Diffraction Phenomenon

2018 ◽  
pp. 55-67
Author(s):  
Chandrasekhar Roychoudhuri
Keyword(s):  
Diffraction Phenomenon

Some Applications of the U. S. Steel MVEM

1973 ◽  
Vol 31 ◽  
pp. 4-5
Author(s):  
J. S. Lally ◽  
L. E. Thomas ◽  
R. M. Fisher
Keyword(s):  
Electron Diffraction ◽  
Debye Temperature ◽  
Metals And Alloys ◽  
Critical Voltage ◽  
Dynamical Diffraction ◽  
Phase Structures ◽  
Structure Factors ◽  
Local Bonding ◽  
Diffraction Phenomenon ◽  
Multi Phase

A variety of materials containing many different microstructures have been examined with the USS MVEM. Three topics have been selected to illustrate some of the more recent studies of diffraction phenomena and defect, grain and multi-phase structures of metals and minerals.(1) Critical Voltage Effects in Metals and Alloys - This many-beam dynamical diffraction phenomenon, in which some Bragg resonances vanish at certain accelerating voltages, Vc, depends sensitively on the spacing of diffracting planes, Debye temperature θD and structure factors. Vc values can be measured to ± 0.5% in the HVEM ana used to obtain improved extinction distances and θD values appropriate to electron diffraction, as well as to probe local bonding effects and composition variations in alloys.

scholarly journals Demonstrative experiment study on the consistency of two-slit interference and diffraction phenomenon

2015 ◽  
Author(s):  
Jie Zhao ◽  
Dayong Wang ◽  
Yunxin Wang ◽  
Lu Rong ◽  
Zhuqing Jiang ◽  
...  
Keyword(s):  
Experiment Study ◽  
Diffraction Phenomenon

Blood and lymph flow measurements in microvessels using focused laser beam diffraction phenomenon

1995 ◽  
Author(s):  
Andrey A. Bednov ◽  
Gregory E. Brill ◽  
Valery V. Tuchin ◽  
Sergey S. Ulyanov ◽  
Ekateryna I. Galanzha
Keyword(s):  
Laser Beam ◽  
Lymph Flow ◽  
Flow Measurements ◽  
Diffraction Phenomenon ◽  
Beam Diffraction

SHORT-RANGE ORDER OF DISORDERED SOLID SURFACES FROM ELASTICALLY SCATTERED ELECTRON SPECTRA

1997 ◽  
Vol 04 (05) ◽  
pp. 965-967 ◽  
Author(s):  
O. BONDARCHUCK ◽  
S. GOYSA ◽  
I. KOVAL ◽  
P. MEL'NIK ◽  
M. NAKHODKIN
Keyword(s):  
Electron Spectroscopy ◽  
Short Range ◽  
Short Range Order ◽  
Range Order ◽  
Solid Surfaces ◽  
Parameter Determination ◽  
Spectroscopy Technique ◽  
Scattered Electron ◽  
Electron Spectra ◽  
Diffraction Phenomenon

The diffraction phenomenon of low- and middle-energy electrons for disordered solid surfaces was experimentally studied and a new electron spectroscopy technique for surface short-range order parameter determination proposed.

scholarly journals Microstrip circuit analog of a complex diffraction phenomenon

2009 ◽  
Vol 95 (2) ◽  
pp. 021108 ◽  
Author(s):  
A. Fernández-Prieto ◽  
F. Medina ◽  
F. Mesa
Keyword(s):  
Diffraction Phenomenon ◽  
Microstrip Circuit

Diffractographic Techniques for Vibration Measurement

1974 ◽  
Vol 96 (2) ◽  
pp. 553-556 ◽  
Author(s):  
W. J. Pastorius ◽  
T. R. Pryor
Keyword(s):  
Measurement Technique ◽  
Reference Point ◽  
Vibration Measurement ◽  
Coordinate Direction ◽  
Diffraction Phenomenon

The single slit diffraction phenomenon is shown to be useful as a noncontacting vibration measurement technique. The diffracting slit is formed between the vibrating object and stationary reference point. Little or no mass need be added to the object. Several readout techniques are described as well as a method for determining vibratory data along a line, in which case vibratory amplitude may be determined at all points in one coordinate direction.

scholarly journals KAJIAN DISTRIBUSI INTENSITAS CAHAYA PADA FENOMENA DIFRAKSI CELAH TUNGGAL DENGAN METODE BAGI DUA DAN METODE NEWTON RAPHSON

2019 ◽  
Vol 4 (2) ◽  
pp. 56-69
Author(s):  
Richard Umbu Datangeji ◽  
Ali Warsito ◽  
Hadi Imam Sutaji ◽  
Laura A. S. Lapono
Keyword(s):  
Light Intensity ◽  
Light Diffraction ◽  
Bisection Method ◽  
Light Intensity Distribution ◽  
Bright Band ◽  
Diffraction Phenomenon ◽  
Left And Right ◽  
Newton Raphson ◽  
Two Peaks ◽  
Raphson Method

Abstrak  Telah dilakukan penelitian tentang distribusi intensitas cahaya pada fenomena difraksi celah tunggal dengan tujuan menerapkan metode Bagi Dua dan metode Newton Raphson untuk memperoleh solusi jarak antara dua titik intensitas dalam fenomena difraksi celah tunggal, menetukan jarak antara dua intensitas pada pita terang, memperoleh grafik distribusi intensitas cahaya terhadap jarak pada kasus difraksi cahaya Franhoufer celah tunggal, serta membandingkan kekonvergenan metode Bagi Dua dan metode Newton Raphson. Solusi jarak antara dua intensitas pada pita terang pada kasus difraksi cahaya Franhoufer celah tunggal diperoleh dengan mencari akar-akar persamaan intensitas cahayanya. Hasil penelitian menunjukan jarak yang semakin besar ketika intensitasnya makin kecil. Ada tiga puncak intensitas, yang pertama puncak untuk intensitas maksimum pada terang pusat yang berada pada jarak 0 cm dan dua puncak untuk terang pertama setelah terang pusat yang mana intensitasnya tinggal 0.05I0 dan berada pada jarak 0.154875 cm sebelah kiri dan sebelah kanan dari intensitas maksimum. Grafik antara jarak dengan perbandingan intensitas terhadap terang maksimum berbentuk sinusoidal, terdapat tiga puncak intensitas. Puncak pertama menunjukan intensitas maksimum yang terdapat pada pita terang pusat dan dua puncak dengan intensitas 0.05I0  yang berada pita terang pertama. Pada kasus ini diperoleh hasil bahwa metode Newton Raphson lebih cepat konvergen dari metode Bagi Dua karena hanya memerlukan 4 iterasi untuk memperoleh solusi, sedangkan metode Bagi Dua membutuhkan 20 iterasi. Metode Newton Raphson juga memiliki nilai error pendekatan lebih kecil dari metode Bagi Dua yaitu 6.43929 x 10-13 sampai 7.52642 x 10-7 sedangkan metode Bagi Dua 1.90735 x 10-6. Abstract  Research on the distribution of light intensity in the phenomenon of single slit diffraction has been carried out with the aim of applying the Bisection method and the Newton Raphson method to obtain a solution between two points in a single slit diffraction phenomenon, determining the distance between two point of intensity in the bright band, obtaining a graph of the light intensity distribution to distance in the case of Franhoufer single slit light diffraction, and comparing the speed of convergence of the Bisection method and the Newton Raphson method. The solution of the distance between two intensities in the bright band in the case of Franhoufer light diffraction in a single slit obtained by looking for the roots of the light intensity equation. The results of the study show that the greater the distance when then intensity gets smaller. There are three peak intensities, the first peak for the highest intensity in the central bright band which is located at a distance of 0 cm and two peaks in the first bright with the intensity is 0.05I0 and is 0.154875 cm left and right of the maximum intensity. The graph between the distance and intensity ratio is sinusoidal, which is three peak intensities. The first peak shows the highest intensity in the central bright band and the two peaks with the intensity of 0.05I0 which is the first bright band. In this case the results of the Newton Raphson method are converged faster than the method of Bisection because it only requires 4 iterations to obtain a solution, while the Bisection method requires 20 iterations. The Newton Raphson method also has a smaller error value than the Bisection method, which is 6.43929 x 10-13 to 7.52642 x 10-6 when the Bisection method is 1.90735 x 10-6.

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