- Applications of Metal-Induced Crystallization Polycrystalline Silicon for Advanced Flat-Panel Displays

2015 ◽  
pp. 212-265
1998 ◽  
Vol 37 (Part 1, No. 12B) ◽  
pp. 7193-7197 ◽  
Author(s):  
Soo Young Yoon ◽  
Sung Ki Kim ◽  
Jae Young Oh ◽  
YoungJin Choi ◽  
Woo Sung Shon ◽  
...  

1987 ◽  
Vol 62 (9) ◽  
pp. 3726-3732 ◽  
Author(s):  
S. F. Gong ◽  
H. T. G. Hentzell ◽  
A. E. Robertsson ◽  
L. Hultman ◽  
S.‐E. Hörnström ◽  
...  

1990 ◽  
Vol 182 ◽  
Author(s):  
B.-C. Hseih ◽  
G.A. Hawkins ◽  
S. Ashok

AbstractWe report on the characteristics of polycrystalline silicon (polysilicon) thin film transistors (TFTs) fabricated with low temperature crystallized LPCVD amorphous silicon film as an active layer and plasma enhanced chemical vapor deposition (PECVD) SiO2 as a gate insulator. High performance transistor characteristics are achieved, even though no process temperature exceeds 600°C. No threshold drift has been observed. As a result, these devices are highly suitable for application to image scanners as well as flat panel displays.


2004 ◽  
Vol 338-340 ◽  
pp. 178-182 ◽  
Author(s):  
L. Pereira ◽  
H. Águas ◽  
R.M. Martins ◽  
E. Fortunato ◽  
R. Martins

2003 ◽  
Vol 440 (1-2) ◽  
pp. 1-4 ◽  
Author(s):  
Jong Hyun Choi ◽  
Do Young Kim ◽  
Seung Soo Kim ◽  
Seong Jin Park ◽  
Jin Jang

2004 ◽  
Vol 451-452 ◽  
pp. 334-339 ◽  
Author(s):  
L. Pereira ◽  
H. Águas ◽  
R.M.S. Martins ◽  
P. Vilarinho ◽  
E. Fortunato ◽  
...  

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