Structural Characterization of Zinc-Tin-Oxide Films Deposited on Quartz Substrates by Radio Frequency Magnetron Sputtering

2016 ◽  
Vol 16 (10) ◽  
pp. 10356-10360 ◽  
Author(s):  
Nark-Eon Sung ◽  
Keun Hwa Chae ◽  
Ik-Jae Lee
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