On: “High‐resolution common‐depth point profiling: Field acquisition parameter design,” by R. Knapp and D. Steeples (GEOPHYSICS, 51, 283–294, February, 1986).
I have read your article with interest and congratulate you on an excellent overview of this topic. There are a couple of points on which I would like to comment, however.
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1967 ◽
Vol 31
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pp. 45-46
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1994 ◽
Vol 144
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pp. 593-596
1994 ◽
Vol 144
◽
pp. 541-547
1970 ◽
Vol 28
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pp. 260-261
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