scholarly journals A Natural Image Pointillism with Controlled Ellipse Dots

2014 ◽  
Vol 2014 ◽  
pp. 1-16 ◽  
Author(s):  
Dongxiang Chi
Keyword(s):  
Saliency Map ◽  
Natural Image ◽  
Source Image ◽  
Layer By Layer ◽  
Artistic Rendering ◽  
Large Size

This paper presents an image-based artistic rendering algorithm for the automatic Pointillism style. At first, ellipse dot locations are randomly generated based on a source image; then dot orientations are precalculated with help of a direction map; a saliency map of the source image decides long and short radius of the ellipse dot. At last, the rendering runs layer-by-layer from large size dots to small size dots so as to reserve the detailed parts of the image. Although only ellipse dot shape is adopted, the final Pointillism style performs well because of variable characteristics of the dot.

scholarly journals Self-Organizing Map-Based Color Image Segmentation with k-Means Clustering and Saliency Map

2011 ◽  
Vol 2011 ◽  
pp. 1-18 ◽  
Author(s):  
Dongxiang Chi
Keyword(s):  
Image Segmentation ◽  
Color Image ◽  
Color Space ◽  
Saliency Map ◽  
Color Image Segmentation ◽  
Evaluation Index ◽  
Natural Image ◽  
Self Organizing Map ◽  
Clustering Methods ◽  
Computational Load

Natural image segmentation is an important topic in digital image processing, and it could be solved by clustering methods. We present in this paper an SOM-based k-means method (SOM-K) and a further saliency map-enhanced SOM-K method (SOM-KS). In SOM-K, pixel features of intensity and L∗u∗v∗ color space are trained with SOM and followed by a k-means method to cluster the prototype vectors, which are filtered with hits map. A variant of the proposed method, SOM-KS, adds a modified saliency map to improve the segmentation performance. Both SOM-K and SOM-KS segment the image with the guidance of an entropy evaluation index. Compared to SOM-K, SOM-KS makes a more precise segmentation in most cases by segmenting an image into a smaller number of regions. At the same time, the salient object of an image stands out, while other minor parts are restrained. The computational load of the proposed methods of SOM-K and SOM-KS are compared to J-image-based segmentation (JSEG) and k-means. Segmentation evaluations of SOM-K and SOM-KS with the entropy index are compared with JSEG and k-means. It is observed that SOM-K and SOM-KS, being an unsupervised method, can achieve better segmentation results with less computational load and no human intervention.

Objective Image Quality Assessment Based on Saliency Map

2016 ◽  
Vol 20 (2) ◽  
pp. 205-211 ◽  
Author(s):  
Longsheng Wei ◽  
◽  
Wei Liu ◽  
Xinmei Wang ◽  
Feng Liu ◽  
...  
Keyword(s):  
Image Quality ◽  
Quality Assessment ◽  
Image Quality Assessment ◽  
Structural Information ◽  
Estimation Method ◽  
Human Perception ◽  
Saliency Map ◽  
Reference Image ◽  
Source Image ◽  
Gradient Magnitude

The development of objective image quality assessment metrics aligned with human perception is of fundamental importance to numerous image processing applications. In this paper, an objective image quality assessment approach based on saliency map is proposed. By local shift estimation method, the retargeted image is resized to the same size as the reference image. A gradient magnitude similarity map is computed by comparing the retargeted and reference images. The more similarly, the brighter of pixels in the gradient magnitude similarity map. At the same time, a saliency map of reference image is achieved by visual attention. Finally, an overall image quality score is computed from the gradient magnitude similarity map via saliency pooling strategy. The most important step in our approach is to generate a gradient magnitude similarity map that indicates at each spatial location in the source image how the structural information is preserved in the retargeted image. There are two key contributions in this paper, one is that we add the texture feature in computing saliency map because image gradient is very sensitive to texture information, and the other is that we propose a new objective image quality metrics by introducing saliency map into image quality evaluation. Experimental results indicate that the evaluation indexes of our approach are better than existing methods in the literature.

Coherency loss in γ' precipitates in nickel-base superalloy

1983 ◽  
Vol 41 ◽  
pp. 244-245
Author(s):  
R. A. Ricks ◽  
Angus J. Porter
Keyword(s):  
Lattice Mismatch ◽  
Lattice Parameter ◽  
Nickel Base Superalloy ◽  
Large Size ◽  
The Matrix ◽  
Nimonic 80A ◽  
Interfacial Dislocations ◽  
Nickel Base ◽  
Coherency Loss ◽  
Nimonic 115

During a recent investigation concerning the growth of γ' precipitates in nickel-base superalloys it was observed that the sign of the lattice mismatch between the coherent particles and the matrix (γ) was important in determining the ease with which matrix dislocations could be incorporated into the interface to relieve coherency strains. Thus alloys with a negative misfit (ie. the γ' lattice parameter was smaller than the matrix) could lose coherency easily and γ/γ' interfaces would exhibit regularly spaced networks of dislocations, as shown in figure 1 for the case of Nimonic 115 (misfit = -0.15%). In contrast, γ' particles in alloys with a positive misfit could grow to a large size and not show any such dislocation arrangements in the interface, thus indicating that coherency had not been lost. Figure 2 depicts a large γ' precipitate in Nimonic 80A (misfit = +0.32%) showing few interfacial dislocations.

Microstructural characterization of CoPtCr/Cr thin film disks by cross-section TEM and elongated probe micro-diffraction

1991 ◽  
Vol 49 ◽  
pp. 762-763
Author(s):  
M.A. Parker ◽  
K.E. Johnson ◽  
C. Hwang ◽  
A. Bermea
Keyword(s):  
Magnetic Recording ◽  
Electron Probe ◽  
Microstructural Characterization ◽  
Crystallographic Structure ◽  
Recording Media ◽  
Layer By Layer ◽  
Cross Sectional ◽  
New Techniques ◽  
Polished Side

We have reported the dependence of the magnetic and recording properties of CoPtCr recording media on the thickness of the Cr underlayer. It was inferred from XRD data that grain-to-grain epitaxy of the Cr with the CoPtCr was responsible for the interaction observed between these layers. However, no cross-sectional TEM (XTEM) work was performed to confirm this inference. In this paper, we report the application of new techniques for preparing XTEM specimens from actual magnetic recording disks, and for layer-by-layer micro-diffraction with an electron probe elongated parallel to the surface of the deposited structure which elucidate the effect of the crystallographic structure of the Cr on that of the CoPtCr.XTEM specimens were prepared from magnetic recording disks by modifying a technique used to prepare semiconductor specimens. After 3mm disks were prepared per the standard XTEM procedure, these disks were then lapped using a tripod polishing device. A grid with a single 1mmx2mm hole was then glued with M-bond 610 to the polished side of the disk.

Epitaxial growth manner and structure of superconducting oxide films

1990 ◽  
Vol 48 (4) ◽  
pp. 2-3
Author(s):  
Yoshichika Bando ◽  
Takahito Terashima ◽  
Kenji Iijima ◽  
Kazunuki Yamamoto ◽  
Kazuto Hirata ◽  
...  
Keyword(s):  
Ultrathin Films ◽  
Film Surface ◽  
High Energy ◽  
Epitaxial Films ◽  
Layer By Layer ◽  
Initial Growth ◽  
In Situ Growth ◽  
High Quality ◽  
Activated Reactive Evaporation

The high quality thin films of high-Tc superconducting oxide are necessary for elucidating the superconducting mechanism and for device application. The recent trend in the preparation of high-Tc films has been toward “in-situ” growth of the superconducting phase at relatively low temperatures. The purpose of “in-situ” growth is to attain surface smoothness suitable for fabricating film devices but also to obtain high quality film. We present the investigation on the initial growth manner of YBCO by in-situ reflective high energy electron diffraction (RHEED) technique and on the structural and superconducting properties of the resulting ultrathin films below 100Å. The epitaxial films have been grown on (100) plane of MgO and SrTiO, heated below 650°C by activated reactive evaporation. The in-situ RHEED observation and the intensity measurement was carried out during deposition of YBCO on the substrate at 650°C. The deposition rate was 0.8Å/s. Fig. 1 shows the RHEED patterns at every stage of deposition of YBCO on MgO(100). All the patterns exhibit the sharp streaks, indicating that the film surface is atomically smooth and the growth manner is layer-by-layer.

Automatic analysis of Kikuchi diffraction patterns

1994 ◽  
Vol 52 ◽  
pp. 900-901
Author(s):  
H. Weiland ◽  
D. P. Field
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
Relevant Information ◽  
Crystalline Materials ◽  
Large Size ◽  
Transmission Electron ◽  
New Type ◽  
Diffraction Patterns ◽  
Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

Immunoprobe localization in mammalian embryos

1990 ◽  
Vol 48 (3) ◽  
pp. 32-33
Author(s):  
Patricia G. Calarco ◽  
Margaret C. Siebert
Keyword(s):  
Electron Microscopy ◽  
Endoplasmic Reticulum ◽  
Thin Sections ◽  
Relative Lack ◽  
Large Size ◽  
Mammalian Embryos ◽  
Antigen Localization ◽  
Difficult Challenge ◽  
Lowicryl K4m ◽  
Fertilized Egg

Visualization of preimplantation mammalian embryos by electron microscopy is difficult due to the large size of the ircells, their relative lack of internal structure, and their highly hydrated cytoplasm. For example, the fertilized egg of the mouse is a single cell of approximately 75μ in diameter with little organized cytoskelet on and apaucity ofor ganelles such as endoplasmic reticulum (ER) and Golgi material. Thus, techniques that work well on tissues or cell lines are often not adaptable to embryos at either the LM or EM level.Over several years we have perfected techniques for visualization of mammalian embryos by LM and TEM, SEM and for the pre-embedding localization of antigens. Post-embedding antigenlocalization in thin sections of mouse oocytes and embryos has presented a more difficult challenge and has been explored in LR White, LR Gold, soft EPON (after etching of sections), and Lowicryl K4M. To date, antigen localization has only been achieved in Lowicryl-embedded material, although even with polymerization at-40°C, the small ER vesicles characteristic of embryos are unrecognizable.

Compact back-scattered electrons' energy analyzer for standard SEM

1994 ◽  
Vol 52 ◽  
pp. 488-489
Author(s):  
S. Likharev ◽  
A. Kramarenko ◽  
V. Vybornov
Keyword(s):  
Depth Resolution ◽  
High Energy ◽  
Primary Beam ◽  
Layer By Layer ◽  
Energy Analyzer ◽  
High Energy Part ◽  
Small Window ◽  
Energy Part ◽  
Wide Range ◽  
High Voltage Supply

At present time the interest is growing considerably for theoretical and experimental analysis of back-scattered electrons (BSE) energy spectra. It was discovered that a special angle and energy nitration of BSE flow could be used for increasing a spatial resolution of BSE mode, sample topography investigations and for layer-by layer visualizing of a depth structure. In the last case it was shown theoretically that in order to obtain suitable depth resolution it is necessary to select a part of BSE flow with the directions of velocities close to inverse to the primary beam and energies within a small window in the high-energy part of the whole spectrum.A wide range of such devices has been developed earlier, but all of them have considerable demerit: they can hardly be used with a standard SEM due to the necessity of sufficient SEM modifications like installation of large accessories in or out SEM chamber, mounting of specialized detector systems, input wires for high voltage supply, screening a primary beam from additional electromagnetic field, etc. In this report we present a new scheme of a compact BSE energy analyzer that is free of imperfections mentioned above.

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