Determination of optical constants of thin film coating materials based on inverse synthesis

1983 ◽  
Vol 22 (20) ◽  
pp. 3191 ◽  
Author(s):  
J. A. Dobrowolski ◽  
F. C. Ho ◽  
A. Waldorf
1984 ◽  
Vol 23 (20) ◽  
pp. 3571 ◽  
Author(s):  
D. P. Arndt ◽  
R. M. A. Azzam ◽  
J. M. Bennett ◽  
J. P. Borgogno ◽  
C. K. Carniglia ◽  
...  

Author(s):  
Konstantin P. Lovetski ◽  
Andrey A. Zhukov ◽  
Michael V. Paukshto ◽  
Leonid A. Sevastianov ◽  
Anastasiia A. Tiutiunnik

The paper describes a methodology for determining the optical and physical properties of anisotropic thin film materials. This approach allows in the future designing multilayer thin-film coatings with specified properties. An inverse problem of determining the permittivity tensor and the thickness of a thin film deposited on a glass substrate is formulated. Preliminary information on the belonging of a thin-film coating to a certain class can significantly reduce the computing time and increase the accuracy of determining the permittivity tensor over the entire investigated range of wavelengths and film thickness at the point of reflection and transmission measurement Depending on the goals, it is possible to formulate and, therefore, solve various inverse problems: o determination of the permittivity tensor and specification of the thickness of a thick (up to 1 cm) substrate, often isotropic; o determination of the permittivity tensor of a thin isotropic or anisotropic film deposited on a substrate with known optical properties. The complexity of solving each of the problems is very different and each problem requires its own specific set of measured input data. The ultimate results of solving the inverse problem are verified by comparing the calculated transmission and reflection with those measured for arbitrary angles of incidence and reflection.


Chromium Nano lined film is a layer of fabric starting from fractions These lined film layers had been utilized as hostile to reflected picture coatings on window glass, video show units and Digital cam focal points. An antireflection covering is a type of optical covering finished to the floor of focal points and distinctive optical gadgets to reduce reflection. This improves the presentation of the device because of the truth that an extraordinary arrangement significantly less light is strange of a nanometer to numerous micrometers in thickness. The general overall performance of optical tool or System is typically more advantageous whilst the thin-film coating includes more than one layer having numerous thicknesses and refractive indices.In this study, optical houses of chromium thin movies produced by the use of Spectrometer method at the Lithium Niobate substrate have been investigated. The optical houses have been researched through utilizing UV/VIS/NIR spectrophotometer. The optical constants of the Nano films are in appropriate settlement with the writing data. The solidness of the covering has been efficiently explored through selective cures.


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