scholarly journals Surface Photovoltage Spectroscopy and AFM Analysis of CIGSe Thin Film Solar Cells

2015 ◽  
Vol 2015 ◽  
pp. 1-5 ◽  
Author(s):  
Nima E. Gorji ◽  
Ugo Reggiani ◽  
Leonardo Sandrolini
Keyword(s):  
Thin Film ◽  
Band Gap ◽  
Surface Photovoltage ◽  
Force Microscopy ◽  
Surface Photovoltage Spectroscopy ◽  
Grain Sizes ◽  
Atomic Force ◽  
Afm Analysis ◽  
Deep Donor ◽  
Donor States

The band gap, grain size, and topography of a Cu(In,Ga)Se2(CIGSe) thin film solar cell are analyzed using surface photovoltage spectroscopy (SPV) and atomic force microscopy (AFM) techniques. From the steep increase in SPV signal the band gap of the CIGSe absorber, In2S3and ZnO layers are extracted and found to be 1.1, 1.3 and 2.6 eV, respectively. Already below the band gap of ZnO layer, a slight SPV response at 1.40 eV photon energies is observed indicating the presence of deep donor states. The root mean square (rms) of the surface roughness is found to be 37.8 nm from AFM surface topography maps. The grain sizes are almost uniform and smaller than 1 μm.

Topography studies of magnetic-head pole-tip areas using atomic-force microprobe

1994 ◽  
Vol 52 ◽  
pp. 540-541
Author(s):  
Nina Veisfeld
Keyword(s):  
Thin Film ◽  
Magnetic Head ◽  
Force Microscopy ◽  
Surrounding Matrix ◽  
Area Of Interest ◽  
Atomic Force ◽  
Afm Analysis ◽  
Sputter Deposited ◽  
Critical Regions ◽  
Pole Tip Recession

Atomic Force Microscopy (AFM) has made it possible to quantify an important phenomenon regarding magnetic head characterization, known as pole tip recession. The pole tip area of thin film magnetic heads, considered one of the critical regions in the head/disk interaction, became the subject of increasing concern within the past several years because of the rapid decrease of the flying heights (typical present values are ∽300 Å). The area of interest includes plated permalloy pole tips and the surrounding alumina matrix, sputter deposited onto a ceramic substrate. The complex topography of thearea is associated with the hardness differences between the materials in multiple layers compsiring the head.AFM analysis revealed significant variations in the topography of different thin film heads. Figure 1 presents a typical example of the pole tip area topography. In this AFM image the two pole tips are elevated above the surrounding matrix. A dark area above the upper pole (recessed by ∽190Å vs. the poles) and slightly brighter (elevated by ∽160Å) symmetrically positioned areas on both sides of the poles are clearly outlined.

Properties of Piezoelectric Layer Deposited by Sol-Gel Method for MEMS Sensor Applications

2015 ◽  
Vol 780 ◽  
pp. 23-27 ◽  
Author(s):  
H. Fazmir ◽  
Y. Wahab ◽  
A.F.M. Anuar ◽  
M.Z. Zainol ◽  
M. Najmi ◽  
...  
Keyword(s):  
Thin Film ◽  
Annealing Temperature ◽  
Electrical Characteristic ◽  
Sol Gel ◽  
Zno Thin Film ◽  
Force Microscopy ◽  
Sensor Applications ◽  
Mems Sensor ◽  
Atomic Force ◽  
Afm Analysis

A layer of ZnO thin film was deposited repetitively 15 times on a silicon substrate by sol-gel spin coating technique. The structural and electrical characteristic of the thin film was studied and presented. For structural characterization, Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) analysis were chosen while Semiconductor Parametric Analyzer (SPA) was used to measure the electrical characteristic. The ZnO thin film thickness were measured to be between 165 nm to 180 nm. The resistance increased proportionally with annealing temperature with the lowest value of 80Ω. Structurally, the grain sizes of the ZnO thin films increased with the increase in annealing temperature. The root mean square (RMS) and average surface roughness (Ra) were measured respectively.

Surface Photovoltage Spectroscopy and Mapping by Atomic Force Microscopy

1994 ◽  
Vol 23 (10) ◽  
pp. 1975-1978
Author(s):  
Lei Jiang ◽  
Larry Akio Nagahara ◽  
Kazuhito Hashimoto ◽  
Akira Fujishima
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Photovoltage ◽  
Force Microscopy ◽  
Surface Photovoltage Spectroscopy ◽  
Atomic Force

scholarly journals Back to Nature: Combating Candida albicans Biofilm, Phospholipase and Hemolysin Using Plant Essential Oils

Antibiotics ◽  
2021 ◽  
Vol 10 (1) ◽  
pp. 81
Author(s):  
Ahmed M. El-Baz ◽  
Rasha A. Mosbah ◽  
Reham M. Goda ◽  
Basem Mansour ◽  
Taranum Sultana ◽  
...  
Keyword(s):  
Candida Albicans ◽  
Essential Oils ◽  
Docking Study ◽  
New Drugs ◽  
Molecular Docking Study ◽  
Plant Essential Oils ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Analysis ◽  
Phenotypic Methods

Candida albicans is the causative agent of fatal systemic candidiasis. Due to limitations of antifungals, new drugs are needed. The anti-virulence effect of plant essential oils (EOs) was evaluated against clinical C. albicans isolates including cinnamon, clove, jasmine and rosemary oils. Biofilm, phospholipase and hemolysin were assessed phenotypically. EOs were evaluated for their anti-virulence activity using phenotypic methods as well as scanning electron microscopy (SEM) and atomic force microscopy (AFM). Among the C. albicans isolates, biofilm, phospholipase and hemolysins were detected in 40.4, 86.5 and 78.8% of isolates, respectively. Jasmine oil showed the highest anti-biofilm activity followed by cinnamon, clove and rosemary oils. SEM and AFM analysis showed reduced adherence and roughness in the presence of EOs. For phospholipase, rosemary oil was the most inhibitory, followed by jasmine, cinnamon and clove oils, and for hemolysins, cinnamon had the highest inhibition followed by jasmine, rosemary and clove oils. A molecular docking study revealed major EO constituents as promising inhibitors of the Als3 adhesive protein, with the highest binding for eugenol, followed by 1,8-cineole, 2-phenylthiolane and cinnamaldehyde. In conclusion, EOs have a promising inhibitory impact on Candida biofilm, phospholipase and hemolysin production, hence EOs could be used as potential antifungals that impact virulence factors.

A HfO2 Thin Film Resistive Switch Based on Conducting Atomic Force Microscopy

2011 ◽  
Vol 14 (8) ◽  
pp. H311 ◽  
Author(s):  
J. Y. Son ◽  
D.-Y. Kim ◽  
H. Kim ◽  
W. J. Maeng ◽  
Y.-S. Shin ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Resistive Switch ◽  
Force Microscopy ◽  
Atomic Force

Coupling In-Situ Techniques to Analyze Zinc Deposition and Dissolution for Energy Storage Applications

2013 ◽  
Vol 1491 ◽  
Author(s):  
Jayme Keist ◽  
Christine Orme ◽  
Frances Ross ◽  
Dan Steingart ◽  
Paul Wright ◽  
...  
Keyword(s):  
Liquid Electrolyte ◽  
Scattering Data ◽  
Zinc Deposition ◽  
Ionic Liquid Electrolyte ◽  
Force Microscopy ◽  
In Situ Techniques ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Afm Analysis

ABSTRACTThis investigation describes preliminary results of in-situ analysis of zinc deposition within an ionic liquid electrolyte utilizing electrochemical atomic force microscopy (EC AFM). From the AFM analysis, the morphology of the zinc deposition was analyzed by quantifying the surface roughness using height-height correlation functions. These results will be used to analyze the scattering data obtained from zinc deposition analysis utilizing an electrochemical ultra-small angle x-ray scattering (EC USAXS). The goal of this research is to link the early nucleation and growth behavior to the formation of detrimental morphologies.

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