High-Resolution Magnetic Force Microscopy Using Carbon Nanotube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition
Keyword(s):
Carbon nanotubes (CNTs) have been successfully grown on the tip apex of an atomic force microscopy (AFM) cantilever by microwave plasma-enhanced chemical vapor deposition (MPECVD). Both scanning electron microscopy (SEM) and transmission electron microscopy (TEM) observations reveal that the diameter of the CNTs is∼30 nm and the magnetic particles with diameter of∼20 nm, which was used as catalyst for the CNT growth, exist on the top. This CNT probe has been applied to magnetic force microscopy (MFM) on the ultrahigh-density magnetic recording media with 1200 kilo flux change per inch (kfci).
2002 ◽
Vol 16
(06n07)
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pp. 1091-1095
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2005 ◽
Vol 20
(3)
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pp. 703-711
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1989 ◽
Vol 50
(C5)
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pp. C5-667-C5-672