D-90 Universal Software for Residual Stress Evaluation from 1D and 2D X-ray Diffraction Data

2007 ◽  
Vol 22 (2) ◽  
pp. 186-186
Author(s):  
A. Ulyanenkov
Keyword(s):  
Residual Stress ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Stress Evaluation ◽  
X Ray

Position Resolved Residual Stress Determination in Alumina-Zirconia Multilayered Ceramics

2008 ◽  
Vol 571-572 ◽  
pp. 421-425
Author(s):  
Guenther A. Maier ◽  
Jozef Keckes ◽  
Jens Brechbuehl ◽  
Hugues Guerault ◽  
Raúl Bermejo
Keyword(s):  
Residual Stress ◽  
Stress Distribution ◽  
X Ray Diffraction ◽  
Correct Evaluation ◽  
Indentation Method ◽  
Element Analysis ◽  
Stress Evaluation ◽  
X Ray ◽  
Residual Stress State ◽  
Experimental Findings

Alumina-zirconia multilayered ceramics have been proposed as an alternative for the design of structural ceramics with improved fracture toughness and strength reliability. During the processing of these laminates, significant residual stresses may arise due to the thermal expansion mismatch between adjacent layers. The correct evaluation of such stress distribution in the laminate may determine its range of application. In this work, the residual stress state in a layered material designed with five thick alumina layers of approximately 650 microns alternated with four thin alumina-zirconia layers of approximately 140 microns was estimated using different methods. A finite element analysis (FEM) was performed for stress evaluation in the bulk and an indentation method and X-Ray diffraction to account for stresses at the surface. Experimental findings show a constant stress distribution within the bulk for each layer, while at the surface stress position dependence is observed in the alumina layers, being the maximum tensile stresses near the layer interface. The accuracy of the results provided by each technique is discussed.

X-Light: an open-source software written in Python to determine the residual stress by X-ray diffraction

2021 ◽  
Vol 54 (4) ◽  
Author(s):  
Tu-Quoc-Sang Pham ◽  
Guillaume Geandier ◽  
Nicolas Ratel-Ramond ◽  
Charles Mareau ◽  
Benoit Malard
Keyword(s):  
Residual Stress ◽  
User Interface ◽  
Synchrotron Radiation ◽  
Stress Analysis ◽  
Open Source ◽  
Graphical User Interface ◽  
Open Source Software ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
X Ray

X-Light is an open-source software that is written in Python with a graphical user interface. X-Light was developed to determine residual stress by X-ray diffraction. This software can process the 0D, 1D and 2D diffraction data obtained with laboratory diffractometers or synchrotron radiation. X-Light provides several options for stress analysis and five functions to fit a peak: Gauss, Lorentz, Pearson VII, pseudo-Voigt and Voigt. The residual stress is determined by the conventional sin2ψ method and the fundamental method.

scholarly journals Residual Stress Evaluation by X-Ray Diffraction and Hole-Drilling in an API 5L X70 Steel Pipe Bent by Hot Induction

2016 ◽  
Vol 19 (5) ◽  
pp. 1176-1179 ◽  
Author(s):  
Rodrigo Braga Ceglias ◽  
Juciane Maria Alves ◽  
Ramón Alves Botelho ◽  
Eustáquio de Souza Baeta Júnior ◽  
Igor Cuzzuol dos Santos ◽  
...  
Keyword(s):  
Residual Stress ◽  
Steel Pipe ◽  
Hole Drilling ◽  
X Ray Diffraction ◽  
Stress Evaluation ◽  
X Ray ◽  
Api 5L X70 Steel

Analysis of X-Ray Diffraction Data for the Characterization of Residual Stress

1991 ◽  
Vol 35 (A) ◽  
pp. 561-569
Author(s):  
Jun S. Park ◽  
James F. Shackelford
Keyword(s):  
Residual Stress ◽  
Elastic Constants ◽  
Diffraction Data ◽  
Stress Gradient ◽  
Bearing Steel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Angle ◽  
Stress States ◽  
Depth Ranges

AbstractThe analysis of linear dϕψ vs sin2ψ x-ray diffraction data in isotropic single phase materials was investigated for the evaluation of x-ray elastic constants. This study developed an experimental model for estimating x-ray elastic constants based on the analysis of biaxial residual stress states, A ball bearing steel and a 1018 steel weldment were evaluated.In a second study, the measurement of residual stress gradients was evaluated for those depth ranges mat can not be evaluated with a single radiation. This requires various planes and radiation energies to obtain the simultaneous conditions of high diffraction angle and large x-ray penetration depth. The evaluation of the overlapped stress gradient region is illustrated in terms of x-ray energy and diffraction angle for the ease of iron. This analysis is specifically developed for the purpose of stress gradient measurement using synchrotron radiation.

Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction

2010 ◽  
Vol 652 ◽  
pp. 180-184 ◽  
Author(s):  
Bastien Mireux ◽  
Thomas Buslaps ◽  
Veijo Honkimäki ◽  
Alain Lodini ◽  
Jean Michel Sprauel
Keyword(s):  
Residual Stress ◽  
Tissue Repair ◽  
De Novo ◽  
High Energy ◽  
X Ray Diffraction ◽  
Soft Tissue Repair ◽  
Stress Evaluation ◽  
Bone Implant ◽  
X Ray ◽  
Proliferation And Differentiation

The present study is dedicated to high energy x-ray diffraction measurements of residual stress at bone-implant interfaces. Bone regeneration is different from soft tissue repair as scar formation never occurs and as de novo bone tissue is produced with proliferation and differentiation of mesenchymal cells. To start the bone remodelling, the stress – the most important mechanical factor – should stimulate the osteocytes. Osseointegration is also observed with non-functional implants, in particular with dental implants. This means that a stress similar to a residual stress must exist.

scholarly journals High-pressure synthesis and crystal structure of the mixed-cation borate Ga4In4B15O33(OH)3

2019 ◽  
Vol 74 (4) ◽  
pp. 357-363
Author(s):  
Daniela Vitzthum ◽  
Hubert Huppertz
Keyword(s):  
Crystal Structure ◽  
High Pressure ◽  
High Temperature ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Synthesis And Crystal Structure ◽  
X Ray ◽  
Mixed Cation ◽  
High Pressure High Temperature ◽  
Pressure Synthesis

AbstractThe mixed cation triel borate Ga4In4B15O33(OH)3 was synthesized in a Walker-type multianvil apparatus at high-pressure/high-temperature conditions of 12.5 GPa and 1300°C. Although the product could not be reproduced in further experiments, its crystal structure could be reliably determined via single-crystal X-ray diffraction data. Ga4In4B15O33(OH)3 crystallizes in the tetragonal space group I41/a (origin choice 2) with the lattice parameters a = 11.382(2), c = 15.244(2) Å, and V = 1974.9(4) Å3. The structure of the quaternary triel borate consists of a complex network of BO4 tetrahedra, edge-sharing InO6 octahedra in dinuclear units, and very dense edge-sharing GaO6 octahedra in tetranuclear units.

Crystallization and preliminary x-ray diffraction data of the cryptomonad biliprotein phycocyanin-645 from a Chroomonas spec.

1984 ◽  
Vol 140 (2-3) ◽  
pp. 202-205 ◽  
Author(s):  
Walter Morisset ◽  
Werner Wehrmeyer ◽  
Tilman Schirmer ◽  
Wolfram Bode
Keyword(s):  
Diffraction Data ◽  
X Ray Diffraction ◽  
X Ray
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