Dynamics of a micro-electro-mechanical system associated with an atomic force microscope considering squeeze film damping

2020 ◽  
Vol 59 (13) ◽  
pp. D76 ◽  
Author(s):  
Johan S. Duque ◽  
Alexander Gutierrez ◽  
Daniel Cortés
Keyword(s):  
Atomic Force Microscope ◽  
Mechanical System ◽  
Micro Electro Mechanical System ◽  
Squeeze Film ◽  
Atomic Force ◽  
Squeeze Film Damping

scholarly journals Squeeze Film Damping Effect on Different Microcantilever Probes in Tapping Mode Atomic Force Microscope

Scanning ◽  
2020 ◽  
Vol 2020 ◽  
pp. 1-6
Author(s):  
Yan Sun ◽  
Jing Liu ◽  
Kejian Wang ◽  
Zheng Wei
Keyword(s):  
Atomic Force Microscope ◽  
Theoretical Models ◽  
Sample Surface ◽  
Squeeze Film ◽  
Simplified Models ◽  
Tapping Mode ◽  
Damping Effect ◽  
Atomic Force ◽  
Squeeze Film Damping

During the operation of tapping mode atomic force microscope (TM-AFM), the gap between the cantilever and sample surface is very small (several nanometers to micrometers). Owing to the small gap distance and high vibration frequency, squeeze film force should be considered in TM-AFM. To explore the mechanism of squeeze film damping in TM-AFM, three theoretical microcantilever simplified models are discussed innovatively herein: tip probe, ball probe, and tipless probe. Experiments and simulations are performed to validate the theoretical models. It is of great significance to improve the image quality of atomic force microscope.

Influence of squeeze film damping on quality factor in tapping mode atomic force microscope

2021 ◽  
Vol 491 ◽  
pp. 115720
Author(s):  
Zheng Wei ◽  
Jing Liu ◽  
Xiaoting Zheng ◽  
Yan Sun ◽  
Ruihua Wei
Keyword(s):  
Atomic Force Microscope ◽  
Quality Factor ◽  
Squeeze Film ◽  
Tapping Mode ◽  
Atomic Force ◽  
Squeeze Film Damping

scholarly journals Investigation of a complete squeeze-film damping model for MEMS devices

2021 ◽  
Vol 7 (1) ◽  
Author(s):  
Qianbo Lu ◽  
Weidong Fang ◽  
Chen Wang ◽  
Jian Bai ◽  
Yuan Yao ◽  
...  
Keyword(s):  
Dynamic Performance ◽  
Simulation Models ◽  
Micro Electro Mechanical System ◽  
Damping Coefficient ◽  
Structural Vibration ◽  
Squeeze Film ◽  
Mems Devices ◽  
Complete Model ◽  
Moving Plate ◽  
Squeeze Film Damping

AbstractDynamic performance has long been critical for micro-electro-mechanical system (MEMS) devices and is significantly affected by damping. Different structural vibration conditions lead to different damping effects, including border and amplitude effects, which represent the effect of gas flowing around a complicated boundary of a moving plate and the effect of a large vibration amplitude, respectively. Conventional models still lack a complete understanding of damping and cannot offer a reasonably good estimate of the damping coefficient for a case with both effects. Expensive efforts have been undertaken to consider these two effects, yet a complete model has remained elusive. This paper investigates the dynamic performance of vibrated structures via theoretical and numerical methods simultaneously, establishing a complete model in consideration of both effects in which the analytical expression is given, and demonstrates a deviation of at least threefold lower than current studies by simulation and experimental results. This complete model is proven to successfully characterize the squeeze-film damping and dynamic performance of oscillators under comprehensive conditions. Moreover, a series of simulation models with different dimensions and vibration statuses are introduced to obtain a quick-calculating factor of the damping coefficient, thus offering a previously unattainable damping design guide for MEMS devices.

On an Optimal Control Applied in Atomic Force Microscopy (AFM) Including Fractional-Order

2017 ◽  
Author(s):  
Angelo M. Tusset ◽  
Jose M. Balthazar ◽  
Jeferson Jose de Lima ◽  
Rodrigo T. Rocha ◽  
Frederic C. Janzen ◽  
...  
Keyword(s):  
Feedback Control ◽  
Fractional Order ◽  
Nonlinear Behavior ◽  
Control Technique ◽  
Linear Feedback ◽  
Squeeze Film ◽  
Good Tool ◽  
Chaotic Motions ◽  
Atomic Force ◽  
Squeeze Film Damping

In this work, the nonlinear dynamics of an Atomic Force Microscope (AFM) operating in tapping mode is investigated, considering the influence of squeeze film damping in fractional-order. Its influence plays an important role because the dynamics of the AFM can be led to different responses, e.g., periodic and chaotic motions, specially the influence of the derivative order when in fractional-order. In a way to characterize the type of behavior, the 0–1 test was used once this is a good tool to characterize fractional-order differential systems. In addition, the linear feedback control technique for fractional-order systems is applied to control the chaotic behaviors. Therefore, the results showed a nonlinear behavior presented by the AFM system. In addition, the feedback control technique was efficient to control the chaotic motion of the micro cantilever beam of the AFM, whose results included variation of parameters of the fractional derivative of the squeeze film damping.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

The application of atomic force microscope in microbiological research

2014 ◽  
Vol 5 (1) ◽  
pp. 27-30
Author(s):  
Małgorzata Tokarska-Rodak ◽  
Maria Kozioł-Montewka ◽  
Jolanta Paluch-Oleś ◽  
Dorota Plewik ◽  
Grażyna Olchowik ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
Microbiological Research
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