Non-Destructive Characterization of Semiconductors Using Organic Thin Films

1985 ◽  
Vol 54 ◽  
Author(s):  
Stephen R. Forrest ◽  
Martin L. Kaplan ◽  
Paul H. Schmidt
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
Metal Contact ◽  
Organic Layer ◽  
Vacuum Deposition ◽  
Non Destructive Evaluation ◽  
Non Destructive ◽  
Non Destructive Characterization ◽  
Related Compounds

ABSTRACTRectifying junctions prepared by vacuum deposition of 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA) and related compounds on both p- and n-type inorganic semiconducting wafers are used for their non-destructive evaluation. By evaporation of metal contact pads onto the organic layer, we can probe many of the fundamental -bulk and surface properties of the semiconductor.

Development of interdigital transducer sensors for non-destructive characterization of thin films using high frequency Rayleigh waves

2011 ◽  
Vol 82 (6) ◽  
pp. 064905 ◽  
Author(s):  
Julien Deboucq ◽  
Marc Duquennoy ◽  
Mohammadi Ouaftouh ◽  
Frédéric Jenot ◽  
Julien Carlier ◽  
...  
Keyword(s):  
Thin Films ◽  
High Frequency ◽  
Rayleigh Waves ◽  
Interdigital Transducer ◽  
Non Destructive ◽  
Non Destructive Characterization

scholarly journals Non-Destructive Characterization of UO2+x Nuclear Fuels

2017 ◽  
Vol 25 (6) ◽  
pp. 42-47 ◽  
Author(s):  
Reeju Pokharel ◽  
Donald W. Brown ◽  
Bjørn Clausen ◽  
Darrin D. Byler ◽  
Timothy L. Ickes ◽  
...  
Keyword(s):  
Nuclear Fuels ◽  
Non Destructive ◽  
Non Destructive Characterization

Long range, non-destructive characterization of GaN substrates for power devices

2019 ◽  
Vol 506 ◽  
pp. 178-184 ◽  
Author(s):  
J.C. Gallagher ◽  
T.J. Anderson ◽  
L.E. Luna ◽  
A.D. Koehler ◽  
J.K. Hite ◽  
...  
Keyword(s):  
Long Range ◽  
Power Devices ◽  
Non Destructive ◽  
Non Destructive Characterization
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