Compact Modeling of Semiconductor Devices for Electrostatic Discharge Protection Applications

Electrostatic Discharge Protection ◽

10.1201/b18976-10 ◽

2017 ◽

pp. 185-212

Author(s):

Zhenghao Gan ◽

Waisum Wong

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices ◽

Compact Modeling

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Electrostatic discharge in semiconductor devices: an overview

Proceedings of the IEEE ◽

10.1109/5.659493 ◽

1998 ◽

Vol 86 (2) ◽

pp. 399-420 ◽

Cited By ~ 85

Author(s):

J.E. Vinson ◽

J.J. Liou

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

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Electrostatic discharge failures of semiconductor devices

Microelectronics Reliability ◽

10.1016/s0026-2714(82)80213-8 ◽

1982 ◽

Vol 22 (4) ◽

pp. 896

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

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Foreword Special Issue on Compact Modeling of Semiconductor Devices

IEEE Journal of the Electron Devices Society ◽

10.1109/jeds.2020.3039023 ◽

2020 ◽

Vol 8 ◽

pp. 1350-1353

Author(s):

Benjamin Iniguez ◽

Yogesh Singh Chauhan ◽

Slobodan Mijalkovic ◽

Kejun Xia ◽

Jung-Suk Goo ◽

...

Keyword(s):

Semiconductor Devices ◽

Compact Modeling ◽

Special Issue

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Call for papers for a Special Issue of IEEE Journal of the Electron Devices Society on Compact Modeling of Semiconductor Devices

IEEE Transactions on Electron Devices ◽

10.1109/ted.2019.2960953 ◽

2020 ◽

Vol 67 (1) ◽

pp. 413-415

Keyword(s):

Semiconductor Devices ◽

Compact Modeling ◽

Special Issue ◽

Ieee Journal ◽

Electron Devices

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An electrostatic discharge failure mechanism in semiconductor devices, with applications to electrostatic discharge measurements using transmission line pulsing technique

Solid-State Electronics ◽

10.1016/s0038-1101(00)00122-2 ◽

2000 ◽

Vol 44 (10) ◽

pp. 1771-1781 ◽

Cited By ~ 5

Author(s):

J.C Lee ◽

A Hoque ◽

G.D Croft ◽

J.J Liou ◽

R Young ◽

...

Keyword(s):

Transmission Line ◽

Failure Mechanism ◽

Electrostatic Discharge ◽

Semiconductor Devices ◽

Discharge Measurements

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Constant energy charged device model (CECDM) for electrostatic discharge (ESD) and semiconductor devices

IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting ◽

10.1109/ias.1995.530444 ◽

2002 ◽

Author(s):

W.D. Greason ◽

S. Bulach

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices ◽

Constant Energy ◽

Device Model ◽

Charged Device Model ◽

Charged Device

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An improved transmission line pulsing (TLP) setup for electrostatic discharge (ESD) testing in semiconductor devices and ICs

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) ◽

10.1109/icmts.2001.928668 ◽

2002 ◽

Cited By ~ 1

Author(s):

J.C. Lee ◽

R. Young ◽

J.J. Liou ◽

G.D. Croft ◽

J.C. Bernier

Keyword(s):

Transmission Line ◽

Electrostatic Discharge ◽

Semiconductor Devices

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Case Study on Failure Analysis of Electrostatic Discharge Damage of Semiconductor Devices

DEStech Transactions on Engineering and Technology Research ◽

10.12783/dtetr/ismii2017/16679 ◽

2017 ◽

Author(s):

Lin HU ◽

Qizheng JI ◽

Sheng-zong HE ◽

You-liang WANG ◽

Xiao-si LIANG

Keyword(s):

Failure Analysis ◽

Electrostatic Discharge ◽

Semiconductor Devices

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Call for papers for a Special Issue of IEEE Journal of the Electron Devices Society on Compact Modeling of Semiconductor Devices

IEEE Transactions on Electron Devices ◽

10.1109/ted.2020.2967230 ◽

2020 ◽

Vol 67 (2) ◽

pp. 763-765

Keyword(s):

Semiconductor Devices ◽

Compact Modeling ◽

Special Issue ◽

Ieee Journal ◽

Electron Devices

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Prolog To Electrostatic Discharge In Semiconductor Devices: An Overview

Proceedings of the IEEE ◽

10.1109/jproc.1998.659492 ◽

1998 ◽

Vol 86 (2) ◽

pp. 397-398

Author(s):

J. Esch

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

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