Trace element and isotope analysis using Secondary Ion Mass Spectrometry

2017 ◽  
pp. 131-164
Author(s):  
E. Deloule ◽  
N. Valle
Keyword(s):  
Mass Spectrometry ◽  
Trace Element ◽  
Secondary Ion Mass Spectrometry ◽  
Isotope Analysis ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Oxygen isotope analysis of fossil organic matter by secondary ion mass spectrometry

2016 ◽  
Vol 182 ◽  
pp. 24-39 ◽  
Author(s):  
Romain Tartèse ◽  
Marc Chaussidon ◽  
Andrey Gurenko ◽  
Frédéric Delarue ◽  
François Robert
Keyword(s):  
Mass Spectrometry ◽  
Organic Matter ◽  
Oxygen Isotope ◽  
Secondary Ion Mass Spectrometry ◽  
Isotope Analysis ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Quantitative Analysis of Microstructures by Secondary Ion Mass Spectrometry

2006 ◽  
Vol 12 (4) ◽  
pp. 352-355 ◽  
Author(s):  
Douglas Phinney
Keyword(s):  
Mass Spectrometry ◽  
Quantitative Analysis ◽  
Trace Element ◽  
Secondary Ion Mass Spectrometry ◽  
Homogeneous Distribution ◽  
Know How ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Ion Implanted

The focus of this review is on trace-element quantitation of microstructures in solids. This review is aimed at the nonspecialist who wants to know how secondary ion mass spectrometry (SIMS) quantitation is achieved. Despite 35 years of SIMS research and applications, SIMS quantitation remains a fundamentally empirical enterprise and is based on standards. The most used standards are “bulk standards”—solids with a homogeneous distribution of a trace element—and ion-implanted solids. The SIMS systematics of bulk standards and ion-implanted solids are reviewed.

scholarly journals SIMS Lab Potsdam: Secondary Ion Mass Spectrometry Laboratory Potsdam

2016 ◽  
Vol 2 ◽  
Author(s):  
Michael Wiedenbeck ◽  
Alexander Rocholl ◽  
Robert Trumbull ◽  
Frédéric Couffignal
Keyword(s):  
Mass Spectrometry ◽  
Trace Element ◽  
Isotope Ratio ◽  
Secondary Ion Mass Spectrometry ◽  
Research Centre ◽  
Ratio Data ◽  
German Research ◽  
Ion Mass Spectrometry ◽  
User Facility ◽  
Secondary Ion

Secondary Ion Mass Spectrometry (SIMS) is among the most powerful laboratory tools available to the analytical geochemist. Its strength lies in SIMS’ ability to produce high precision trace element and isotope ratio data on sample masses as small as 100 picograms. The Helmholtz-Centre Potsdam GFZ German Research Centre for Geosciences operates a fully equipped, large geometry SIMS instrument, which is supported by a comprehensive spectrum of peripheral instrumentation. This facility operates as an open user facility which supports the needs of the global geochemical community.

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