Magnetic, Magneto-optic and Magnetotransport Properties of Nanocrystalline Co/Au Multilayers with Ultrathin Au Interlayers

2008 ◽  
Vol 8 (9) ◽  
pp. 4323-4328 ◽  
Author(s):  
E. Th. Papaioannou ◽  
V. Karoutsos ◽  
M. Angelakeris ◽  
O. Valassiades ◽  
P. Fumagalli ◽  
...  
Keyword(s):  
Multilayered Structure ◽  
Electron Beam Evaporation ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Stripe Domain ◽  
Kerr Rotation ◽  
Force Microscopy ◽  
Domain Structures ◽  
Face Centered ◽  
Magneto Optic

A series of nanocrystalline Co/Au multilayers with ultrathin Au interlayers was grown at room temperature by electron beam evaporation on Si(111), glass and polyimide substrates. X-ray diffraction measurements reveal a face centered cubic multilayered structure with very small nanograins within 7–10 nm in diameter. Magneto-optic polar Kerr effect experiments show an enhancement of the Kerr rotation around 3 eV as the Au interlayer thickness increases. The experimental data are interpreted with the help of simulated Kerr spectra. The magnetization curves and magnetic force microscopy images indicate the existence of perpendicularly magnetized stripe-domain structures at remanence. The magnitude of the magnetoresistance ratio reaches values of 0.4%. The investigation of the interplay between magnetic and magnetotransport properties demonstrates the contribution of the domain-wall spin-dependent scattering to the magnetoresistance.

Structural, Magnetic, and Magneto-Optical Properties of Nanocrystalline Face Centered Cubic Co70Cr30/Pt Multilayers with Perpendicular Magnetic Anisotropy

2007 ◽  
Vol 7 (12) ◽  
pp. 4278-4284 ◽  
Author(s):  
E. Th. Papaioannou ◽  
M. Angelakeris ◽  
P. Poulopoulos ◽  
I. Tsiaoussis ◽  
C. Rüdt ◽  
...  
Keyword(s):  
Magnetic Anisotropy ◽  
Hysteresis Loops ◽  
Perpendicular Magnetic Anisotropy ◽  
Multilayered Structure ◽  
Ultraviolet Region ◽  
Temperature Hysteresis ◽  
Face Centered Cubic ◽  
Geometry Configuration ◽  
Face Centered ◽  
Magneto Optic

Co70Cr30 alloyed layers are combined with extremely thin Pt layers in order to produce novel face-centered-cubic multilayered films to be considered as a potential perpendicular magnetic recording medium. The films were grown on Si, glass and polyimide substrates by e-beam evaporation at a temperature slightly higher than room temperature. The multilayered structure of the films was verified by X-ray diffraction experiments. Plane-view transmission electron microscopy images have revealed the formation of very small grains in the range of 7–9 nm. Hysteresis loops as a function of temperature were recorded via the magneto-optic Kerr effect in the polar geometry configuration. The system exhibits perpendicular magnetic anisotropy, which enhances with decreasing temperature. Hysteresis loops with a squareness of 1 and a coercivity of 1.45 kOe were obtained at 10 K. Furthermore, complete magneto-optic spectra of the films are recorded, showing a strong magneto-optic enhancement in the ultraviolet region at around 4.5 eV.

Magnetic Force Microscopy on Co/Pt Multilayers

2009 ◽  
Vol 152-153 ◽  
pp. 241-244
Author(s):  
V. Karoutsos ◽  
Panagiotis Poulopoulos ◽  
M. Angelakeris ◽  
E.T. Papaioannou ◽  
Paul Fumagalli ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Domain ◽  
Hysteresis Loops ◽  
Electron Beam Evaporation ◽  
Film Plane ◽  
X Ray Diffraction ◽  
Saturation Field ◽  
Force Microscopy ◽  
Magneto Optic

Co/Pt multilayers reside among the best candidates for perpendicular magneto-optic recording. In this work, Co/Pt multilayers were prepared by electron-beam evaporation under ultrahigh vacuum conditions on polyimide. X-ray diffraction measurements revealed the high quality of multilayer stacking. Magneto-optic polar Kerr effect experiments were used in order to obtain magnetization hysteresis loops of the films. We have studied the magnetic-domain morphology on the surface of the films via Magnetic Force Microscopy. The field applied during these measurements was 2.3 kOe oriented perpendicular to the film plane; this field seems to stabilize and enhance out-of-plain stripe domains against in plain domains that may be expected from magnetization curves. Finally, we observed that when the applied field approaches the magnetic saturation field, then the domain morphology turns to be dominated by bubble domains.

scholarly journals Microstructure and Properties of TiSiN/AlN with Different Modulation Periods

2019 ◽  
Vol 2019 ◽  
pp. 1-7
Author(s):  
Hongjuan Yan ◽  
Qinye Tian ◽  
Fengbin Liu ◽  
Lina Si ◽  
Zhaoliang Dou ◽  
...  
Keyword(s):  
Growth Direction ◽  
304 Stainless Steel ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Microstructure And Properties ◽  
Atomic Force ◽  
Tension And Compression ◽  
Diffraction Peaks ◽  
Face Centered

TiSiN/AlN nanomultilayers with different thicknesses of AlN layer were deposited on 304 stainless steel by magnetron sputtering system. X-ray diffraction, nanoindentation tester, atomic force microscopy, and friction wear tester were used to characterize microstructure and properties of TiSiN/AlN nanomultilayers. The results show that TiSiN/AlN nanomultilayers are face-centered cubic structures and exhibit a strong preferred orientation on (200) plane. The diffraction peaks of TiSIN/AlN nanomultilayer shift to a small angle. When the thickness of the AlN layer is 2 nm, the peak is highest, and the shift degree is biggest. The alternating tension and compression stress fields are formed along the growth direction of TiSiN/AlN nanomultilayers and increase the strength of the namomultilayers. When the thickness of the AlN layer is 2 nm, the maximum hardness and Young’s modulus of TiSiN/AlN nanomultilayers are, respectively, 32.8 GPa and 472 GPa, and the smallest roughness is 33.4 nm. But the friction coefficient is smallest when the thickness of the AlN layer is 1.5 nm.

Microstructure of Electro-Eroded Cemented Carbide Surfaces

1968 ◽  
Vol 26 ◽  
pp. 284-285
Author(s):  
V. N. Filimonenko ◽  
M. H. Richman ◽  
J. Gurland
Keyword(s):  
Surface Layer ◽  
Cobalt Content ◽  
Cemented Carbides ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Metallographic Examination ◽  
Standard Procedures ◽  
Face Centered ◽  
Diamond Paste ◽  
Plastic Carbon

The high temperatures and pressures that are found in a spark gap during electrical discharging lead to a sharp phase transition and structural transformation in the surface layer of cemented carbides containing WC and cobalt. By means of X-ray diffraction both W2C and a high-temperature monocarbide of tungsten (face-centered cubic) were detected after electro-erosion. The W2C forms as a result of the peritectic reaction, WC → W2C+C. The existence and amount of the phases depend on both the energy of the electro-spark discharge and the cobalt content. In the case of a low-energy discharge (i.e. C=0.01μF, V = 300v), WC(f.c.c.) is generally formed in the surface layer. However, at high energies, (e.g. C=30μF, V = 300v), W2C is formed at the surface in preference to the monocarbide. The phase transformations in the surface layer are retarded by the presence of larger percentages of cobalt.Metallographic examination of the electro-eroded surfaces of cemented carbides was carried out on samples with 5-30% cobalt content. The specimens were first metallographically polished using diamond paste and standard procedures and then subjected to various electrical discharges on a Servomet spark machining device. The samples were then repolished and etched in a 3% NH4OH electrolyte at -0.5 amp/cm2. Two stage plastic-carbon replicas were then made and shadowed with chromium at 27°.

Stacking Faults in a High Nitrogen Face-Centered-Cubic Phase Formed on Nitrogen-Modified Austenitic Stainless Steel

2008 ◽  
Vol 373-374 ◽  
pp. 318-321
Author(s):  
J. Liang ◽  
M.K. Lei
Keyword(s):  
Stainless Steel ◽  
Plasma Source ◽  
Peak Shift ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
High Nitrogen ◽  
X Ray ◽  
Peak Asymmetry ◽  
Face Centered

Effects of stacking faults in a high nitrogen face-centered-cubic phase (γΝ) formed on plasma source ion nitrided 1Cr18Ni9Ti (18-8 type) austenitic stainless steel on peak shift and peak asymmetry of x-ray diffraction were investigated based on Warren’s theory and Wagner’s method, respectively. The peak shift from peak position of the γΝ phase is ascribed to the deformation faults density α, while the peak asymmetry of the γΝ phase is characterized by deviation of the center of gravity of a peak from the peak maximum (Δ C.G.) due to the twin faults density β. The calculated peak positions of x-ray diffraction patterns are consistent with that measured for plasma source ion nitrided 1Cr18Ni9Ti stainless steel.

Interface structure of face-centered-cubic-Ti thin film grown on 6H–SiC substrate

2000 ◽  
Vol 15 (10) ◽  
pp. 2121-2124 ◽  
Author(s):  
Y. Sugawara ◽  
N. Shibata ◽  
S. Hara ◽  
Y. Ikuhara
Keyword(s):  
Thin Film ◽  
Orientation Relationship ◽  
High Resolution Electron Microscopy ◽  
Electron Beam Evaporation ◽  
Face Centered Cubic ◽  
High Adhesion ◽  
Resolution Electron ◽  
Face Centered ◽  
Relationship Of ◽  
High Degree

A titanium thin film was deposited on the flat (0001) face of a 6H–SiC by electron beam evaporation at room temperature in a vacuum of 5.1 × 10−8 Pa. The Ti film was epitaxially grown on the surface, and the interface between Ti and SiC was characterized by high-resolution electron microscopy. It was found that the structure of the deposited titanium is face-centered cubic (fcc), although bulk titanium metal usually has a hexagonal close-packed or body-centered cubic crystal structure. We believe that the unusual fcc structure of Ti thin film is due to the high adhesion of the film to the substrate and the high degree of coherency between them. The orientation relationship of the fcc-Ti/6H–SiC interface was (111)fcc-Ti//(0001)6H–SiC and [110]fcc-Ti//[1120]6H−SiC. Preliminary calculations indicate that this orientation relationship maximizes the lattice coherency across the interface.

Magnetic and magneto‐optic properties of thick face‐centered‐cubic Co single‐crystal films

1994 ◽  
Vol 64 (20) ◽  
pp. 2736-2738 ◽  
Author(s):  
T. Suzuki ◽  
D. Weller ◽  
C.‐A. Chang ◽  
R. Savoy ◽  
T. Huang ◽  
...  
Keyword(s):  
Single Crystal ◽  
Face Centered Cubic ◽  
Single Crystal Films ◽  
Crystal Films ◽  
Face Centered ◽  
Magneto Optic

scholarly journals Characterization of Cobalt Sulfide Thin Films Synthesized from Acidic Chemical Baths

2020 ◽  
Vol 2020 ◽  
pp. 1-9
Author(s):  
Tizazu Abza ◽  
Dereje Gelanu Dadi ◽  
Fekadu Gashaw Hone ◽  
Tesfaye Chebelew Meharu ◽  
Gebremeskel Tekle ◽  
...  
Keyword(s):  
Thin Films ◽  
Crystallite Size ◽  
Deposition Time ◽  
Average Crystallite Size ◽  
Cobalt Sulfide ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Electron Microscopic ◽  
Face Centered

Cobalt sulfide thin films were synthesized from acidic chemical baths by varying the deposition time. The powder X-ray diffraction studies indicated that there are hexagonal CoS, face-centered cubic Co3S4, and cubic Co9S8 phases of cobalt sulfide. The crystallite size of the hexagonal CoS phase decreased from 52.8 nm to 22.5 nm and that of the cubic Co9S8 phase increased from 11 nm to 60 nm as the deposition time increased from 2 hrs to 3.5 hrs. The scanning electron microscopic images revealed crack and pinhole free thin films with uniform and smooth background and few large polygonal grains on the surface. The band gap of the cobalt sulfide thin films decreased from 1.75 eV to 1.3 eV as the deposition time increased from 2 hrs to 3.5 hrs. The photoluminescence (PL) spectra of the films confirmed the emission of ultraviolet, violet, and blue lights. The intense PL emission of violet light at 384 nm had red shifted with increasing deposition time that could be resulted from the increase in the average crystallite size. The FTIR spectra of the films indicated the presence of OH, C-O-H, C-O, double sulfide, and Co-S groups. As the deposition time increased, the electrical resistivity of the cobalt sulfide thin films decreased due to the increase in both the crystallite size and the films’ thickness.

Theoretical and experimental study of the gradient properties and the resulting local crystalline structure and orientation in magnetron-sputtered CrAlN coatings with lateral composition and thickness gradient

2017 ◽  
Vol 50 (4) ◽  
pp. 1000-1010
Author(s):  
Bärbel Krause ◽  
Michael Stüber ◽  
Anna Zimina ◽  
Ralph Steininger ◽  
Mareike Trappen ◽  
...  
Keyword(s):  
Target Surface ◽  
Sample Surface ◽  
Composition Gradient ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Al Content ◽  
Spatially Resolved ◽  
Composition Profiles ◽  
Face Centered

Cr–Al–N coatings with a lateral composition gradient were deposited from two segmented Cr/Al targets with different segment size, thus covering the Al content range 0.22 ≲ c ≲ 0.87 and a thickness range from several hundred nanometres to several micrometres. The two-dimensional thickness and composition profiles were determined nondestructively from X-ray fluorescence maps. The results were reproduced by simulations of the flux distribution on the sample surface, combiningTRIDYNsimulations of the reactive sputter process at the target surface andSIMTRAsimulations of the subsequent transport through the gas phase. The phase formation was studied by spatially resolved X-ray diffraction and X-ray absorption spectroscopy at the Cr Kedge. Forc ≲ 0.69, a single-phase solid solution face-centered cubic (f.c.c.) (Cr,Al)N phase was found, and for 0.69 ≲ c ≲ 0.87 coexisting f.c.c. (Cr,Al)N and hexagonal close packed (h.c.p.) (Cr,Al)N phases were observed. The biaxial texture formation in nearly the entire composition range indicates a zone T growth. Four, mainly composition-dependent, texture regions were identified. All observed textures are closely related to textures reported for the h.c.p. AlN and f.c.c. CrN parent phases. Forc ≳ 0.69, a strong thickness dependence of the textures was observed. The measurements reveal an orientation relation between different f.c.c. and h.c.p. textures, indicating that local epitaxy might play a role in the structure formation.

Thermal Stability and Failure Mechanisms of Au/Tiw(N)/Si and Au/TiW(N)/Si02/Si Systems

1996 ◽  
Vol 427 ◽  
Author(s):  
C. R. Chen ◽  
L. J. Chen
Keyword(s):  
Thermal Stability ◽  
Failure Mechanisms ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Transmission Electron ◽  
Single Face ◽  
Face Centered ◽  
The Stability ◽  
Ar Gas

AbstractThermal stability and failure mechanisms of Au/TiW(N)/Si and Au/TiW(N)/SiO2/Si systems have been studied by both conventional and high-resolution transmission electron microscopy, X- ray diffraction and Auger electron spectroscopy. For films deposited in Ar gas containing 20% N2, a single face-centered-cubic phase was the only crystalline phase detected to form. The samples were found to remain stable after annealing at 700 °C for 30 min. The stability temperature for Au/TiW(N)(Ar:N2=80:20)/SiO2/Si samples was found to be higher than those of Au/TiW(N) (Ar:N2=90:10)/SiO2/Si and Au/TiW/SiO2/Si samples.

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