Calculation of the optical constants of thin films with consideration of the surface roughness and the width of the spectrum of the probing radiation

1980 ◽  
Vol 32 (4) ◽  
pp. 388-390
Author(s):  
B. V. Panasenko ◽  
A. G. Gusev ◽  
I. S. Gainutdinov ◽  
E. A. Nesmelov ◽  
R. B. Tagirov
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Optical Constants

Determination of Optical Properties of Fluorocarbon Polymer Thin Films by a Variable Angle Spectroscopic Ellipsometry

1999 ◽  
Vol 588 ◽  
Author(s):  
Kang-Kuk Lee ◽  
Jin-Goo Park ◽  
Hyung-Jae Shin
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Optical Properties ◽  
Optical Constants ◽  
Visible Spectrum ◽  
Phase Model ◽  
Lorentz Model ◽  
Three Phase ◽  
Variable Angle Spectroscopic Ellipsometry ◽  
Best Fit

AbstractOptical properties of vapor phase (VP) deposited and spin-coated fluorocarbon (FC) thin films on silicon substrates, such as refractive index, extinction coefficient and film thickness were characterized by a variable angle spectroscopic ellipsometry (VASE) in the range of 300–800 nm. A Lorentz model allows us to simulate the optical constants of the FC films with a minimum number of parameters while maintaining Kramers-Kronig (KK) consistency between the real and imaginary parts of the optical constants. FC films are nearly transparent over the visible spectrum, so it is possible to assume k (extinction coefficient) = 0 over part of the visible spectrum in a Cauchy model. To accurately simulate the obtained ellipsometric spectra, we performed a regression analysis in two steps assuming a three-phase and a four-phase model. The regression analysis was performed using the three-phase model and a best-fit mean-squared error (MSE) value of 1.717 (VP deposited FC film, Lorentz model) was obtained. However, the four-phase model was used to improve the best-fit result of 0.531 (VP deposited FC film, Lorentz model). The surface roughness layer was assumed to be a mixture of FC films and voids under the Bruggeman effective medium approximation (EMA). We found that the best-fit MSE was reduced when surface roughness was included.

Some aspects of surface roughness in polycrystalline thin films: optical constants and grain distribution

Vacuum ◽  
1992 ◽  
Vol 43 (12) ◽  
pp. 1201-1205 ◽  
Author(s):  
D Bhattacharyya ◽  
S Chaudhuri ◽  
AK Pal ◽  
SK Bhattacharyya
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Optical Constants ◽  
Polycrystalline Thin Films ◽  
Grain Distribution

scholarly journals Optical Constants of α- and β-Zinc(II)-Phthalocyanine Films

2013 ◽  
Vol 2013 ◽  
pp. 1-5 ◽  
Author(s):  
Michael Kozlik ◽  
Sören Paulke ◽  
Marco Gruenewald ◽  
Roman Forker ◽  
Torsten Fritz
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Quartz Glass ◽  
Numerical Algorithm ◽  
Vapor Deposition ◽  
Physical Vapor Deposition ◽  
Optical Constants ◽  
Annealing Process ◽  
Glass Substrates ◽  
Vis Spectroscopy

We present a dataset of the optical constants of α- and β-zinc(II)-phthalocyanine (ZnPc). They were determined accurately from transmission and differential reflectance spectra, with the surface roughness taken into account. For this purpose, thin films were prepared on quartz glass substrates via physical vapor deposition and characterized by ultraviolet-visible (UV-Vis) spectroscopy before as well as after a well-defined annealing process. Kramers-Kronig consistency of the optical constants obtained was checked by means of a numerical algorithm.

Optical Properties of Cu2ZnSnSe4 Nanocrystalline Thin Films for Photovoltaic Devices

2015 ◽  
Vol 789-790 ◽  
pp. 90-94
Author(s):  
Anderson Dussan ◽  
Heiddy P. Quiroz ◽  
Jorge A. Calderón ◽  
Sandra M. López
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Refractive Index ◽  
Optical Properties ◽  
Extinction Coefficient ◽  
Optical Constants ◽  
High Surface ◽  
Photovoltaic Devices ◽  
Xrd Patterns ◽  
Nanocrystalline Thin Films

Presents a study of optical properties from transmittance measurements as a function of wavelength to CZTSe thin films (Cu2ZnSnSe4) using Bhattacharyya model and basic elements from the Swanepoel theory. The optical constants such as the absorption coefficient (α), the refractive index (n), the extinction coefficient (k) and physical properties such as gap (Eg), the real and imaginary part of the dielectric function (ε1 and ε2) and the film thickness (d), were determined. Gap values between 1.2 and 1.7 eV were obtained for compound when the mass (MX) of ZnSe was varied during the deposition stage. Inhomogeneity and high surface roughness were observed by SEM measurements for all samples. Size grain varying between 458.16 and 630.28 nm were obtained while the ZnSe binary mass varied from 0.171 to 0.153 g. Refractive index and extinction coefficient of Cu2ZnSnSe4 films were obtained for λ = 800 nm. A decrease of ε1 and ε2 was observed as the wavelength increases; it is associated with the presence of binary phases in the XRD patterns.

Reduced Surface Roughness of P3HT: PCBM Thin Films with Different Ratios by Electrospray Deposition Methods

2013 ◽  
Vol E96.C (3) ◽  
pp. 362-364
Author(s):  
Takeshi FUKUDA ◽  
Kenji TAKAGI ◽  
Norihiko KAMATA ◽  
Jungmyoung JU ◽  
Yutaka YAMAGATA
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Electrospray Deposition ◽  
Reduced Surface

scholarly journals Modeling the Layer-by-Layer Growth of HKUST-1 Metal-Organic Framework Thin Films

Nanomaterials ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 1631
Author(s):  
Qiang Zhang ◽  
Yohanes Pramudya ◽  
Wolfgang Wenzel ◽  
Christof Wöll
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Deposition Rate ◽  
Layer Growth ◽  
Coarse Grained ◽  
Structural Defects ◽  
Effect Of Temperature ◽  
Layer By Layer ◽  
Reactant Concentration ◽  
Metal Organic

Metal organic frameworks have emerged as an important new class of materials with many applications, such as sensing, gas separation, drug delivery. In many cases, their performance is limited by structural defects, including vacancies and domain boundaries. In the case of MOF thin films, surface roughness can also have a pronounced influence on MOF-based device properties. Presently, there is little systematic knowledge about optimal growth conditions with regard to optimal morphologies for specific applications. In this work, we simulate the layer-by-layer (LbL) growth of the HKUST-1 MOF as a function of temperature and reactant concentration using a coarse-grained model that permits detailed insights into the growth mechanism. This model helps to understand the morphological features of HKUST-1 grown under different conditions and can be used to predict and optimize the temperature for the purpose of controlling the crystal quality and yield. It was found that reactant concentration affects the mass deposition rate, while its effect on the crystallinity of the generated HKUST-1 film is less pronounced. In addition, the effect of temperature on the surface roughness of the film can be divided into three regimes. Temperatures in the range from 10 to 129 °C allow better control of surface roughness and film thickness, while film growth in the range of 129 to 182 °C is characterized by a lower mass deposition rate per cycle and rougher surfaces. Finally, for T larger than 182 °C, the film grows slower, but in a smooth fashion. Furthermore, the potential effect of temperature on the crystallinity of LbL-grown HKUST-1 was quantified. To obtain high crystallinity, the operating temperature should preferably not exceed 57 °C, with an optimum around 28 °C, which agrees with experimental observations.

scholarly journals Colloidal CuInSe 2 nanocrystals thin films of low surface roughness

2013 ◽  
Vol 4 (1) ◽  
pp. 015004 ◽  
Author(s):  
Antoine de Kergommeaux ◽  
Angela Fiore ◽  
Jérôme Faure-Vincent ◽  
Adam Pron ◽  
Peter Reiss
Keyword(s):  
Thin Films ◽  
Surface Roughness

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films
Sign in / Sign up

Export Citation Format

Share Document