Effect of Thickness on Structural, Optical and Electrical Properties of In2S3 Thin Films Grown by Thermal Evaporation for Solar Cell Buffer Layer Applications

2015 ◽  
Vol 4 (3) ◽  
pp. 184-188 ◽  
Author(s):  
Subhash Chander ◽  
S. Choudhary ◽  
A. Purohit ◽  
Nisha Kumari ◽  
S. P. Nehra ◽  
...  
Keyword(s):  
Thin Films ◽  
Solar Cell ◽  
Electrical Properties ◽  
Buffer Layer ◽  
Thermal Evaporation ◽  
Optical And Electrical Properties

STRUCTURAL, OPTICAL AND ELECTRICAL PROPERTIES OF Al-DOPED ZnO TRANSPARENT CONDUCTING OXIDE FOR SOLAR CELL APPLICATIONS

2011 ◽  
Vol 04 (04) ◽  
pp. 401-405 ◽  
Author(s):  
W. CHER ◽  
S. YICK ◽  
S. XU ◽  
Z. J. HAN ◽  
K. OSTRIKOV
Keyword(s):  
Thin Films ◽  
Solar Cell ◽  
Electrical Properties ◽  
Transparent Conducting Oxide ◽  
Optical Transmittance ◽  
Nitrogen Atmosphere ◽  
Optical And Electrical Properties ◽  
Glass Substrates ◽  
Optimal Annealing Temperature ◽  
Post Synthesis

Al -doped zinc oxide (AZO) thin films are deposited onto glass substrates using radio-frequency reactive magnetron sputtering and the improvements in their physical properties by post-synthesis thermal treatment are reported. X-ray diffraction spectra show that the structure of films can be controlled by adjusting the annealing temperatures, with the best crystallinity obtained at 400°C under a nitrogen atmosphere. These films exhibit improved quality and better optical transmittance as indicated by the UV-Vis spectra. Furthermore, the sheet resistivity is found to decrease from 1.87 × 10-3 to 5.63 × 10-4Ω⋅cm and the carrier mobility increases from 6.47 to 13.43 cm2 ⋅ V-1 ⋅ s-1 at the optimal annealing temperature. Our results demonstrate a simple yet effective way in controlling the structural, optical and electrical properties of AZO thin films, which is important for solar cell applications.

scholarly journals Structural, optical and electrical characterizations of ZnO/PS

2018 ◽  
Vol 191 ◽  
pp. 00013
Author(s):  
Zineb Yamlahi Alami ◽  
Moez Salem ◽  
Mounir Gaidi ◽  
Jamal El khamkhami
Keyword(s):  
Thin Films ◽  
Solar Cell ◽  
Electrical Properties ◽  
Solar Irradiance ◽  
Spray Pyrolysis Technique ◽  
Hexagonal Wurtzite Structure ◽  
Zinc Nitrate ◽  
Optical And Electrical Properties ◽  
Electrical Characterizations ◽  
The Impact

This work reported on solar cell ZnO/PS heterojunction fabricated from Zinc nitrate with molar concentrations 0.05M and 0.2M using spray pyrolysis technique, to study the effect of high and low molar concentration of Zn precursor on structural, optical and electrical properties. The structural analyse showed that the obtained thin films deposited on glass substrate were polycrystalline with a hexagonal wurtzite structure and preferentially oriented along the c-axis direction, while structural properties enhanced with higher morality 0.2M. Roughness surface of ZnO/PS HJ increased widely with higher morality. Through I-V characteristics, the enhancement of electrical properties with higher molarity has been achieved. Isc get augment from 23mA/cm2, to 27mA/cm2, and Voc from 551mV to 554mV when molarity has taken values 0.05M and 0.2M respectively. Ideality factor has influenced by molarity variance too. The impact of solar irradiance G and temperature T on solar cell fabricated from 0.2M molarity has been investigated. The current density increased from 13.53 mA/cm2 to 27mA/cm2, the voltage from 525mV to 546mV, and the efficiency from 5.2% to 10.9% when the solar irradiance have increased from 500 to 1000W/m2. The temperature also influences on the solar cell behaviours, especially the voltage is enhanced by temperature increasing.

scholarly journals Optical and Electrical Properties of Ag-Doped In2S3Thin Films Prepared by Thermal Evaporation

2014 ◽  
Vol 2014 ◽  
pp. 1-4 ◽  
Author(s):  
Peijie Lin ◽  
Sile Lin ◽  
Shuying Cheng ◽  
Jing Ma ◽  
Yunfeng Lai ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Thermal Evaporation ◽  
Xrd Analysis ◽  
Optical And Electrical Properties ◽  
X Ray Diffraction ◽  
Thermal Evaporation Method ◽  
X Ray ◽  
Glass Substrates ◽  
Hall Measurement System

Ag-doped In2S3(In2S3:Ag) thin films have been deposited onto glass substrates by a thermal evaporation method. Ag concentration is varied from 0 at.% to 4.78 at.%. The structural, optical, and electrical properties are characterized using X-ray diffraction (XRD), spectrophotometer, and Hall measurement system, respectively. The XRD analysis confirms the existence of In2S3and AgIn5S8phases. With the increase of the Ag concentration, the band gap of the films is decreased gradually from 2.82 eV to 2.69 eV and the resistivity drastically is decreased from ~103to5.478×10-2 Ω·cm.

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