scholarly journals Fast Far Field Computation of Single and Dual Reflector Antennas

2013 ◽  
Vol 2013 ◽  
pp. 1-11 ◽  
Author(s):  
Marcos Arias-Acuña ◽  
Antonio García-Pino ◽  
Oscar Rubiños-López
Keyword(s):  
Physical Interpretation ◽  
Physical Optics ◽  
Far Field ◽  
Reflector Antennas ◽  
Acceleration Techniques ◽  
Field Patterns ◽  
Field Computation ◽  
Electromagnetic Behavior ◽  
Dual Geometries

The physical optics (PO) method has been widely used for the analysis of the electromagnetic behavior of single and dual reflector antennas. An extensive work has been done by the authors of this paper in order to increase the speed for obtaining far field patterns from single and dual geometries and also in order to increase the accuracy of the method. This paper reviews these contributions and improves the existing published work with the physical interpretation of the radiation from a single patch and the computer implications when using acceleration techniques such as OpenMP.

Stationary phase method for far-field computation of defocused reflector antennas

1980 ◽  
Vol 16 (13) ◽  
pp. 519 ◽  
Author(s):  
M.H.A.J. Herben ◽  
R. Middelkoop ◽  
F.J.J. Gielkens
Keyword(s):  
Stationary Phase ◽  
Phase Method ◽  
Stationary Phase Method ◽  
Far Field ◽  
Reflector Antennas ◽  
Field Computation

Radiation Characteristics of a Reflector Antenna Under Shock Wave Loading

2012 ◽  
Vol 13 (1) ◽  
Author(s):  
Yan Liu ◽  
Junming Yuan ◽  
Lu Dong ◽  
Fenglei Huang
Keyword(s):  
Shock Wave ◽  
Surface Deformation ◽  
Reflector Antenna ◽  
Initial Structure ◽  
Far Field ◽  
Shock Wave Loading ◽  
Wave Loading ◽  
Reflector Antennas ◽  
Radiation Characteristics ◽  
Field Patterns

AbstractIn this paper, the radiation characteristics of a reflector antenna with surface deformation were numerically simulated. The deformation of the reflector antenna under shock wave loading was simulated by LSDYNA software and the far-field patterns of these deformed reflector antennas were calculated by FEKO software. The structure-deformed reflector antennas obtained by LSDYNA software were used as the initial structure of the reflector antennas for calculating the radiation characteristics. The equations were derived to calculate the far field of the reflector antenna according to the physical optics method. As a consequence, according to the encounter modes of the shock wave and the antenna, the far-field patterns were investigated under three conditions of the shock wave frontal action, rear action and oblique action on the antenna.

Radiation Characteristics of a Reflector Antenna Under Shock Wave Loading

2012 ◽  
Vol 13 (1) ◽  
Author(s):  
Yan Liu ◽  
Junming Yuan ◽  
Lu Dong ◽  
Fenglei Huang
Keyword(s):  
Shock Wave ◽  
Surface Deformation ◽  
Reflector Antenna ◽  
Initial Structure ◽  
Far Field ◽  
Shock Wave Loading ◽  
Wave Loading ◽  
Reflector Antennas ◽  
Radiation Characteristics ◽  
Field Patterns

AbstractIn this paper, the radiation characteristics of a reflector antenna with surface deformation were numerically simulated. The deformation of the reflector antenna under shock wave loading was simulated by LSDYNA software and the far-field patterns of these deformed reflector antennas were calculated by FEKO software. The structure-deformed reflector antennas obtained by LSDYNA software were used as the initial structure of the reflector antennas for calculating the radiation characteristics. The equations were derived to calculate the far field of the reflector antenna according to the physical optics method. As a consequence, according to the encounter modes of the shock wave and the antenna, the far-field patterns were investigated under three conditions of the shock wave frontal action, rear action and oblique action on the antenna.

Calculation of the Side and Back Far-Field Zone Radiation for Reflector Antennas with Radio Absorbing Coating on Edges

2004 ◽  
Vol 61 (1) ◽  
pp. 67-74
Author(s):  
O. I. Sukharevsky ◽  
V. A. Vasilets ◽  
S. V. Nechitaylo ◽  
S. V. Orekhov
Keyword(s):  
Far Field ◽  
Field Zone ◽  
Reflector Antennas

scholarly journals Axial localization and tracking of self-interference nanoparticles by lateral point spread functions

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Yongtao Liu ◽  
Zhiguang Zhou ◽  
Fan Wang ◽  
Günter Kewes ◽  
Shihui Wen ◽  
...  
Keyword(s):  
Mirror Image ◽  
Excitation Wavelength ◽  
Far Field ◽  
Point Spread Functions ◽  
Microscopy Imaging ◽  
Localization Accuracy ◽  
Field Patterns ◽  
Atomic Force ◽  
Point Spread ◽  
Sensing Technology

AbstractSub-diffraction limited localization of fluorescent emitters is a key goal of microscopy imaging. Here, we report that single upconversion nanoparticles, containing multiple emission centres with random orientations, can generate a series of unique, bright and position-sensitive patterns in the spatial domain when placed on top of a mirror. Supported by our numerical simulation, we attribute this effect to the sum of each single emitter’s interference with its own mirror image. As a result, this configuration generates a series of sophisticated far-field point spread functions (PSFs), e.g. in Gaussian, doughnut and archery target shapes, strongly dependent on the phase difference between the emitter and its image. In this way, the axial locations of nanoparticles are transferred into far-field patterns. We demonstrate a real-time distance sensing technology with a localization accuracy of 2.8 nm, according to the atomic force microscope (AFM) characterization values, smaller than 1/350 of the excitation wavelength.

Far-field patterns of line sources mounted between four-dielectric substrates

1992 ◽  
Vol 70 (2-3) ◽  
pp. 173-178 ◽  
Author(s):  
Ioanna Diamandi ◽  
Costas Mertzianidis ◽  
John N. Sahalos
Keyword(s):  
Remote Sensing ◽  
Line Source ◽  
Dielectric Substrate ◽  
Microstrip Antennas ◽  
Field Pattern ◽  
Substrate Thickness ◽  
Far Field ◽  
Dielectric Substrates ◽  
Field Patterns ◽  
Far Field Pattern

The far-field pattern characteristics of line sources lying between the slabs of a four-dielectric substrate configuration are presented. The patterns are calculated for several cases of the substrate thickness as well as for several line-source locations. The considerations that are made give useful applications in remote sensing and microstrip antennas.

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