scholarly journals Retracted: Structural and Optical Properties of Germanium Thin Films Prepared by the Vacuum Evaporation Technique

2014 ◽  
Vol 2014 ◽  
pp. 1-1
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Vacuum Evaporation ◽  
Structural And Optical Properties ◽  
Evaporation Technique ◽  
Vacuum Evaporation Technique

scholarly journals Structural and Optical Properties of Germanium Thin Films Prepared by the Vacuum Evaporation Technique

2014 ◽  
Vol 2014 ◽  
pp. 1-7 ◽  
Author(s):  
Z. Al-Sharafi ◽  
S. Mohyeddine ◽  
Samir Osman Mohammed ◽  
R. M. Kershi
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Annealing Temperature ◽  
Vacuum Evaporation ◽  
Structural And Optical Properties ◽  
Average Value ◽  
Sem Image ◽  
Electron Transitions ◽  
Evaporation Technique ◽  
Vacuum Evaporation Technique

Germanium (Ge) thin films have been deposited onto the glass substrates by the vacuum evaporation technique. The effect of annealing temperature on the structural and optical properties of the germanium thin films was investigated. The structural and optical properties of thin films were characterized by XRD, SEM, and UV-Vis techniques. XRD results showed that the structure of the deposited thin films changed from amorphous phase for the films, which deposited at room temperature, to crystalline phase for the films, which deposited at high temperature. Optimum temperature to obtain a good crystalline structure was 525°C. The SEM image also showed that the crystallization of the thin films is increased with increasing of annealing temperature. Transmittance and reflectance spectral were used to calculate the absorption coefficient. Two absorption edges in two spectral regions were distinguished according to direct and indirect electron transitions. Energy band gap Eg was calculated by using the Tauc relationship for both direct and indirect electron transitions. The average value of Eg was equal to 0.79 eV and 0.61 eV for direct and indirect transitions, respectively.

Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Thermal Evaporation ◽  
Pure Sno2 ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Evaporation Technique ◽  
Sno2 Thin Films

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.

Synthesis And Structural Studies Of CdTe Thin Films Formed By Vacuum Evaporation Technique

2008 ◽  
Author(s):  
Ajit Mahadkar ◽  
Alka Chauhan ◽  
Madhavi Thakurdesai ◽  
Deepak Gaikwad ◽  
P. Predeep ◽  
...  
Keyword(s):  
Thin Films ◽  
Vacuum Evaporation ◽  
Structural Studies ◽  
Evaporation Technique ◽  
Cdte Thin Films ◽  
Vacuum Evaporation Technique
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