Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

2017 ◽  
Vol 111 (8) ◽  
pp. 082907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hiroshi Funakubo ◽  
Takao Shimizu ◽  
Daichi Ichinose ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Lattice Distortion ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Bifeo3 Thin Films

X-ray diffraction study of polycrystalline BiFeO3 thin films under electric field

2008 ◽  
Vol 93 (4) ◽  
pp. 042907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Yoshitaka Nakamura ◽  
Takeshi Kanashima ◽  
Hiroshi Funakubo ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bifeo3 Thin Films

In situ synchrotron X-ray diffraction of thin films under perturbation by an electric field

2018 ◽  
Vol 537 (1) ◽  
pp. 20-26 ◽  
Author(s):  
Henrik Hovde Sønsteby ◽  
Julia Wind ◽  
Martin Jensen ◽  
Thomas Aarflot Storaas ◽  
Dmitry Chernyshov ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
X Ray Diffraction ◽  
X Ray

X-ray Diffraction Study of Electric-field-induced Strains in Polycrystalline BiFeO3 Thin Films at Low Temperature Using Synchrotron Radiation

2011 ◽  
Vol 59 (3(1)) ◽  
pp. 2556-2559 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hironori Fujisawa ◽  
Jung Min Park ◽  
Takeshi Kanashima ◽  
...  
Keyword(s):  
Thin Films ◽  
Synchrotron Radiation ◽  
Low Temperature ◽  
Electric Field ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bifeo3 Thin Films

Structural Evolution of Amorphous Ge2Sb2Te5 Thin Films in the Transition to the Crystalline Phase

2008 ◽  
Vol 1072 ◽  
Author(s):  
Riccardo De Bastiani ◽  
Alberto Maria Piro ◽  
Maria Grazia Grimaldi ◽  
Emanuele Rimini ◽  
Giuseppe Baratta ◽  
...  
Keyword(s):  
Thin Films ◽  
Crystalline Phase ◽  
Short Range ◽  
Structural Modification ◽  
Structural Evolution ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Kinetics Of

ABSTRACTThe crystallization kinetics of as-deposited amorphous Ge2Sb2Te5 thin films has been measured by in situ time resolved reflectivity. X-ray diffraction and Raman scattering analyses of partially transformed samples allowed to correlate the evolution of the transition to the structural modification in the long and short range configuration. The experimental results evidenced that during the early stages of crystallization there is a reduction of Ge-Te tetrahedral bonds, characteristics of the Ge coordination in amorphous Ge2Sb2Te5 films.

In situ time resolved wide angle X-ray diffraction study of nanotube carpet growth: Nature of catalyst particles and progressive nanotube alignment

Carbon ◽  
2015 ◽  
Vol 87 ◽  
pp. 246-256 ◽  
Author(s):  
Périne Landois ◽  
Mathieu Pinault ◽  
Stéphan Rouzière ◽  
Dominique Porterat ◽  
Cristian Mocuta ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Wide Angle ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray

In Situ Synchrotron X-Ray Diffraction Study of a Deformed Cu-Fe-P Alloy during Heating

2016 ◽  
Vol 850 ◽  
pp. 191-196 ◽  
Author(s):  
Wei Wang ◽  
Cun Lei Zou ◽  
Ren Geng Li ◽  
Wen Wen ◽  
Hui Jun Kang ◽  
...  
Keyword(s):  
Room Temperature ◽  
Lattice Distortion ◽  
Copper Matrix ◽  
Heating Process ◽  
Recrystallization Process ◽  
Full Width ◽  
X Ray Diffraction ◽  
Dramatic Decrease ◽  
X Ray

In situ synchrotron X-ray diffraction was used to study a deformed Cu-0.88 Fe-0.24 P alloy during heating process. The measurements were performed at room temperature and also at high temperatures up to 893 K in order to determine the recovery, ageing and recrystallization process. With the increase of temperature, the angles of copper matrix peaks moved left and the FWHM (full width at half maximum) decreased slightly. Fe3P precipitates were first detected at 533 K, reached the maximum at 673 K, and re-dissolved into matrix at 853 K. A dramatic decrease in FWHM was observed accompanied by the precipitation of Fe3P phases, indicating the reduction of lattice distortion of copper matrix.

scholarly journals Revealing the mechanism of electric-field-induced phase transition in antiferroelectric NaNbO3 by in situ high-energy x-ray diffraction

2021 ◽  
Vol 118 (13) ◽  
pp. 132903
Author(s):  
Mao-Hua Zhang ◽  
Changhao Zhao ◽  
Lovro Fulanović ◽  
Jürgen Rödel ◽  
Nikola Novak ◽  
...  
Keyword(s):  
Phase Transition ◽  
Electric Field ◽  
High Energy ◽  
X Ray Diffraction ◽  
X Ray
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