scholarly journals Patterning Luminescent Nanocrystalline  : Eu and  : Tb Particles Embedded in Hybrid Organosilica with Soft-Lithographic Techniques

2012 ◽  
Vol 2012 ◽  
pp. 1-11 ◽  
Author(s):  
Sajid U. Khan ◽  
Johan E. ten Elshof

Eu3+-doped LaPO4and Tb3+-doped CePO4luminescent nanoparticles embedded in hybrid organosilica were patterned by two soft lithographic techniques. The role of various parameters such as solution chemistry, thermal protocols, and modification of the mold-substrate surface energies related to pattern shape formation and adhesion to the substrates have been studied. The shrinkage of the oxide patterns and shape evolution during the process was also examined. The patterns were characterized with optical and photoluminescence (PL) microscopy, X-ray diffraction (XRD), and scanning electron microscopy (SEM). Compositional analyses were carried out with X-ray photoelectron spectroscopy (XPS), low-energy ion scattering (LEIS), and secondary ion mass spectroscopy (SIMS). The results indicated that the final patterns obtained with these two techniques for the same material have different shapes and adherence to the substrates.

2001 ◽  
Vol 31 (12) ◽  
pp. 1079-1084 ◽  
Author(s):  
P. J. de Lange ◽  
P. G. Akker ◽  
A. J. H. Maas ◽  
A. Knoester ◽  
H. H. Brongersma

2003 ◽  
Vol 786 ◽  
Author(s):  
K.P. Bastos ◽  
R.P. Pezzi ◽  
L. Miotti ◽  
G.V. Soares ◽  
C. Driemeier ◽  
...  

ABSTRACTWe report here on atomic transport, thermal stability, and chemical evolution of HfSiO, HfSiN, and AlON films on Si(001), aiming at investigating the atomic scale behaviour of the involved chemical species, N and H in particular, when the films are submitted to usual thermal processing steps in inert and oxidizing atmospheres. The films were characterized by nuclear reaction analyses in resonant and non-resonant regions of the cross-section curves, X-ray photoelectron spectroscopy, and low energy ion scattering. The HfSiN/Si structure was shown to be more resistant to oxygen diffusion than HfSiO/Si, although the amounts of O incorporated in HfSiN/Si are larger than in HfSiO/Si. The main channel of oxygen incorporation is atomic exchange with nitrogen or oxygen atoms. HfSiN film on Si incorporate more hydrogen (or deuterium) and in more stable configurations than HfSiO/Si. Nitrogen incorporation into AlON films on Si renders this structure more stable against thermal annealing in vacuum and/or oxidizing atmospheres than Al2O3/Si.


2019 ◽  
Vol 74 (11-12) ◽  
pp. 901-912 ◽  
Author(s):  
Andrea Preuß ◽  
Marcus Korb ◽  
Tobias Rüffer ◽  
Jörn Bankwitz ◽  
Colin Georgi ◽  
...  

AbstractThe ¦-ketoiminato complex [Pd(OAc)L] (3) can be synthesized by the reaction of bis(benzoylacetone)diethylenetriamine (1, = LH) with [Pd(OAc)2] (2). The structure of 3 in the solid state has been determined by single X-ray diffraction analysis. Complex 3 crystallizes as a dimer (32), which is formed by hydrogen bonds between NH and OOAc functionalities of two adjacent ligands. Each of the Pd atoms is complexed by one ON2 donor unit of the polydentate ligand L− and an acetate group. Pd–Pd interactions and hydrogen bond formation between a NH and the C=O acetate moiety lead to a [4 + 2] coordination at Pd. The non-coordinated part of L exists in its ¦-keto-enamine form. The thermal decomposition behavior of 32 was studied by TG (thermogravimetry) and TG-MS showing that 32 decomposes between 200 and 500°C independent of the applied atmosphere. Under oxygen PdO is produced, while under argon Pd is formed as confirmed by PXRD measurements. Complex 32 was applied as a spin-coating precursor (conc. 0.1 mol L−1, volume 1.5 mL, 3000 rpm, deposition time 6 min, heating rate 50 K min−1, holding time 60 min (Ar) and 120 min (air) at T = 800°C). The as-obtained samples are characterized by granulated particles of Pd/PdO on the substrate surface. EDX (energy-dispersive X-ray spectroscopy) and XPS (X-ray photoelectron spectroscopy) measurements confirmed the formation of Pd (Ar) or PdO (O2) with up to 12 mol% C impurity.


2016 ◽  
Vol 18 (36) ◽  
pp. 25230-25240 ◽  
Author(s):  
László Óvári ◽  
András Berkó ◽  
Gábor Vári ◽  
Richárd Gubó ◽  
Arnold Péter Farkas ◽  
...  

Scanning tunnelling microscopy (STM), low energy ion scattering spectroscopy (LEIS), X-ray photoelectron spectroscopy (XPS) and high resolution electron energy loss spectroscopy (HREELS) were applied for studying Au deposited on the Rh(111) surface.


2006 ◽  
Vol 94 (9-11) ◽  
Author(s):  
Noelle Eglizaud ◽  
F. Miserque ◽  
E. Simoni ◽  
M. Schlegel ◽  
M. Descostes

The mechanism of uranium(VI) interaction with pyrite was studied by solution chemistry and X-ray Photoelectron Spectroscopy (XPS). Natural pyrite was characterized by X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM). After equilibration in 10


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