Stratification of Colloidal Particles on a Surface: Study by a Colloidal Probe Atomic Force Microscopy Combined with a Transform Theory

2018 ◽  
Vol 122 (16) ◽  
pp. 4592-4599 ◽  
Author(s):  
Ken-ichi Amano ◽  
Taira Ishihara ◽  
Kota Hashimoto ◽  
Naoyuki Ishida ◽  
Kazuhiro Fukami ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Colloidal Particles ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Study

scholarly journals Measurement of Interaction Forces between Montmorillonite Particles in NaCl Solutions using a Colloidal Probe Atomic Force Microscopy

2006 ◽  
Vol 5 (3) ◽  
pp. 251-256
Author(s):  
Susumu KUROSAWA ◽  
Masashi MIZUKAMI ◽  
Hisao SATO ◽  
Jun NOZAWA ◽  
Keiichi TSUJIMOTO ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Interaction Forces ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force

Colloidal Probe AFM Measurements of the Electrophoretic Force

2006 ◽  
Vol 314 ◽  
pp. 1-6
Author(s):  
Linda Stappers ◽  
Jan Fransaer
Keyword(s):  
Atomic Force Microscopy ◽  
Electric Fields ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Colloidal Interactions ◽  
Atomic Force ◽  
Cantilever Surface ◽  
Preliminary Study ◽  
High Electric Fields ◽  
Oriented Parallel

Colloidal probe atomic force microscopy is a very useful tool in the study of colloidal interactions. Although this technique has been applied to study interactions between a particle and a polarized electrode during electrodeposition, it has never been used to study interactions in high electric fields as encountered in electrophoretic deposition. In this work, a preliminary study was undertaken to verify whether colloidal probe AFM could be used to measure the electrophoretic force on a particle. It was found that the electrophoretic force could be detected by colloidal probe AFM under certain circumstances. In order to prevent that the contribution of the cantilever on the measurement of the electrophoretic force becomes large, the charge on the cantilever should be small compared to the charge of the particle, which is attached to the cantilever. Moreover, the area of cantilever surface which is oriented parallel to the electric field should be small to minimize the contribution of the cantilever.

scholarly journals Tribological Characteristics of Single-Layer h-BN Measured by Colloidal Probe Atomic Force Microscopy

Coatings ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 530
Author(s):  
Tien Van Tran ◽  
Koo-Hyun Chung
Keyword(s):  
Atomic Force Microscopy ◽  
Solid Lubricant ◽  
Normal Force ◽  
Coating Layer ◽  
Single Layer ◽  
Tribological Characteristics ◽  
Si Substrate ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force

The tribological characteristics of single-layer (1L) hexagonal-boron nitride (h-BN) were systematically investigated using colloidal probe atomic force microscopy, with an aim to elucidate the feasibility as a protective coating layer and solid lubricant for micro- and nanodevices. The experiments were performed to detect the occurrence of failure of 1L h-BN for up to 10,000 cycles under various normal forces. The failure of 1L h-BN did not occur for 10,000 cycles under a 10 μN normal force, corresponding to a contact pressure of about 0.34 GPa. However, the complete failure of 1L h-BN occurred faster with an increasing normal force from 20 to 42 μN. It was observed that the SiO2/Si substrate was locally exposed due to defect formation on the 1L h-BN. The Raman spectroscopy measurement results further suggest that the failure was associated with the compressive strain on 1L h-BN. The friction of 1L h-BN before failure was orders of magnitude smaller than that of a SiO2/Si substrate. The overall results indicate the feasibility of atomically thin h-BN as a protective coating layer and solid lubricant. In particular, the results of this work provide fundamental tribological characteristics of pristine h-BN as a guide, which may be helpful in other practical deposition methods for atomically thin h-BN with enhanced tribological characteristics.

Sign in / Sign up

Export Citation Format

Share Document