Zhi Wei ◽  
Di Wang ◽  
Hong-Xu Liu ◽  
Guang-Yong Jin

We experimentally studied the interaction between a millisecond pulse laser and silicon avalanche photodiode (Si-APD) in an external capacitance circuit. The temperature rise law of Si-APD irradiated by a millisecond pulse laser under different external capacitance conditions was obtained. The results show that the surface temperature rise in a Si-APD is strongly dependent on the external capacitance. That is, the smaller the external capacitance, the smaller the surface temperature rise. The effect of the external capacitance on the surface temperature rise in a Si-APD was investigated for the first time in the field of laser damage. The research results have a certain practical significance for the damage and protection of mid-infrared detectors.


2012 ◽  
Vol 24 (10) ◽  
pp. 2287-2290
Author(s):  
毕娟 Bi Juan ◽  
金光勇 Jin Guangyong ◽  
倪晓武 Ni Xiaowu ◽  
张喜和 Zhang Xihe ◽  
姚志健 Yao Zhijian

2011 ◽  
Vol 38 (12) ◽  
pp. 1215001
Author(s):  
王琦 Wang Qi ◽  
梁云仙 Liang Yunxian ◽  
陈兴龙 Chen Xinglong ◽  
王静鸽 Wang Jingge ◽  
杨阳 Yang Yang ◽  
...  

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