Statistical properties of measured X-ray intensities affected by counting loss

2008 ◽  
Vol 41 (6) ◽  
pp. 1019-1023
Author(s):  
T. Ida
Keyword(s):  
Dead Time ◽  
Theoretical Models ◽  
Repeated Measurements ◽  
Statistical Properties ◽  
Time Model ◽  
Counting Loss ◽  
X Ray ◽  
Detection Systems ◽  
Statistical Errors ◽  
Degree Of Extension

The statistical properties of X-ray intensities measured with counting systems have been experimentally investigated. A formula of statistical variance for the intermediately extended dead-time model is proposed and compared with the experimentally evaluated variance obtained from repeated measurements based on Chipman's foil method applied to X-ray detection systems of laboratory and synchrotron powder diffractometers. It has been found that the variance of the observed intensities is smaller than the average of count, as has been suggested by conventional theoretical models for counting loss. It is shown that the statistical errors can be predicted by applying an intermediately extended dead-time model including dead-time τ and degree of extension ρ as fixed parameters.

Counting Loss

2016 ◽  
Author(s):  
M. De Bruin
Keyword(s):  
Counting Loss

Counting-loss correction for X-ray spectra using the pulse-repairing method

2018 ◽  
Vol 25 (6) ◽  
pp. 1760-1767
Author(s):  
Lin Tang ◽  
Jianbin Zhou ◽  
Fang Fang ◽  
Jie Yu ◽  
Xu Hong ◽  
...  
Keyword(s):  
Energy Spectrum ◽  
High Performance ◽  
Technical Problem ◽  
Improved Method ◽  
Elimination Method ◽  
Counting Loss ◽  
X Ray ◽  
Pulse Distortion ◽  
Measurement Results ◽  
Measurement Object

Facing the technical problem of pulse distortion caused by frequent resetting in the latest high-performance silicon drift detectors, which work under high-counting-rate conditions, a method has been used to remove false peaks in order to obtain a precise X-ray spectrum, the essence of which eliminates distorted pulses. Aiming at solving the problem of counting-loss generated by eliminating distorted pulses, this paper proposes an improved method of pulse repairing. A 238Pu source with activity of 10 mCi was used as the measurement object, and the energy spectrum obtained by the pulse repairing method was compared with that obtained by the pulse elimination method. The ten-measurement results show that the pulse repairing method can correct the counting-loss caused by the pulse elimination method and increase peak area, which is of great significance for obtaining a precise X-ray energy spectrum.

Monte Carlo simulation of the effect of counting losses on measured X-ray intensities

2007 ◽  
Vol 40 (5) ◽  
pp. 964-965
Author(s):  
T. Ida
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Monte Carlo Method ◽  
Dead Time ◽  
Statistical Properties ◽  
Time Model ◽  
Mean Values ◽  
Counting Loss ◽  
X Ray ◽  
The Mean

The statistical properties of intensities affected by counting loss based on conventional non-extended and extended dead-time models are examined by a Monte Carlo method. It has been confirmed that the variance of the counted pulses for the non-extended dead-time model with the rate of generated pulsesr and the dead-time τ is given by \sigma_{\rm non}^2 = \mu_{\rm non}/(1+r \tau)^2, while that for the extended dead-time model is given by \sigma_{\rm ext}^2 = \mu_{\rm ext} [1 - 2r\tau \exp(-r \tau)], as proposed by Laundy & Collins [(2003).J. Synchrotron Rad.10, 214–218], for the mean values of counted pulses μnonand μext, respectively. Practical formulae to estimate the statistical errors of the corrected intensities are also presented.

Influence of Line Profile on Counting Loss Correction

1967 ◽  
Vol 6 (11) ◽  
pp. 1263-1264
Author(s):  
Sukeaki Hosoya ◽  
Tomoe Yamagishi
Keyword(s):  
Line Profile ◽  
Counting Loss
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