Prolog To Electrostatic Discharge In Semiconductor Devices: An Overview

J. Esch

doi:10.1109/jproc.1998.659492

Prolog To Electrostatic Discharge In Semiconductor Devices: An Overview

Proceedings of the IEEE ◽

10.1109/jproc.1998.659492 ◽

1998 ◽

Vol 86 (2) ◽

pp. 397-398

Author(s):

J. Esch

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

Download Full-text

Electrostatic discharge in semiconductor devices: an overview

Proceedings of the IEEE ◽

10.1109/5.659493 ◽

1998 ◽

Vol 86 (2) ◽

pp. 399-420 ◽

Cited By ~ 85

Author(s):

J.E. Vinson ◽

J.J. Liou

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

Download Full-text

Electrostatic discharge failures of semiconductor devices

Microelectronics Reliability ◽

10.1016/s0026-2714(82)80213-8 ◽

1982 ◽

Vol 22 (4) ◽

pp. 896

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

Download Full-text

An electrostatic discharge failure mechanism in semiconductor devices, with applications to electrostatic discharge measurements using transmission line pulsing technique

Solid-State Electronics ◽

10.1016/s0038-1101(00)00122-2 ◽

2000 ◽

Vol 44 (10) ◽

pp. 1771-1781 ◽

Cited By ~ 5

Author(s):

J.C Lee ◽

A Hoque ◽

G.D Croft ◽

J.J Liou ◽

R Young ◽

...

Keyword(s):

Transmission Line ◽

Failure Mechanism ◽

Electrostatic Discharge ◽

Semiconductor Devices ◽

Discharge Measurements

Download Full-text

Constant energy charged device model (CECDM) for electrostatic discharge (ESD) and semiconductor devices

IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting ◽

10.1109/ias.1995.530444 ◽

2002 ◽

Author(s):

W.D. Greason ◽

S. Bulach

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices ◽

Constant Energy ◽

Device Model ◽

Charged Device Model ◽

Charged Device

Download Full-text

An improved transmission line pulsing (TLP) setup for electrostatic discharge (ESD) testing in semiconductor devices and ICs

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) ◽

10.1109/icmts.2001.928668 ◽

2002 ◽

Cited By ~ 1

Author(s):

J.C. Lee ◽

R. Young ◽

J.J. Liou ◽

G.D. Croft ◽

J.C. Bernier

Keyword(s):

Transmission Line ◽

Electrostatic Discharge ◽

Semiconductor Devices

Download Full-text

Case Study on Failure Analysis of Electrostatic Discharge Damage of Semiconductor Devices

DEStech Transactions on Engineering and Technology Research ◽

10.12783/dtetr/ismii2017/16679 ◽

2017 ◽

Author(s):

Lin HU ◽

Qizheng JI ◽

Sheng-zong HE ◽

You-liang WANG ◽

Xiao-si LIANG

Keyword(s):

Failure Analysis ◽

Electrostatic Discharge ◽

Semiconductor Devices

Download Full-text

Compact Modeling of Semiconductor Devices for Electrostatic Discharge Protection Applications

Electrostatic Discharge Protection ◽

10.1201/b18976-10 ◽

2017 ◽

pp. 185-212

Author(s):

Zhenghao Gan ◽

Waisum Wong

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices ◽

Compact Modeling

Download Full-text

A closed-form model for electrostatic discharge thermal runaway in semiconductor devices

Solid-State Electronics ◽

10.1016/0038-1101(93)90021-h ◽

1993 ◽

Vol 36 (11) ◽

pp. 1511-1514 ◽

Cited By ~ 4

Author(s):

Hyek H. Choi ◽

Thomas A. DeMassa

Keyword(s):

Closed Form ◽

Electrostatic Discharge ◽

Semiconductor Devices ◽

Thermal Runaway ◽

Form Model

Download Full-text

Analysis of models for electrostatic discharge (ESD) and semiconductor devices

Proceedings of 1994 IEEE Industry Applications Society Annual Meeting ◽

10.1109/ias.1994.377645 ◽

2002 ◽

Cited By ~ 2

Author(s):

W.D. Greason

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

Download Full-text

Electrostatic discharge in semiconductor devices: protection techniques

Proceedings of the IEEE ◽

10.1109/5.899057 ◽

2000 ◽

Vol 88 (12) ◽

pp. 1878-1902 ◽

Cited By ~ 33

Author(s):

J.E. Vinson ◽

J.J. Liou

Keyword(s):

Electrostatic Discharge ◽

Semiconductor Devices

Download Full-text