Direct Observation of Specific Interaction between Enzyme-substrate Complexes Using Colloidal Probe Atomic Force Microscopy

2004 ◽  
Vol 33 (5) ◽  
pp. 536-537 ◽  
Author(s):  
Takehiro Suzuki ◽  
Yuan-Wei Zhang ◽  
Tanetoshi Koyama ◽  
Darryl Y. Sasaki ◽  
Kazue Kurihara
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Specific Interaction ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Enzyme Substrate ◽  
Atomic Force

DIRECT OBSERVATION BY ATOMIC FORCE MICROSCOPY OF SEVERAL BACTERIA SPECIES

1996 ◽  
Vol 86 (2-3) ◽  
pp. 193-193
Author(s):  
Denis ROBICHON ◽  
Jean-Franc¸ois CAVELLIER ◽  
Yves CENATIEMPO ◽  
Jean-Christophe GIRARD
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of polyhydroxyalkanoate chains by atomic force microscopy

2002 ◽  
Vol 91 (1-4) ◽  
pp. 157-164 ◽  
Author(s):  
Kumar Sudesh ◽  
Zhihua Gan ◽  
Ken’ichiro Matsumoto ◽  
Yoshiharu Doi
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of surfactant aggregate behavior on a mica surface using high-speed atomic force microscopy

2011 ◽  
Vol 47 (17) ◽  
pp. 4974 ◽  
Author(s):  
Shigeto Inoue ◽  
Takayuki Uchihashi ◽  
Daisuke Yamamoto ◽  
Toshio Ando
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Mica Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Aggregate Behavior

Direct observation of atomic step edges on the rutile TiO2(110)-(1 × 1) surface using atomic force microscopy

2018 ◽  
Vol 20 (44) ◽  
pp. 28331-28337 ◽  
Author(s):  
Huan Fei Wen ◽  
Masato Miyazaki ◽  
Quanzhen Zhang ◽  
Yuuki Adachi ◽  
Yan Jun Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Atomic Step ◽  
Atomic Configuration ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Step Edges

Clarifying the atomic configuration of step edges on a rutile TiO2 surface is crucial for understanding its fundamental reactivity, and the direct observation of atomic step edges is still a challenge.

scholarly journals Direct Observation of Rotary Catalysis of Rotorless F1-ATPase by High-Speed Atomic Force Microscopy

2012 ◽  
Vol 102 (3) ◽  
pp. 600a
Author(s):  
Ryota Iino ◽  
Takayuki Uchihashi ◽  
Toshio Ando ◽  
Hiroyuki Noji
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Force Microscopy ◽  
F1 Atpase ◽  
Atomic Force ◽  
Rotary Catalysis

The Specific Binding between Galactose Group and Ricinus Communis Agglutinin (RCA) Investigated with Microcantilever

2012 ◽  
Vol 531-532 ◽  
pp. 600-604
Author(s):  
Hui Yong Zhang ◽  
Ji Hu ◽  
Hui Min Liu
Keyword(s):  
Atomic Force Microscopy ◽  
Self Assembly ◽  
Control Experiment ◽  
Ricinus Communis ◽  
Specific Binding ◽  
Specific Interaction ◽  
Protein Layer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ricinus Communis Agglutinin

The specific recognization between galactose group and Ricinus Communis Agglutinin (RCA) was investigated by microcantilever. The gold side of the microcantilever was covalently bound with N-galactose, RCA and asialofetuin (ASF) via mixed self assembly monolayer of 11-mercaptoundecanoic acid and 6-mercaptohexanol, respectively. After adding RCA into the flowing cell, the deflection could be observed on the N-galactose or ASF modified microcantilever. Meanwhile, the deflection could also be observed after ASF bound to the RCA modified microcantilever. In order to prove that the deflection is caused by the specific interaction between the galactose group and RCA, bovine serum albumin (BSA) was introduced into the flowing cell as control experiment and no obvious deflection was observed. The specific interaction was also confirmed by the evidence that the bound protein layer can be mechanically removed with atomic force microscopy nanolithography technology.

Direct Observation at Nanoscale of Resistance Switching in NiO Layers by Conductive-Atomic Force Microscopy

2011 ◽  
Vol 4 (5) ◽  
pp. 051101 ◽  
Author(s):  
Damien Deleruyelle ◽  
Carine Dumas ◽  
Marion Carmona ◽  
Christophe Muller ◽  
Sabina Spiga ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Resistance Switching ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Stratification of Colloidal Particles on a Surface: Study by a Colloidal Probe Atomic Force Microscopy Combined with a Transform Theory

2018 ◽  
Vol 122 (16) ◽  
pp. 4592-4599 ◽  
Author(s):  
Ken-ichi Amano ◽  
Taira Ishihara ◽  
Kota Hashimoto ◽  
Naoyuki Ishida ◽  
Kazuhiro Fukami ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Colloidal Particles ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Study
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