scholarly journals Hydrogenated Nanocrystalline Silicon Thin Films Prepared by Hot-Wire Method with Varied Process Pressure

2011 ◽  
Vol 2011 ◽  
pp. 1-10 ◽  
Author(s):  
V. S. Waman ◽  
A. M. Funde ◽  
M. M. Kamble ◽  
M. R. Pramod ◽  
R. R. Hawaldar ◽  
...  

Hydrogenated nanocrystalline silicon films were prepared by hot-wire method at low substrate temperature (200∘C) without hydrogen dilution of silane (SiH4). A variety of techniques, including Raman spectroscopy, low angle X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy, atomic force microscopy (AFM), and UV-visible (UV-Vis) spectroscopy, were used to characterize these films for structural and optical properties. Films are grown at reasonably high deposition rates (>15 Å/s), which are very much appreciated for the fabrication of cost effective devices. Different crystalline fractions (from 2.5% to 63%) and crystallite size (3.6–6.0 nm) can be achieved by controlling the process pressure. It is observed that with increase in process pressure, the hydrogen bonding in the films shifts from Si–H to Si–H2and(Si–H2)ncomplexes. The band gaps of the films are found in the range 1.83–2.11 eV, whereas the hydrogen content remains <9 at.% over the entire range of process pressure studied. The ease of depositing films with tunable band gap is useful for fabrication of tandem solar cells. A correlation between structural and optical properties has been found and discussed in detail.

2011 ◽  
Vol 257 (23) ◽  
pp. 9840-9845 ◽  
Author(s):  
Liqiang Guo ◽  
Jianning Ding ◽  
Jichang Yang ◽  
Guanggui Cheng ◽  
Zhiyong Ling ◽  
...  

2013 ◽  
Vol 2013 ◽  
pp. 1-5 ◽  
Author(s):  
Rajesh Parmar ◽  
R. S. Kundu ◽  
R. Punia ◽  
N. Kishore ◽  
P. Aghamkar

Iron-containing bismuth silicate glasses with compositions 60SiO2·(100−x)Bi2O3·xFe2O3 have been prepared by conventional melt-quenching technique. The amorphous nature of the glass samples has been ascertained by the X-ray diffraction. The density (d) has been measured using Archimedes principle, molar volume (Vm) has also been estimated, and both are observed to decrease with the increase in iron content. The glass transition temperature (Tg) of these iron bismuth silicate glasses has been determined using differential scanning calorimetry (DSC) technique, and it increases with the increase in Fe2O3 content. The IR spectra of these glasses consist mainly of [BiO6], [BiO3], and [SiO4] structural units. The optical properties are measured using UV-VIS spectroscopy. The optical bandgap energy (Eop) is observed to decrease with the increase in Fe2O3 content, whereas reverse trend is observed for refractive index.


2011 ◽  
Vol 383-390 ◽  
pp. 3264-3271
Author(s):  
Singh Siddhartha ◽  
Suveda Aarya ◽  
A.K. Srivastava ◽  
Monika Mishra ◽  
M.A. Wahab

The structural and optical properties of virgin and gamma rays irradiation on aromatic polymers (PET, PES and Kapton) at various doses varying from 16 to 300kGy. The optical and Structural studies have been observed by using UV-VIS Spectroscopy and Powder X- Ray Diffration techniques. The diffraction pattern of virgin samples shows that polymers are semi crystalline in nature. But due to irradiation, the overall crystalline peak intensity and crystallite size is found to be increased with increasing dose. The UV-Visible absorption spectra show the existence of the maximum absorption, their shifting and broadening as a result of gamma irradiation has been discussed. Finally the value of direct and indirect band gap in virgin and gamma irradiated on aromatic polymers has been decreased.


2002 ◽  
Vol 16 (01n02) ◽  
pp. 219-226 ◽  
Author(s):  
ATIF MOSSAD ALI ◽  
YASUHIKO SAKAI ◽  
NOBORU ADACHI ◽  
TAKAO INOKUMA ◽  
YOSHIHIRO KURATA ◽  
...  

Nanocrystalline silicon (nc-Si) films were deposited by plasma-enhanced chemical vapor deposition from a SiH 4- H 2 gas mixture. The structural and optical properties of nc-Si films were examined by changing the flow rates of a H 2 gas or a SiF 4 gas diluted by He. The structural change from an amorphous to a nanocrystalline phase was found at H 2 flow rate ([ H 2]) higher than 3 sccm under [ SiF 4/ He ] = 0 sccm and/or by adding SiF 4/ He under [ H 2] = 0 sccm . However, under [ H 2] = 3 sccm, the maximum crystallinity (crystalline volume fraction, ρ) was observed at around [ SiF 4/ He ] = 2 sccm . The photoluminescence exhibited two peaks at around 1.7 eV and 2.2 - 2.3 eV. The first 1.7-eV-peak may be related to nanocrystallites in nc-Si films and the origin of another 2.2 - 2.3-eV-peak is not clear. Thus, hydrogen and fluorine appear to play different role in the crystallization process. In addition, under [ H 2] = 0 sccm , we found a close correlation among the increases in the ρ and the average grain size values and the SiH 2 density with increasing [ SiF 4/ He ].


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