S119 Residual Stress Mapping in a Pipe Weld Repair Using High Energy X-ray Diffraction

2008 ◽  
Vol 23 (2) ◽  
pp. 189-189
Author(s):  
P. J. Bouchard ◽  
M. Turski ◽  
L. Edwards
Keyword(s):  
Residual Stress ◽  
High Energy ◽  
X Ray Diffraction ◽  
Weld Repair ◽  
X Ray ◽  
Stress Mapping

Experimental determination of residual stress in silicon nitride diffusion bonds obtained by high-energy X-ray diffraction

2004 ◽  
Vol 148 (1) ◽  
pp. 60-63 ◽  
Author(s):  
M. Vila ◽  
M.L. Martínez ◽  
C. Prieto ◽  
P. Miranzo ◽  
M.I. Osendi ◽  
...  
Keyword(s):  
Residual Stress ◽  
Silicon Nitride ◽  
Experimental Determination ◽  
High Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffusion Bonds

Hydrogen Interaction with Residual Stresses in Steel Studied by Synchrotron X-Ray Diffraction

2013 ◽  
Vol 772 ◽  
pp. 91-95 ◽  
Author(s):  
Eitan Dabah ◽  
Thomas Kannengiesser ◽  
Dan Eliezer ◽  
Thomas Boellinghaus
Keyword(s):  
Residual Stress ◽  
Stress State ◽  
Residual Stresses ◽  
High Energy ◽  
Steel Sample ◽  
Stainless Steel Sample ◽  
X Ray Diffraction ◽  
High Hydrogen ◽  
X Ray ◽  
Residual Stress State

The residual stress state in a material has an important role in the mechanism of cracking, induced or assisted by hydrogen. In this contribution, the beamline EDDI in BESSY II instrument in Berlin was used in order to investigate the influence of hydrogen upon the residual stresses state existing in a Supermartensitic stainless steel sample. The method used for investigating the residual stresses is the “sinus square ψ” method. This method involves the usage of high energy X-ray diffraction in order to measure the residual stress state and magnitude. It was found that hydrogen presence has a significant influence upon the magnitude of the residual stresses, as its value decreases with high hydrogen content. This effect is reversible, as hydrogen desorbs from the sample the residual stress magnitude gains its initial value before hydrogen charging.

Evaluation of Residual Stress in Nano-TiO2 Film on ITO Glass by Synchrotron X-Ray Diffraction

2005 ◽  
Vol 490-491 ◽  
pp. 637-642
Author(s):  
Dong Ying Ju ◽  
T. Ueda ◽  
Tetsuo Hatakeyama ◽  
T. Arizono ◽  
Kazuya Kusaka ◽  
...  
Keyword(s):  
Residual Stress ◽  
Grain Morphology ◽  
High Energy ◽  
Gas Pressure ◽  
Tio2 Films ◽  
X Ray Diffraction ◽  
Nano Tio2 ◽  
X Ray ◽  
Force Microscopy ◽  
Ito Glass

In this study, evaluation of residual stress in nano-TiO2 film on ITO glass is carried out. The films with thickness less than 30 nm are prepared by the dual-arcs magnetron sputtering with gas pressure 10 and 20 Pa. The surface microstructure and grain morphology of the nano-TiO2 films are observed by the atomic force microscopy (AFM). In order to accurately evaluate the residual stress in the film, the Young’s modulus of the film is determined by the nanoindentation with three point bending method at first, then the internal residual stress in the film is measured by high energy X-ray diffraction with the synchrotron radiation facility Spring-8. The measured residual stresses of nano-TiO2 films prepared with gas pressure 10 and 20 Pa are -11.6 and -9.1 GPa, respectively. It is shown that the residual stress of TiO2 films decrease with the increasing of gas pressure.

scholarly journals Residual stress mapping by micro X-ray diffraction: Application to the study of thin film buckling

2002 ◽  
Vol 12 (6) ◽  
pp. 409-416 ◽  
Author(s):  
P. Goudeau ◽  
P. Villain ◽  
N. Tamura ◽  
R. S. Celestre ◽  
H. Padmore
Keyword(s):  
Thin Film ◽  
Residual Stress ◽  
X Ray Diffraction ◽  
X Ray ◽  
Stress Mapping

scholarly journals Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

2002 ◽  
Vol 9 (2) ◽  
pp. 77-81 ◽  
Author(s):  
Alexander M. Korsunsky ◽  
Steve P. Collins ◽  
R. Alexander Owen ◽  
Mark R. Daymond ◽  
Saïda Achtioui ◽  
...  
Keyword(s):  
Residual Stress ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray ◽  
Stress Mapping

Scanning Three-Dimensional X-Ray Diffraction Microscopy with a High-Energy Microbeam at SPring-8

2017 ◽  
Vol 905 ◽  
pp. 157-164 ◽  
Author(s):  
Yujiro Hayashi ◽  
Daigo Setoyama ◽  
Yoshiki Seno
Keyword(s):  
Residual Stress ◽  
Carbon Steel ◽  
Stress Tensor ◽  
Three Dimensional ◽  
Low Carbon Steel ◽  
High Energy ◽  
Low Carbon ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Orientations

The grain-resolved residual stress (type II) in commercial-quality low carbon steel was observed using scanning three-dimensional X-ray diffraction (3DXRD) microscopy. In this method, grain orientations and lattice parameters are mapped using a monochromatic high-energy X-ray microbeam and 3DXRD-based polycrystalline indexing. Defining the reference lattice parameter a0 as the average value in the entire field of view, grain orientations and lattice parameters are converted into stress tensors, yielding a grain-resolved stress tensor map. The effectiveness of the scanning 3DXRD method was demonstrated by evaluating the residual stress in a cold-rolled low carbon steel sheet using a 50 keV microbeam at SPring-8. The area of the cross-sectional sample was 1×1 mm2, which was sufficiently larger than the grain size of about 20 μm. To produce a two-dimensional map of a circular region with a diameter of 160 μm at a pixel size of 1×1 μm2, the measurement time was about 1 h. From the stress tensor map, differences in residual stress of about 150–200 MPa between some neighboring grains were observed.

scholarly journals Residual Stress, Texture, and Phase Investigation of Autogenous Edge Welds Using High Energy Synchrotron Radiation

2011 ◽  
Vol 681 ◽  
pp. 43-48 ◽  
Author(s):  
René V. Martins ◽  
John A. Francis
Keyword(s):  
Residual Stress ◽  
Ferritic Steel ◽  
High Energy ◽  
X Ray Diffraction ◽  
Slow Speed ◽  
X Ray ◽  
Integrity Assessment ◽  
Fast Speed ◽  
Plant Components ◽  
Good Agreement

Two autogenously edge welded beams made from SA508 ferritic steel were investigated with the purpose of validating residual stress modelling tools which are relevant for integrity assessment of structural power plant components. The two specimens were welded with two different torch travel speeds. The residual strain and phase distributions were non-destructively determined by high-energy synchrotron X-ray diffraction. Good agreement between numerical and experimental data was found for the specimen welded at fast speed. Furthermore, the texture changes in the specimen welded at slow speed were analysed by the same experimental technique.

Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction

2010 ◽  
Vol 652 ◽  
pp. 180-184 ◽  
Author(s):  
Bastien Mireux ◽  
Thomas Buslaps ◽  
Veijo Honkimäki ◽  
Alain Lodini ◽  
Jean Michel Sprauel
Keyword(s):  
Residual Stress ◽  
Tissue Repair ◽  
De Novo ◽  
High Energy ◽  
X Ray Diffraction ◽  
Soft Tissue Repair ◽  
Stress Evaluation ◽  
Bone Implant ◽  
X Ray ◽  
Proliferation And Differentiation

The present study is dedicated to high energy x-ray diffraction measurements of residual stress at bone-implant interfaces. Bone regeneration is different from soft tissue repair as scar formation never occurs and as de novo bone tissue is produced with proliferation and differentiation of mesenchymal cells. To start the bone remodelling, the stress – the most important mechanical factor – should stimulate the osteocytes. Osseointegration is also observed with non-functional implants, in particular with dental implants. This means that a stress similar to a residual stress must exist.

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