scholarly journals Measuring Cell Adhesion Forces with the Atomic Force Microscope at the Molecular Level

2002 ◽  
Vol 172 (3) ◽  
pp. 174-189 ◽  
Author(s):  
Martin Benoit ◽  
Hermann E. Gaub
2000 ◽  
Vol 40 (supplement) ◽  
pp. S80
Author(s):  
H. Kim ◽  
T. Osada ◽  
A. Ikai

NANO ◽  
2015 ◽  
Vol 10 (03) ◽  
pp. 1550038 ◽  
Author(s):  
Yan Jiang ◽  
Lili Yue ◽  
Boshen Yan ◽  
Xi Liu ◽  
Xiaofei Yang ◽  
...  

We investigated friction on an n-type silicon surface using an atomic force microscope when a bias voltage was applied to the sample. Friction forces on the same track line were measured before and after the bias voltages were applied and it was found that the friction forces in n-type silicon can be tuned reversibly with the bias voltage. The dependence of adhesion forces between the silicon nitride tip and Si sample on the bias voltages approximately follows a parabolic law due to electrostatic force, which results in a significant increase in the friction force at an applied electric field.


1995 ◽  
Author(s):  
Manfred Radmacher ◽  
Monika Fritz ◽  
Miriam W. Allersma ◽  
Christoph F. Schmidt ◽  
Paul K. Hansma

Langmuir ◽  
1994 ◽  
Vol 10 (10) ◽  
pp. 3809-3814 ◽  
Author(s):  
M. Radmacher ◽  
M. Fritz ◽  
J. P. Cleveland ◽  
D. A. Walters ◽  
P. K. Hansma

2015 ◽  
Vol 6 (31) ◽  
pp. 5740-5751 ◽  
Author(s):  
Cesar Rodriguez-Emmenegger ◽  
Sébastien Janel ◽  
Andres de los Santos Pereira ◽  
Michael Bruns ◽  
Frank Lafont

The adhesion forces between a single bacterial cell and different polymer brushes were measured directly with an atomic force microscope and correlated with their resistance to fouling.


FEBS Letters ◽  
2003 ◽  
Vol 552 (2-3) ◽  
pp. 155-159 ◽  
Author(s):  
Ricardo de Souza Pereira ◽  
Maria Ivonete Nogueira da Silva ◽  
Mônica Alonso Cotta

2017 ◽  
Vol 15 (1) ◽  
Author(s):  
Fang Yang ◽  
René Riedel ◽  
Pablo del Pino ◽  
Beatriz Pelaz ◽  
Alaa Hassan Said ◽  
...  

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