A method for the determination of substrate temperature during thin film coating deposition

2008 ◽  
Author(s):  
St. Günster ◽  
H. Ehlers ◽  
D. Ristau
Keyword(s):  
Thin Film ◽  
Substrate Temperature ◽  
Film Coating ◽  
Thin Film Coating ◽  
Coating Deposition

scholarly journals Solving the inverse problem for determining the optical characteristics of materials

2020 ◽  
Vol 28 (4) ◽  
pp. 378-397
Author(s):  
Konstantin P. Lovetski ◽  
Andrey A. Zhukov ◽  
Michael V. Paukshto ◽  
Leonid A. Sevastianov ◽  
Anastasiia A. Tiutiunnik
Keyword(s):  
Thin Film ◽  
Inverse Problem ◽  
Computing Time ◽  
Film Coating ◽  
Permittivity Tensor ◽  
Transmission Measurement ◽  
Thin Film Coating ◽  
Reflection And Transmission ◽  
Thin Film Coatings

The paper describes a methodology for determining the optical and physical properties of anisotropic thin film materials. This approach allows in the future designing multilayer thin-film coatings with specified properties. An inverse problem of determining the permittivity tensor and the thickness of a thin film deposited on a glass substrate is formulated. Preliminary information on the belonging of a thin-film coating to a certain class can significantly reduce the computing time and increase the accuracy of determining the permittivity tensor over the entire investigated range of wavelengths and film thickness at the point of reflection and transmission measurement Depending on the goals, it is possible to formulate and, therefore, solve various inverse problems: o determination of the permittivity tensor and specification of the thickness of a thick (up to 1 cm) substrate, often isotropic; o determination of the permittivity tensor of a thin isotropic or anisotropic film deposited on a substrate with known optical properties. The complexity of solving each of the problems is very different and each problem requires its own specific set of measured input data. The ultimate results of solving the inverse problem are verified by comparing the calculated transmission and reflection with those measured for arbitrary angles of incidence and reflection.

Determination of optical constants of thin film coating materials based on inverse synthesis

1983 ◽  
Vol 22 (20) ◽  
pp. 3191 ◽  
Author(s):  
J. A. Dobrowolski ◽  
F. C. Ho ◽  
A. Waldorf
Keyword(s):  
Thin Film ◽  
Optical Constants ◽  
Film Coating ◽  
Thin Film Coating ◽  
Coating Materials

scholarly journals Multiple determination of the optical constants of thin-film coating materials

1984 ◽  
Vol 23 (20) ◽  
pp. 3571 ◽  
Author(s):  
D. P. Arndt ◽  
R. M. A. Azzam ◽  
J. M. Bennett ◽  
J. P. Borgogno ◽  
C. K. Carniglia ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Constants ◽  
Film Coating ◽  
Thin Film Coating ◽  
Coating Materials ◽  
Multiple Determination

scholarly journals Oxidation of boron-titanium thin film coating during cyclic tests on thermal shock

2020 ◽  
Vol 1005 ◽  
pp. 012006
Author(s):  
E E Suslov ◽  
A S Larionov ◽  
S B Kislitsin ◽  
I I Chernov ◽  
M S Staltsov ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Shock ◽  
Film Coating ◽  
Cyclic Tests ◽  
Thin Film Coating ◽  
Titanium Thin Film

The Wear Features of a Plasma Thin-Film Coating on High-Speed Steel

2020 ◽  
Vol 41 (2) ◽  
pp. 160-168
Author(s):  
I. A. Rastegaev ◽  
I. I. Rastegaeva ◽  
D. L. Merson ◽  
V. A. Korotkov
Keyword(s):  
Thin Film ◽  
High Speed ◽  
High Speed Steel ◽  
Film Coating ◽  
Thin Film Coating

scholarly journals Multilayer SiC/C Thin Film Coating on Fiber Tip for Raman Probe Application

2021 ◽  
Vol 1892 (1) ◽  
pp. 012016
Author(s):  
Nur Nabilah Samsudin ◽  
Muhammad Firdaus Omar
Keyword(s):  
Thin Film ◽  
Film Coating ◽  
Thin Film Coating ◽  
Raman Probe
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