scholarly journals The Design of Low Noise Amplifiers in Deep Submicron CMOS Processes: A Convex Optimization Approach

VLSI Design ◽  
2015 ◽  
Vol 2015 ◽  
pp. 1-16 ◽  
Author(s):  
David H. K. Hoe ◽  
Xiaoyu Jin

With continued process scaling, CMOS has become a viable technology for the design of high-performance low noise amplifiers (LNAs) in the radio frequency (RF) regime. This paper describes the design of RF LNAs using a geometric programming (GP) optimization method. An important challenge for RF LNAs designed at nanometer scale geometries is the excess thermal noise observed in the MOSFETs. An extensive survey of analytical models and experimental results reported in the literature is carried out to quantify the issue of excessive thermal noise for short-channel MOSFETs. Short channel effects such as channel-length modulation and velocity saturation effects are also accounted for in our optimization process. The GP approach is able to efficiently calculate the globally optimum solution. The approximations required to setup the equations and constraints to allow convex optimization are detailed. The method is applied to the design of inductive source degenerated common source amplifiers at the 90 nm and 180 nm technology nodes. The optimization results are validated through comparison with numerical simulations using Agilent’s Advanced Design Systems (ADS) software.

1988 ◽  
Vol 36 (12) ◽  
pp. 1598-1603 ◽  
Author(s):  
K.H.G. Duh ◽  
Pane-Chane Chao ◽  
P.M. Smith ◽  
L.F. Lester ◽  
B.R. Lee ◽  
...  

1996 ◽  
Vol 74 (S1) ◽  
pp. 159-166
Author(s):  
D. C. Ahlgren ◽  
S. J. Jeng ◽  
D. Nguyen-Ngoc ◽  
K. Stein ◽  
D. Sunderland ◽  
...  

This review discusses the fundamentals of SiGe epitaxial base heterojunction bipolar transistor (HBT) technology that have been developed for use in analog and mixed-signal applications in the 1–20 GHz range. The basic principles of operation of the graded base SiGe HBT are reviewed. These principles are then used to explore the design optimization for analog applications. Device results are presented that illustrate some important trade-offs in device design. A discussion of the use of UHV/CVD for the deposition of the epitaxial base profile is followed by an overview of the integrated process. This process, which has been installed on 200 mm wafers in IBM's Advanced Semiconductor Technology Center in Hopewell Junction, N.Y., also includes a full range of support devices. The process has demonstrated SiGe HBT performance, reliability, and yield in a CMOS fabrication with the addition of only one tool for UHV/CVD deposition of the epi-base and, with minimal additional process steps, can be used to fabricate full BiCMOS designs. This paper concludes with a discussion of high-performance circuits fabricated to date, including ECL ring'oscillators, power amplifiers, low-noise amplifiers, voltage-controlled oscillators, and finally a 12-bit DAC that features nearly 3000 SiGe HBT devices demonstrating medium-scale integration.


2005 ◽  
Vol 40 (3) ◽  
pp. 726-735 ◽  
Author(s):  
Kwangseok Han ◽  
J. Gil ◽  
Seong-Sik Song ◽  
Jeonghu Han ◽  
Hyungcheol Shin ◽  
...  

1986 ◽  
Vol 34 (12) ◽  
pp. 1553-1558 ◽  
Author(s):  
D.C. Wang ◽  
R.G. Pauley ◽  
Shing-Kuo Wang ◽  
L.C.T. Liu

1986 ◽  
Vol 33 (12) ◽  
pp. 2084-2089 ◽  
Author(s):  
D.C. Wang ◽  
R.G. Pauley ◽  
S. Wang ◽  
L.C.T. Liu

2006 ◽  
Vol 54 (1) ◽  
pp. 46-56 ◽  
Author(s):  
R.A. Baki ◽  
T.K.K. Tsang ◽  
M.N. El-Gamal

2012 ◽  
Vol 602-604 ◽  
pp. 2259-2262
Author(s):  
Hong Xi Zhou ◽  
Chao Chen ◽  
Tao Wang

In this paper a high-performance single level uncooled microbolometer detectors with a unit cell size of 25um×25um is introduced. An efficient detectors requires low Noise Equivalent Temperature Difference(NETD) (<80mK,f/1,60Hz)and low thermal time constant (<8.3ms). The trade-offs between physical parameters are studied to attain the optimum design parameters including the thermal conductance, the thermal time constant and the active area, consequently, optimum design parameters such as the width and the length of the support arms, which can satisfy the demand of an efficient detectors is achieved.


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