- Characterization of Safe Nanostructured Polymeric Materials

2013 ◽  
pp. 102-133 ◽  
Keyword(s):  
Polymeric Materials

Characterization of viscoelastic properties of polymeric materials through nanoindentation

2005 ◽  
Vol 45 (2) ◽  
pp. 130-136 ◽  
Author(s):  
G. M. Odegard ◽  
T. S. Gates ◽  
H. M. Herring
Keyword(s):  
Viscoelastic Properties ◽  
Polymeric Materials

scholarly journals Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1142 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemi ◽  
Pascal Carriere ◽  
Sonil Nanda ◽  
Aymen Amine Assadi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Characterization ◽  
Super Resolution ◽  
Polymeric Materials ◽  
Polymer Materials ◽  
Polymer Science ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

scholarly journals Waste Electrical and Electronic Equipment: A Review on the Identification Methods for Polymeric Materials

Recycling ◽  
2019 ◽  
Vol 4 (3) ◽  
pp. 32 ◽  
Author(s):  
Grigorescu ◽  
Grigore ◽  
Iancu ◽  
Ghioca ◽  
Ion
Keyword(s):  
Polymeric Materials ◽  
Industrial Applications ◽  
Complete Characterization ◽  
Electronic Equipment ◽  
Raw Material ◽  
Identification Methods ◽  
Material Resources ◽  
Characteristic Values ◽  
Materials Used

Considering that the large quantity of waste electrical and electronic equipment plastics generated annually causes increasing environmental concerns for their recycling and also for preserving of raw material resources, decreasing of energy consumption, or saving the virgin materials used, the present challenge is considered to be the recovery of individual polymers from waste electrical and electronic equipment. This study aims to provide an update of the main identification methods of waste electrical and electronic equipment such as spectroscopic fingerprinting, thermal study, and sample techniques (like identification code and burning test), and the characteristic values in the case of the different analyses of the polymers commonly used in electrical and electronic equipment. Additionally, the quality of the identification is very important, as, depending on this, new materials with suitable properties can be obtained to be used in different industrial applications. The latest research in the field demonstrated that a complete characterization of individual WEEE (Waste Electric and Electronic Equipment) components is important to obtain information on the chemical and physical properties compared to the original polymers and their compounds. The future directions are heading towards reducing the costs by recycling single polymer plastic waste fractions that can replace virgin plastic at a ratio of almost 1:1.

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