To: “High‐resolution common‐depth‐point reflection profiling: Field acquisition parameter design,” by R. W. Knapp and D. W. Steeples, which appeared in February 1986, GEOPHYSICS, p. 283–294
The following errors have been detected. p. 288, left column, 3rd paragraph: Change (Figure 4, Knapp and Steeples, 1986, this issue) to (Figure 3, Knapp and Steeples, 1986, this issue). p. 288, right column, 3rd complete paragraph, 3rd sentence: Change “…when the length of the array is equal to about one‐fourth the apparent surface wavelength…” to “…when the length of the array is equal to about one‐half the apparent surface wavelength…”. Next line, change “ [Formula: see text]” to “[Formula: see text]”. Next line, change “[Formula: see text].” to “[Formula: see text]”. Next line, change “one‐fourth” to “one‐half”. Next 2 equations, change “L ⩽ .25…” to “L ⩽ .5…” and [Formula: see text]…” to “[Formula: see text]…”. p. 289, left column: Change [Formula: see text] to [Formula: see text] Following paragraph, 4th line: Change “.75 m.” to “1.4 m.”; and change “When the maximum frequency value approaches and exceeds 100 Hz (apparent frequency equal to about 70 Hz),…” to “When the maximum frequency value approaches and exceeds 200 Hz (apparent frequency equal to about 140 Hz),…”.