Integrated optics for the characterization of photoreactive organic thin films

1995 ◽  
Vol 67 (1) ◽  
pp. 87-94 ◽  
Author(s):  
Wolfgang Knoll
Keyword(s):  
Thin Films ◽  
Integrated Optics ◽  
Organic Thin Films

Optical spectroscopy characterization of zinc tetra pyridel porphine (ZnTPyP) organic thin films

2018 ◽  
Vol 106 ◽  
pp. 136-144 ◽  
Author(s):  
M.M. Shehata ◽  
H. Kamal ◽  
H.M. Hasheme ◽  
M.M. El-Nahass ◽  
K. Abdelhady
Keyword(s):  
Thin Films ◽  
Optical Spectroscopy ◽  
Organic Thin Films

Characterization of organic thin films for OLEDs using spectroscopic ellipsometry

1997 ◽  
Vol 26 (4) ◽  
pp. 366-371 ◽  
Author(s):  
Francis G. Celii ◽  
Tracy B. Harton ◽  
O.Faye Phillips
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Organic Thin Films

Non-Destructive Characterization of Semiconductors Using Organic Thin Films

1985 ◽  
Vol 54 ◽  
Author(s):  
Stephen R. Forrest ◽  
Martin L. Kaplan ◽  
Paul H. Schmidt
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
Metal Contact ◽  
Organic Layer ◽  
Vacuum Deposition ◽  
Non Destructive Evaluation ◽  
Non Destructive ◽  
Non Destructive Characterization ◽  
Related Compounds

ABSTRACTRectifying junctions prepared by vacuum deposition of 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA) and related compounds on both p- and n-type inorganic semiconducting wafers are used for their non-destructive evaluation. By evaporation of metal contact pads onto the organic layer, we can probe many of the fundamental -bulk and surface properties of the semiconductor.

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