Surface Characterization of Atactic Poly(methyl methacrylate) Aggregates Using Atomic Force Microscopy

Jijun Wang; Yanhong Luo; Deyan Shen

doi:10.1295/polymj.34.471

Surface Characterization of Atactic Poly(methyl methacrylate) Aggregates Using Atomic Force Microscopy

Polymer Journal ◽

10.1295/polymj.34.471 ◽

2002 ◽

Vol 34 (6) ◽

pp. 471-473

Author(s):

Jijun Wang ◽

Yanhong Luo ◽

Deyan Shen

Keyword(s):

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Surface Characterization ◽

Poly Methyl Methacrylate ◽

Force Microscopy ◽

Atomic Force

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Surface characterization of microstructures on glass by atomic force microscopy and analytical scanning electron microscopy

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-45 ◽

2017 ◽

pp. 221-224

Author(s):

T. Boeck ◽

K. Schmidt ◽

A. Gerlitzke ◽

P.-M. Wilde

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Analytical Scanning Electron Microscopy ◽

Scanning Electron

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Investigation of incubation in ArF excimer laser irradiated poly(methyl-methacrylate) using pulsed force mode atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.1803632 ◽

2004 ◽

Vol 96 (10) ◽

pp. 5548-5551 ◽

Cited By ~ 4

Author(s):

B. Hopp ◽

T. Smausz ◽

J. Kokavecz ◽

N. Kresz ◽

Z. Bor ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Excimer Laser ◽

Poly Methyl Methacrylate ◽

Force Microscopy ◽

Atomic Force ◽

Force Mode ◽

Arf Excimer Laser ◽

Mode Atomic Force Microscopy

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Atomic force microscopy as a suitable technique for surface characterization of activated composite membranes for metal ion facilitated transport

Applied Physics A ◽

10.1007/s00339-006-3609-x ◽

2006 ◽

Vol 84 (3) ◽

pp. 277-284 ◽

Cited By ~ 13

Author(s):

J. Macanás ◽

L. Palacio ◽

P. Prádanos ◽

A. Hernández ◽

M. Muñoz

Keyword(s):

Atomic Force Microscopy ◽

Metal Ion ◽

Surface Characterization ◽

Composite Membranes ◽

Facilitated Transport ◽

Force Microscopy ◽

Atomic Force ◽

Suitable Technique

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Nanostructure development in polystyrene-b -polybutadiene-b -poly(methyl methacrylate) (SBM) thin films by atomic force microscopy: Effect of copolymer composition and solvent

Polymer Engineering & Science ◽

10.1002/pen.24589 ◽

2017 ◽

Vol 58 (3) ◽

pp. 422-429 ◽

Cited By ~ 2

Author(s):

Loli Martin ◽

Lourdes Irusta ◽

Alba González ◽

Agnieszka Tercjak ◽

Galder Kortaberria

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Copolymer Composition ◽

Poly Methyl Methacrylate ◽

Force Microscopy ◽

Atomic Force

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Surface Characterization of Plasma-treated Eucalyptus Alkaline Peroxide Mechanical Pulp using Electronic Spectroscopy Chemical Analysis and Atomic Force Microscopy

BioResources ◽

10.15376/biores.13.2.3500-3510 ◽

2018 ◽

Vol 13 (2) ◽

Author(s):

Chongxing Huang ◽

Yuan Zhao ◽

Ying Liu ◽

Yizhao Chen ◽

Cuicui Li ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Chemical Analysis ◽

Surface Characterization ◽

Electronic Spectroscopy ◽

Mechanical Pulp ◽

Force Microscopy ◽

Alkaline Peroxide ◽

Atomic Force

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Surface characterization of human hair by atomic force microscopy in the imaging and F-d modes

International Journal of Cosmetic Science ◽

10.1046/j.1467-2494.2001.00080.x ◽

2001 ◽

Vol 23 (3) ◽

pp. 165-174 ◽

Cited By ~ 15

Author(s):

J. Blach ◽

W. Loughlin ◽

G. Watson ◽

S. Myhra

Keyword(s):

Atomic Force Microscopy ◽

Human Hair ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force

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Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

Journal of Metastable and Nanocrystalline Materials ◽

10.4028/www.scientific.net/jmnm.20-21.611 ◽

2004 ◽

Vol 20-21 ◽

pp. 611-616

Author(s):

José M. Barandiarán ◽

Iñaki Orue ◽

M.L. Fdez-Gubieda ◽

A. García Prieto

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force

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The influence of solvent residue, support type and UV-irradiation on surface morphology of poly(methyl methacrylate) films studied by Atomic Force Microscopy

Polymer Testing ◽

10.1016/j.polymertesting.2008.05.005 ◽

2008 ◽

Vol 27 (6) ◽

pp. 736-742 ◽

Cited By ~ 14

Author(s):

Halina Kaczmarek ◽

Hanna Chaberska

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Methyl Methacrylate ◽

Uv Irradiation ◽

Poly Methyl Methacrylate ◽

Force Microscopy ◽

Atomic Force ◽

Solvent Residue ◽

Influence Of Solvent

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Surface Characterization of Collagen Films by Atomic Force Microscopy

XII Mediterranean Conference on Medical and Biological Engineering and Computing 2010 - IFMBE Proceedings ◽

10.1007/978-3-642-13039-7_154 ◽

2010 ◽

pp. 612-615 ◽

Cited By ~ 8

Author(s):

A. Stylianou ◽

S. B. Kontomaris ◽

M. Kyriazi ◽

D. Yova

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force

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Microthermal Characterization of Segmented Polyurethane Elastomers and a Polystyrene−Poly(methyl methacrylate) Polymer Blend Using Variable-Temperature Pulsed Force Mode Atomic Force Microscopy

Macromolecules ◽

10.1021/ma0002040 ◽

2000 ◽

Vol 33 (25) ◽

pp. 9348-9359 ◽

Cited By ~ 30

Author(s):

David B. Grandy ◽

Douglas J. Hourston ◽

Duncan M. Price ◽

Michael Reading ◽

Glaura Goulart Silva ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Variable Temperature ◽

Segmented Polyurethane ◽

Polyurethane Elastomers ◽

Force Microscopy ◽

Atomic Force ◽

Force Mode ◽

Mode Atomic Force Microscopy

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