scholarly journals Influence of Evaporation-Deposition Geometry on Conductive Thin Films

1980 ◽  
Vol 7 (1-3) ◽  
pp. 171-179
Author(s):  
J. Griessing

There is a striking dependence of the evaporation deposition geometry (i.e. angular distribution of the incident vapor beam) on the properties of deposited conductive films. This paper discusses solderability, adhesion and long-term stability of adhesion of Ti-Pd-Au, Ti-Au and Ti-Cu films. In all cases the above properties were improved by an evaporation deposition geometry with steep angles of the incident vapor beam.

RSC Advances ◽  
2018 ◽  
Vol 8 (37) ◽  
pp. 20990-20995 ◽  
Author(s):  
Xiang Yang ◽  
Shu Jiang ◽  
Jun Li ◽  
Jian-Hua Zhang ◽  
Xi-Feng Li

In this paper, W-doped ZnSnO (WZTO) thin films and TFT devices are successfully fabricated by a wet-solution technique.


1998 ◽  
Vol 507 ◽  
Author(s):  
I. Popov ◽  
G. Van Doorselaer ◽  
A. Van Calster ◽  
H. De Smet ◽  
E. Boesman ◽  
...  

ABSTRACTThe possibility of creating an 2D X-ray sensor array on the base of a-SiN:H thin films without switching elements and an X-ray conversion layer is presented in this report. The behavior of a-SiN:H Thin-Film Diode under X-ray irradiation, its limitations, and ways of increasing long-term stability and sensitivity of the sensor are discussed.


2011 ◽  
Vol 18 (7-8) ◽  
pp. 879-884 ◽  
Author(s):  
A. Bittner ◽  
N. Pagel ◽  
H. Seidel ◽  
U. Schmid

2015 ◽  
Vol 228 ◽  
pp. 112-117 ◽  
Author(s):  
V. Stankevič ◽  
Č. Šimkevičius ◽  
S. Keršulis ◽  
S. Balevičius ◽  
N. Žurauskienė ◽  
...  

2018 ◽  
Vol 122 (49) ◽  
pp. 28151-28157 ◽  
Author(s):  
Stephanie L. Moffitt ◽  
D. Bruce Buchholz ◽  
Robert P. H. Chang ◽  
Thomas O. Mason ◽  
Tobin J. Marks ◽  
...  

2012 ◽  
Vol 18 (S2) ◽  
pp. 488-489 ◽  
Author(s):  
S.H. Irsen ◽  
J. Lenz ◽  
S. Patai ◽  
P. Kurth

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.


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