Xanthene Dye-Doped PVA-Based Thin-Film Optical Filter Characteristics and its Green Laser Beam Blocking

2018 ◽  
pp. 127-134
Author(s):  
R. Renjini ◽  
George Mitty ◽  
V. P. N. Nampoori ◽  
S. Mathew
Keyword(s):  
Thin Film ◽  
Laser Beam ◽  
Optical Filter ◽  
Green Laser

Pulsed Laser Deposition History and Laser-Target Interactions

MRS Bulletin ◽  
1992 ◽  
Vol 17 (2) ◽  
pp. 30-36 ◽  
Author(s):  
Jeff Cheung ◽  
Jim Horwitz
Keyword(s):  
Thin Film ◽  
Laser Beam ◽  
Pulsed Laser Deposition ◽  
Mechanical Energy ◽  
Pulsed Laser ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Laser Deposition ◽  
Small Branch ◽  
The Impact

The laser, as a source of “pure” energy in the form of monochromatic and coherent photons, is enjoying ever increasing popularity in diverse and broad applications from drilling micron-sized holes on semiconductor devices to guidance systems used in drilling a mammoth tunnel under the English Channel. In many areas such as metallurgy, medical technology, and the electronics industry, it has become an irreplaceable tool.Like many other discoveries, the various applications of the laser were not initially defined but were consequences of natural evolution led by theoretical studies. Shortly after the demonstration of the first laser, the most intensely studied theoretical topics dealt with laser beam-solid interactions. Experiments were undertaken to verify different theoretical models for this process. Later, these experiments became the pillars of many applications. Figure 1 illustrates the history of laser development from its initial discovery to practical applications. In this tree of evolution, Pulsed Laser Deposition (PLD) is only a small branch. It remained relatively obscure for a long time. Only in the last few years has his branch started to blossom and bear fruits in thin film deposition.Conceptually and experimentally, PLD is extremely simple, probably the simplest among all thin film growth techniques. Figure 2 shows a schematic diagram of this technique. It uses pulsed laser radiation to vaporize materials and to deposit thin films in a vacuum chamber. However, the beam-solid interaction that leads to evaporation/ablation is a very complex physical phenomenon. The theoretical description of the mechanism is multidisciplinary and combines equilibrium and nonequilibrium processes. The impact of a laser beam on the surface of a solid material, electromagnetic energy is converted first into electronic excitation and then into thermal, chemical, and even mechanical energy to cause evaporation, ablation, excitation, and plasma formation.

scholarly journals 120 Vibration Mode Analysis of Thin Film Resonator under Laser Beam Excitation

2001 ◽  
Vol 2001.50 (0) ◽  
pp. 39-40
Author(s):  
Toshihiro Kobayashi ◽  
Jun Ohsawa ◽  
Naohiro Yamaguchi ◽  
Tamio Hara
Keyword(s):  
Thin Film ◽  
Laser Beam ◽  
Vibration Mode ◽  
Mode Analysis ◽  
Beam Excitation

Optical Characteristics of Silicon Thin Film in Short-Wave Infrared Band and 1.30 μm Bandpass Optical Filter

2012 ◽  
Vol 32 (10) ◽  
pp. 1031001
Author(s):  
段微波 Duan Weibo ◽  
庄秋慧 Zhuang Qiuhui ◽  
李大琪 Li Daqi ◽  
陈刚 Chen Gang ◽  
余德明 Yu Deming ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Filter ◽  
Short Wave ◽  
Optical Characteristics ◽  
Silicon Thin Film ◽  
Infrared Band ◽  
Short Wave Infrared

Video-Rate Scanning Two-Photon Excitation Fluorescence Microscopy

1998 ◽  
Vol 4 (S2) ◽  
pp. 424-425
Author(s):  
G.Y. Fan ◽  
H. Fujisaki ◽  
R.-K. Tsay ◽  
R.Y. Tsien ◽  
Mark H. Ellisman
Keyword(s):  
Laser Beam ◽  
Group Velocity Dispersion ◽  
Laser System ◽  
Average Power ◽  
Laser Pulses ◽  
Green Laser ◽  
Two Photon ◽  
Photon Excitation ◽  
Schematic Layout ◽  
Two Photon Excitation

A video-rate scanning two-photon excitation microscope (TPEM) has been successfully constructed and tested. The TPEM, based on a Nikon RCM-8000, incorporates a femtosecond pulsed laser, a pre-chirper, and a non-confocal detection box for ratio imaging. Fig. 1 shows the schematic layout of the main components of the instrument, each of which is briefly discussed below.Laser System: A Tsunami Ti: Sapphire laser (from Spectra-Physics) is optically pumped by a 5 W green laser (Millennia from Spectra-Physics) and is capable of generating 100 fs pulses at a repetition rate of 82 MHz and an average power of 0.8 W. The output wavelength is tunable from 690 to 1050 nm with three optical sets, each covering part of the spectrum with some overlapping.Pre-chirper: After leaving the Tsunami, the laser beam enters an optic unit known as a pre-chirper which pre-chirps laser pulses to compensate for the group velocity dispersion which will result when the laser beam goes through the microscope optics.

A Novel Optical Filter for Removing Bright-Background Using an Enhanced Bacteriorhodopsin Thin Film

2003 ◽  
Vol 20 (12) ◽  
pp. 2161-2164 ◽  
Author(s):  
Zhang Chun-Ping ◽  
Gu Li-Qun ◽  
Chen Gui-Ying ◽  
Guo Zong-Xia ◽  
Fu Guang-Hua ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Filter

C-band three-port tunable band-pass thin film optical filter with low polarization-sensitivity

2008 ◽  
Vol 281 (14) ◽  
pp. 3709-3714 ◽  
Author(s):  
Kan Yu ◽  
Wen Liu ◽  
Dexiu Huang ◽  
Jing Chang
Keyword(s):  
Thin Film ◽  
Optical Filter ◽  
Polarization Sensitivity ◽  
Band Pass

scholarly journals Comparison of Arc Erosive and Laser Beam Trimming of Thin Film Resistors

1977 ◽  
Vol 4 (3-4) ◽  
pp. 179-183 ◽  
Author(s):  
Zs. Illyefalvi-Vitéz
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Laser Beam ◽  
Measuring Method ◽  
Optimal Conditions ◽  
Current Generator ◽  
Physical Processes ◽  
Laser Beam Machining ◽  
Arc Erosion ◽  
Thin Film Resistors

The physical processes of arc erosive micromachining and the influence of trimming on the parameters of resistors have been examined, and thin film resistors without trimming are compared with those trimmed by arc erosion and laser beam machining.In the paper a theoretical model for arc erosion of thin films is proposed. The optimal conditions of arc erosive trimming are determined. The shape of the cuts are recorded and examined. The applicability of arc erosive trimming with respect to stability is proved. A measuring method is introduced for resistors trimmed by arc erosion using a direct current generator.

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