scholarly journals Adaptive density estimation in the pile-up model involving measurement errors

2012 ◽  
Vol 6 (0) ◽  
pp. 2002-2037 ◽  
Author(s):  
Fabienne Comte ◽  
Tabea Rebafka
Keyword(s):  
Density Estimation ◽  
Measurement Errors ◽  
Pile Up

Adaptive Density Estimation From Data With Small Measurement Errors

2015 ◽  
Vol 61 (6) ◽  
pp. 3446-3456 ◽  
Author(s):  
Tina Felber ◽  
Michael Kohler ◽  
Adam Krzyzak
Keyword(s):  
Density Estimation ◽  
Measurement Errors

scholarly journals Nanoindentation of Soft Films on Hard Substrates:The Importance of Pile-Up

1996 ◽  
Vol 436 ◽  
Author(s):  
T. Y. Tsui ◽  
W. C. Oliver ◽  
G. M. Pharr
Keyword(s):  
Elastic Modulus ◽  
Measurement Errors ◽  
Flow Characteristics ◽  
Hard Substrate ◽  
Unusual Behavior ◽  
Potential Measurement ◽  
Glass Substrates ◽  
Pile Up ◽  
Film Substrate ◽  
Composite Hardness

AbstractNanoindentation is a common technique for measuring the mechanical properties of thin films. Here, we address the potential measurement errors caused by pile-up when soft films deposited on hard substrates are tested by nanoindentation methods. Pile-up is exacerbated in soft film / hard substrate systems because of the constraint the substrate exerts on plastic deformation of the film. To experimentally examine pile-up effects, aluminum films with thicknesses of 240 and 1700 nm were deposited on hard glass substrates and tested by standard nanoindentation techniques. The aluminum/glass system is interesting because the film and substrate have similar elastic moduli; thus, any unusual behavior in the nanoindentation results may be attributed to differences in the plastic flow characteristics alone. A detailed scanning electron microscopy examination of nanoindentation hardness impressions in the film revealed that common methods for analyzing nanoindentation data underestimate the true contact areas by as much as 80%, which results in overestimations of the hardness and modulus by as much as 80% and 35%, respectively. The sources of these errors and their influence on the measurement of hardness and elastic modulus are discussed, and a simple model for the composite hardness of the film/substrate system is developed. The model could prove useful in measuring the hardness and elastic modulus of soft-film / hard substrate systems when it is not possible to make indentations shallow enough to avoid the substrate influences.

Precise on-line Measurement of Lattice Vectors

1990 ◽  
Vol 48 (1) ◽  
pp. 530-531
Author(s):  
W.J. de Ruijter ◽  
Sharma Renu
Keyword(s):  
Electron Microscope ◽  
Measurement Errors ◽  
Dynamic Range ◽  
Structural Information ◽  
Statistical Parameter ◽  
Systematic Errors ◽  
Geometric Distortion ◽  
Crystal Silicon ◽  
Camera System ◽  
On Line

Established methods for measurement of lattice spacings and angles of crystalline materials include x-ray diffraction, microdiffraction and HREM imaging. Structural information from HREM images is normally obtained off-line with the traveling table microscope or by the optical diffractogram technique. We present a new method for precise measurement of lattice vectors from HREM images using an on-line computer connected to the electron microscope. It has already been established that an image of crystalline material can be represented by a finite number of sinusoids. The amplitude and the phase of these sinusoids are affected by the microscope transfer characteristics, which are strongly influenced by the settings of defocus, astigmatism and beam alignment. However, the frequency of each sinusoid is solely a function of overall magnification and periodicities present in the specimen. After proper calibration of the overall magnification, lattice vectors can be measured unambiguously from HREM images.Measurement of lattice vectors is a statistical parameter estimation problem which is similar to amplitude, phase and frequency estimation of sinusoids in 1-dimensional signals as encountered, for example, in radar, sonar and telecommunications. It is important to properly model the observations, the systematic errors and the non-systematic errors. The observations are modelled as a sum of (2-dimensional) sinusoids. In the present study the components of the frequency vector of the sinusoids are the only parameters of interest. Non-systematic errors in recorded electron images are described as white Gaussian noise. The most important systematic error is geometric distortion. Lattice vectors are measured using a two step procedure. First a coarse search is obtained using a Fast Fourier Transform on an image section of interest. Prior to Fourier transformation the image section is multiplied with a window, which gradually falls off to zero at the edges. The user indicates interactively the periodicities of interest by selecting spots in the digital diffractogram. A fine search for each selected frequency is implemented using a bilinear interpolation, which is dependent on the window function. It is possible to refine the estimation even further using a non-linear least squares estimation. The first two steps provide the proper starting values for the numerical minimization (e.g. Gauss-Newton). This third step increases the precision with 30% to the highest theoretically attainable (Cramer and Rao Lower Bound). In the present studies we use a Gatan 622 TV camera attached to the JEM 4000EX electron microscope. Image analysis is implemented on a Micro VAX II computer equipped with a powerful array processor and real time image processing hardware. The typical precision, as defined by the standard deviation of the distribution of measurement errors, is found to be <0.003Å measured on single crystal silicon and <0.02Å measured on small (10-30Å) specimen areas. These values are ×10 times larger than predicted by theory. Furthermore, the measured precision is observed to be independent on signal-to-noise ratio (determined by the number of averaged TV frames). Obviously, the precision is restricted by geometric distortion mainly caused by the TV camera. For this reason, we are replacing the Gatan 622 TV camera with a modern high-grade CCD-based camera system. Such a system not only has negligible geometric distortion, but also high dynamic range (>10,000) and high resolution (1024x1024 pixels). The geometric distortion of the projector lenses can be measured, and corrected through re-sampling of the digitized image.

Asteroids pile up

Nature ◽  
2002 ◽  
Author(s):  
Meera Louis
Keyword(s):  
Pile Up

Development of reference materials with the composition of propyl and isopropyl alcohol solutions

2020 ◽  
pp. 66-72
Author(s):  
Irina A. Piterskikh ◽  
Svetlana V. Vikhrova ◽  
Nina G. Kovaleva ◽  
Tatyana O. Barynskaya
Keyword(s):  
Reference Materials ◽  
Measurement Errors ◽  
Isopropyl Alcohol ◽  
Certified Reference Materials ◽  
Toxic Substances ◽  
Biological Objects ◽  
Margin Of Error ◽  
Measurement Results ◽  
And Control ◽  
Characteristic Mass

Certified reference materials (CRM) composed of propyl (11383-2019) and isopropyl (11384-2019) alcohols solutions were created for validation of measurement procedures and control of measurement errors of measurement results of mass concentrations of toxic substances (alcohol) in biological objects (urine, blood) and water. Two ways of establishing the value of the certified characteristic – mass consentration of propanol-1 or propanol-2 have been studied. The results obtained by the preparation procedure and comparison with the standard are the same within the margin of error.

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