Effects of surface texture on far field patterns of the reflector antenna

2009 ◽  
Author(s):  
P. Li ◽  
F. Zheng ◽  
J.T. Chang
Keyword(s):  
Surface Texture ◽  
Reflector Antenna ◽  
Far Field ◽  
Field Patterns

Radiation Characteristics of a Reflector Antenna Under Shock Wave Loading

2012 ◽  
Vol 13 (1) ◽  
Author(s):  
Yan Liu ◽  
Junming Yuan ◽  
Lu Dong ◽  
Fenglei Huang
Keyword(s):  
Shock Wave ◽  
Surface Deformation ◽  
Reflector Antenna ◽  
Initial Structure ◽  
Far Field ◽  
Shock Wave Loading ◽  
Wave Loading ◽  
Reflector Antennas ◽  
Radiation Characteristics ◽  
Field Patterns

AbstractIn this paper, the radiation characteristics of a reflector antenna with surface deformation were numerically simulated. The deformation of the reflector antenna under shock wave loading was simulated by LSDYNA software and the far-field patterns of these deformed reflector antennas were calculated by FEKO software. The structure-deformed reflector antennas obtained by LSDYNA software were used as the initial structure of the reflector antennas for calculating the radiation characteristics. The equations were derived to calculate the far field of the reflector antenna according to the physical optics method. As a consequence, according to the encounter modes of the shock wave and the antenna, the far-field patterns were investigated under three conditions of the shock wave frontal action, rear action and oblique action on the antenna.

Radiation Characteristics of a Reflector Antenna Under Shock Wave Loading

2012 ◽  
Vol 13 (1) ◽  
Author(s):  
Yan Liu ◽  
Junming Yuan ◽  
Lu Dong ◽  
Fenglei Huang
Keyword(s):  
Shock Wave ◽  
Surface Deformation ◽  
Reflector Antenna ◽  
Initial Structure ◽  
Far Field ◽  
Shock Wave Loading ◽  
Wave Loading ◽  
Reflector Antennas ◽  
Radiation Characteristics ◽  
Field Patterns

AbstractIn this paper, the radiation characteristics of a reflector antenna with surface deformation were numerically simulated. The deformation of the reflector antenna under shock wave loading was simulated by LSDYNA software and the far-field patterns of these deformed reflector antennas were calculated by FEKO software. The structure-deformed reflector antennas obtained by LSDYNA software were used as the initial structure of the reflector antennas for calculating the radiation characteristics. The equations were derived to calculate the far field of the reflector antenna according to the physical optics method. As a consequence, according to the encounter modes of the shock wave and the antenna, the far-field patterns were investigated under three conditions of the shock wave frontal action, rear action and oblique action on the antenna.

scholarly journals Axial localization and tracking of self-interference nanoparticles by lateral point spread functions

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Yongtao Liu ◽  
Zhiguang Zhou ◽  
Fan Wang ◽  
Günter Kewes ◽  
Shihui Wen ◽  
...  
Keyword(s):  
Mirror Image ◽  
Excitation Wavelength ◽  
Far Field ◽  
Point Spread Functions ◽  
Microscopy Imaging ◽  
Localization Accuracy ◽  
Field Patterns ◽  
Atomic Force ◽  
Point Spread ◽  
Sensing Technology

AbstractSub-diffraction limited localization of fluorescent emitters is a key goal of microscopy imaging. Here, we report that single upconversion nanoparticles, containing multiple emission centres with random orientations, can generate a series of unique, bright and position-sensitive patterns in the spatial domain when placed on top of a mirror. Supported by our numerical simulation, we attribute this effect to the sum of each single emitter’s interference with its own mirror image. As a result, this configuration generates a series of sophisticated far-field point spread functions (PSFs), e.g. in Gaussian, doughnut and archery target shapes, strongly dependent on the phase difference between the emitter and its image. In this way, the axial locations of nanoparticles are transferred into far-field patterns. We demonstrate a real-time distance sensing technology with a localization accuracy of 2.8 nm, according to the atomic force microscope (AFM) characterization values, smaller than 1/350 of the excitation wavelength.

Far-field patterns of line sources mounted between four-dielectric substrates

1992 ◽  
Vol 70 (2-3) ◽  
pp. 173-178 ◽  
Author(s):  
Ioanna Diamandi ◽  
Costas Mertzianidis ◽  
John N. Sahalos
Keyword(s):  
Remote Sensing ◽  
Line Source ◽  
Dielectric Substrate ◽  
Microstrip Antennas ◽  
Field Pattern ◽  
Substrate Thickness ◽  
Far Field ◽  
Dielectric Substrates ◽  
Field Patterns ◽  
Far Field Pattern

The far-field pattern characteristics of line sources lying between the slabs of a four-dielectric substrate configuration are presented. The patterns are calculated for several cases of the substrate thickness as well as for several line-source locations. The considerations that are made give useful applications in remote sensing and microstrip antennas.

Transmissive 2-bit anisotropic coding metasurface

2022 ◽  
Author(s):  
Pengtao Lai ◽  
Zenglin Li ◽  
Wei Wang ◽  
Jia Qu ◽  
Liang Wei Wu ◽  
...  
Keyword(s):  
Angular Momentum ◽  
Electromagnetic Wave ◽  
Circular Polarization ◽  
Orbital Angular Momentum ◽  
Electromagnetic Waves ◽  
Beam Splitter ◽  
Far Field ◽  
Polarization Conversion ◽  
Field Patterns ◽  
Phase Profile

Abstract Coding metasurfaces have attracted tremendous interests due to unique capabilities of manipulating electromagnetic wave. However, archiving transmissive coding metasurface is still challenging. Here we propose a transmissive anisotropic coding metasurface that enables the independent control of two orthogonal polarizations. The polarization beam splitter and the OAM generator have been studied as typical applications of anisotropic 2-bit coding metasurface. The simulated far field patterns illustrate that the x and y polarized electromagnetic waves are deflected into two different directions, respectively. The anisotropic coding metasurface has been experimentally verified to realize an orbital angular momentum (OAM) beam with l = 2 of right-handed polarized wave, resulting from both contributions from linear-to-circular polarization conversion and the phase profile modulation. This work is beneficial to enrich the polarization manipulation field and develop transmissive coding metasurfaces.

Scattering Problems: A Variety of Topics

2012 ◽  
Author(s):  
G. F. Roach ◽  
I. G. Stratis ◽  
A. N. Yannacopoulos
Keyword(s):  
Scattering Theory ◽  
Field Operator ◽  
Optical Theorem ◽  
Perfect Conductor ◽  
Far Field ◽  
Chiral Media ◽  
Scattering Problems ◽  
Expansion Theorem ◽  
Field Patterns ◽  
Environment Problem

This chapter continues the study of scattering problems in the case where the considered fields have harmonic time dependence and the involved chiral media are homogeneous. It begins by containing various important concepts of scattering theory. Next, the chapter deals with the establishment of the reciprocity principle, the general scattering theorem, and the optical theorem for the chiral obstacle in an achiral environment problem; moreover, a study of the spectrum of the far-field operator and its relation to that of the T-matrix is included. Hereafter, the chapter deals with the generalisation of the Atkinson–Wilcox expansion theorem to the perfect conductor in a chiral environment problem and presents results on chiral Herglotz wave functions. It also exhibits infinite Fréchet differentiability of the mapping from the boundary of the scatterer onto the far-field patterns. Finally, the chapter discusses topics related to chiral media.

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